Naujos knygos https://www.kriso.lt Thu, 30 Oct 2014 00:00:00 GMT Thu, 30 Oct 2014 00:00:00 GMT Advances in Metrology for X-Ray and EUV Optics V https://www.kriso.lt/advances-metrology-x-ray-euv-optics-db-9781628412338.html <a href="https://www.kriso.lt/advances-metrology-x-ray-euv-optics-db-9781628412338.html"><img border="0" src="https://www.kriso.lt/covers/thumb/978162/9781628412338.jpg" align="left" hspace="5" > </a>Lahsen Assoufid, Haruhiko Ohashi, Anand Asundi<br>ISBN: 9781628412338<br> Leidėjas: SPIE Press<br> Formatas: Minkštas viršelis, Išleidimo metai: 30-Oct-2014<br> Kaina: 106,75 € https://www.kriso.lt/db/9781628412338.html Thu, 30 Oct 2014 00:00:00 GMT Advances in Metrology for X-Ray and EUV Optics: 12 August 2012, San Diego, California, United States, Volume IV https://www.kriso.lt/advances-metrology-x-ray-euv-optics-db-9780819492180.html <a href="https://www.kriso.lt/advances-metrology-x-ray-euv-optics-db-9780819492180.html"><img border="0" src="https://www.kriso.lt/shop/kriso2016/images/img_notfoundthumb.png" align="left" hspace="5" > </a>Lahsen Assoufid<br>ISBN: 9780819492180<br> Leidėjas: SPIE Press<br> Formatas: Minkštas viršelis, Išleidimo metai: 15-Nov-2012<br> Kaina: 91,90 € https://www.kriso.lt/db/9780819492180.html Thu, 15 Nov 2012 00:00:00 GMT Advances in Metrology for X-Ray and EUV Optics III: 1-2 August 2010, San Diego, California, United States https://www.kriso.lt/advances-metrology-x-ray-euv-optics-db-9780819482976.html <a href="https://www.kriso.lt/advances-metrology-x-ray-euv-optics-db-9780819482976.html"><img border="0" src="https://www.kriso.lt/shop/kriso2016/images/img_notfoundthumb.png" align="left" hspace="5" > </a>Lahsen Assoufid<br>ISBN: 9780819482976<br> Leidėjas: SPIE Press<br> Formatas: Minkštas viršelis, Išleidimo metai: 01-Jan-2010<br> Kaina: 106,75 € https://www.kriso.lt/db/9780819482976.html Fri, 01 Jan 2010 00:00:00 GMT Advances in Metrology for X-ray and EUV Optics II https://www.kriso.lt/advances-metrology-x-ray-euv-optics-db-9780819468529.html <a href="https://www.kriso.lt/advances-metrology-x-ray-euv-optics-db-9780819468529.html"><img border="0" src="https://www.kriso.lt/shop/kriso2016/images/img_notfoundthumb.png" align="left" hspace="5" > </a><br>ISBN: 9780819468529<br> Leidėjas: SPIE Press<br> Formatas: Minkštas viršelis, Išleidimo metai: 01-Jan-2007<br> Kaina: 136,38 € https://www.kriso.lt/db/9780819468529.html Mon, 01 Jan 2007 00:00:00 GMT