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El. knyga: Advances in Imaging and Electron Physics

Series edited by (Founder-President of the European Microscopy Society and Fellow, Microscopy and Optical Societies of America; member of the editorial boards of several microscopy journals and Serial Editor, Advances in Electron Optics, France)
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Advances in Imaging & Electron Physics merges two long-running serials—Advances in Electronics & Electron Physics andAdvances in Optical & Electron Microscopy. The series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.
  • Contributions from leading authorities
  • Informs and updates on all the latest developments in the field

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Advances in Imaging and Electron Physics features cutting-edge articles on recent developments in all areas of microscopy, image science and many related subjects in electron physics.
Preface vii
Future Contributions ix
Contributors xiii
1 Toward Quantitative Scanning Electron Microscopy
1(40)
Mohamed M. El-Gomati
Christopher G. H. Walker
1 Introduction
1(4)
2 Low-Voltage Secondary Electron and Backscattered Electron Coefficients
5(2)
3 Secondary Electron Emission
7(5)
4 Monte Carlo Simulation of Backscattered Primary Electrons
12(2)
5 Results of the BSE Coefficient Measurements and Simulations
14(3)
6 Discussion of Backscattering Results
17(2)
7 Results of the Measurements and Calculations of the Secondary Electron Emission Coefficient, δ
19(5)
8 The Monte Carlo Simulation of Secondary Electron Emission
24(2)
9 The Influence of Errors in the Elastic and Inelastic Properties on the Monte Carlo Calculations
26(1)
10 Energy-Dispersive Spectroscopy
26(3)
11 Auger Electron Spectroscopy Experiments in SEM
29(3)
12 Doped Contrast
32(3)
13 Conclusions
35(6)
References
37(4)
2 Logarithmic Wavelets
41(58)
Laurent Navarro
Guy Courbebaisse
Michel Jourlin
1 Introduction
42(1)
2 Wavelet Origin and Basis
43(19)
3 History of the Logarithmic Image Processing (LIP) Model
62(9)
4 Logarithmic Wavelets
71(9)
5 Logarithmic Wavelet Applications
80(14)
6 Conclusion
94(1)
7 Main Notations
95(4)
Acknowledgments
96(1)
References
96(3)
3 3-D Sparse Representations
99(106)
Francois Lanusse
Jean-Luc Starck
Arnaud Woiselle
M. Jalal Fadili
1 Introduction
100(3)
2 3-D Wavelets
103(16)
3 3-D Ridgelets and Beamlets
119(14)
4 First-Generation 3-D Curvelets
133(12)
5 Fast Curvelets
145(17)
6 Sparsity on the Sphere
162(16)
7 3-D Wavelets on the Ball
178(27)
Software
198(1)
Acknowledgments
199(1)
References
199(6)
Contents of Volumes 151--182 205(6)
Index 211
Peter Hawkes obtained his M.A. and Ph.D (and later, Sc.D.) from the University of Cambridge, where he subsequently held Fellowships of Peterhouse and of Churchill College. From 1959 1975, he worked in the electron microscope section of the Cavendish Laboratory in Cambridge, after which he joined the CNRS Laboratory of Electron Optics in Toulouse, of which he was Director in 1987. He was Founder-President of the European Microscopy Society and is a Fellow of the Microscopy and Optical Societies of America. He is a member of the editorial boards of several microscopy journals and serial editor of Advances in Electron Optics.
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