Advances in Imaging and Electron Physics merges two long-running serials--Advances in Electronics and Electron Physics andAdvances in Optical and Electron Microscopy. This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.
- Contributions from leading authorities
- Informs and updates on all the latest developments in the field
Daugiau informacijos
Advances in Imaging and Electron Physics features cutting-edge articles on recent developments in all areas of microscopy, image science and many related subjects in electron physics.
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1 | (2) |
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2 Digital Topology on Adaptive Octree Grids |
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3 | (10) |
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4 | (2) |
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6 | (2) |
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2.3 Simple Point Characterization for VOGs |
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8 | (5) |
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2.3.1 Geodesic Neighborhood and Topological Number |
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9 | (1) |
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10 | (3) |
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13 | (9) |
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13 | (3) |
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3.1.1 Topology-Preserving VOG Simplification |
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13 | (2) |
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3.1.2 Image-based VOG Adaptation |
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15 | (1) |
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3.2 Numerical Scheme for VOGs |
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16 | (2) |
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3.3 Isosurface Extraction for VOGs |
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18 | (3) |
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21 | (1) |
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22 | (7) |
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4.1 Harmonic Sphere Phantom |
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22 | (1) |
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23 | (2) |
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25 | (4) |
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29 | (1) |
Appendix: Proof of Non-self-intersection of the Adaptive CCMC Algorithm |
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30 | (3) |
References |
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Peter Hawkes obtained his M.A. and Ph.D (and later, Sc.D.) from the University of Cambridge, where he subsequently held Fellowships of Peterhouse and of Churchill College. From 1959 1975, he worked in the electron microscope section of the Cavendish Laboratory in Cambridge, after which he joined the CNRS Laboratory of Electron Optics in Toulouse, of which he was Director in 1987. He was Founder-President of the European Microscopy Society and is a Fellow of the Microscopy and Optical Societies of America. He is a member of the editorial boards of several microscopy journals and serial editor of Advances in Electron Optics.