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El. knyga: Advances in Imaging and Electron Physics

Series edited by (Founder-President of the European Microscopy Society and Fellow, Microscopy and Optical Societies of America; member of the editorial boards of several microscopy journals and Serial Editor, Advances in Electron Optics, France)
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Advances in Imaging & Electron Physics merges two long-running serials-Advances in Electronics & Electron Physics andAdvances in Optical & Electron Microscopy. The series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science, and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.Contains contributions from leading authorities on the subject matterInforms and updates on all the latest developments in the field of imaging and electron physicsProvides practitioners interested in microscopy, optics, image processing, mathematical morphology, electromagnetic fields, electron, and ion emission with a valuable resourceFeatures extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science. and digital image processing

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Cutting-edge articles on recent developments in all areas of microscopy, image science, and related subjects in electron physics
Preface vii
Future Contributions ix
Contributors xiii
1 Femtosecond Electron Imaging and Spectroscopy
1(134)
Martin Berz
Philip M. Duxbury
Kyoko Makino
Chong-Yu Ruan
2 Imaging with Electrons, X-rays, and Microwaves: Some Scattered Thoughts
135(168)
Ronald E. Burge
1 Overview of Career; Influences on Research Selection
136(12)
2 From Elmiscope to STEM: Imaging with Electrons
148(33)
3 Binary Optical Filters for Bright-Field Electron Microscopy
181(30)
4 Electron Scattering and Fourier Phase Retrieval
211(30)
5 Imaging by X-rays
241(34)
6 Imaging by Synthetic Aperture Radar
275(23)
7 Final Comments
298(5)
References 303(10)
Contents of Volumes 151--190 313(8)
Index 321
Peter Hawkes obtained his M.A. and Ph.D (and later, Sc.D.) from the University of Cambridge, where he subsequently held Fellowships of Peterhouse and of Churchill College. From 1959 1975, he worked in the electron microscope section of the Cavendish Laboratory in Cambridge, after which he joined the CNRS Laboratory of Electron Optics in Toulouse, of which he was Director in 1987. He was Founder-President of the European Microscopy Society and is a Fellow of the Microscopy and Optical Societies of America. He is a member of the editorial boards of several microscopy journals and serial editor of Advances in Electron Optics.
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