Advances in Imaging and Electron Physics, Volume 208, merges two long-running serials, Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. The series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science, digital image processing, electromagnetic wave propagation, electron microscopy and the computing methods used in all these domains.
- Contains contributions from leading authorities on the subject matter
- Informs and updates on the latest developments in the field of imaging and electron physics
- Provides practitioners interested in microscopy, optics, image processing, mathematical morphology, electromagnetic fields, electrons and ion emission with a valuable resource
- Features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing
| Contributors |
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vii | |
| Preface |
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ix | |
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1 Review of a Bewildering Classical-Quantum Phenomenon: Ghost Imaging |
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1 | (42) |
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1 | (7) |
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2 Description of Ghost Imaging with Quantum Mechanical and Classical Light |
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8 | (10) |
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3 Ghost Imaging and Phase Objects |
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18 | (3) |
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4 Resolution Limit and Contrast to Noise Ratio |
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21 | (2) |
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5 Ghost Imaging and Turbulence |
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23 | (2) |
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25 | (2) |
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7 Ghost Imaging and X-Ray |
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27 | (2) |
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8 Ghost Imaging and Diffraction in Time Domain |
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29 | (3) |
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9 The Theoretical Analysis of Temporal Ghost Imaging |
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32 | (2) |
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10 Spectral Correlations and Ghost Imaging |
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34 | (9) |
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36 | (7) |
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2 The Early Electron Microscopes: Incubation |
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43 | (86) |
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0 Introduction: the Incubation |
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44 | (1) |
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45 | (15) |
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60 | (8) |
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68 | (5) |
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73 | (34) |
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107 | (2) |
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6 The Incubation: Summary and Conclusion |
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109 | (20) |
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123 | (6) |
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3 Three Dimensional Computer Modeling of Electron Optical Systems |
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129 | (114) |
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131 | (4) |
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2 Formulating the Finite Difference Equations |
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135 | (21) |
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3 Implementation of Two New Software Packages |
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156 | (20) |
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176 | (15) |
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5 Analysis of Photomultiplier Tubes |
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191 | (11) |
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6 Charging Effects on Insulating Specimens in the SEM |
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202 | (17) |
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7 A Design Study of Three Magnetic Immersion Lenses |
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219 | (11) |
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8 Systems with Combined 3D Electric and Magnetic Fields |
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230 | (9) |
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239 | (4) |
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240 | (1) |
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240 | (1) |
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241 | (2) |
| Index |
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243 | |
Peter Hawkes obtained his M.A. and Ph.D (and later, Sc.D.) from the University of Cambridge, where he subsequently held Fellowships of Peterhouse and of Churchill College. From 1959 1975, he worked in the electron microscope section of the Cavendish Laboratory in Cambridge, after which he joined the CNRS Laboratory of Electron Optics in Toulouse, of which he was Director in 1987. He was Founder-President of the European Microscopy Society and is a Fellow of the Microscopy and Optical Societies of America. He is a member of the editorial boards of several microscopy journals and serial editor of Advances in Electron Optics.
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