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El. knyga: Advances in Imaging and Electron Physics

Series edited by (Founder-President of the European Microscopy Society and Fellow, Microscopy and Optical Societies of America; member of the editorial boards of several microscopy journals and Serial Editor, Advances in Electron Optics, France)
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Advances in Imaging and Electron Physics, Volume 207, merges two long-running serials, Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. The series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science, digital image processing, electromagnetic wave propagation, electron microscopy and the computing methods used in all these domains.

  • Contains contributions from leading authorities on the subject matter
  • Informs and updates on the latest developments in the field of imaging and electron physics
  • Provides practitioners interested in microscopy, optics, image processing, mathematical morphology, electromagnetic fields, electrons and ion emission with a valuable resource
  • Features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing
Contributors vii
Preface ix
1 Ultrafast Transmission Electron Microscopy: Historical Development, Instrumentation, and Applications
1(72)
Arnaud Arbouet
Giuseppe M. Caruso
Florent Houdellier
1 Introduction
2(2)
2 Time-Resolved Transmission Electron Microscopy: Timescales and Concepts
4(10)
3 Time-Resolved Transmission Electron Microscopy: Historical Development, Instrumental Aspects
14(17)
4 Applications of Ultrafast Transmission Electron Microscopy
31(19)
5 Toward Time-Resolved Electron Holography with Femtosecond Electron Pulses
50(9)
6 Conclusion
59(14)
Acknowledgments
60(1)
References
60(13)
2 Refinement of Generalized Mean Inequalities and Connections with Divergence Measures
73(178)
Inder Jeet Taneja
1 Introduction
74(3)
2 Combined Means Inequalities
77(9)
3 Two Means Inequalities
86(73)
4 Three Means Inequalities
159(64)
5 General Theorem
223(24)
6 Final Remarks
247(4)
References
247(4)
3 The Optical Transfer Theory of the Electron Microscope: Fundamental Principles and Applications
251(92)
Karl-Joseph Hanszen
1 The Problem of Image Formation in the Electron Microscope
253(2)
2 Symbols and Definitions; Numerical Data
255(4)
3 The Illumination
259(2)
4 The Electron Microscopical Object
261(16)
5 The Formation of the Optical Image
277(24)
6 Contrast by Means of Phase Shift: The Contrast Transfer-Functions for Axial Illumination
301(20)
7 Contrast by Means of Phase Shift: Contrast Transfer Functions for Oblique Illumination
321(3)
8 The Problem of Point Resolution
324(3)
9 Aperture Contrast
327(4)
10 Contrast Transfer for Partially Coherent and for Incoherent Illumination
331(5)
11 Test Objects
336(1)
12 Historical Remarks
337(6)
Acknowledgments
338(1)
References
338(5)
Index 343
Peter Hawkes obtained his M.A. and Ph.D (and later, Sc.D.) from the University of Cambridge, where he subsequently held Fellowships of Peterhouse and of Churchill College. From 1959 1975, he worked in the electron microscope section of the Cavendish Laboratory in Cambridge, after which he joined the CNRS Laboratory of Electron Optics in Toulouse, of which he was Director in 1987. He was Founder-President of the European Microscopy Society and is a Fellow of the Microscopy and Optical Societies of America. He is a member of the editorial boards of several microscopy journals and serial editor of Advances in Electron Optics.
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