Advances in Imaging & Electron Physics merges two long-running serials--Advances in Electronics & Electron Physics and Advances in Optical & Electron Microscopy. The series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.
Recenzijos
Praise for the Series"Editing by P.W. Hawkes is immaculate and the production, in the usual style of Advances in Electronics & Electron Physics, results in a volume that will be a handsome addition to any bookshelf."--MRS BULLETIN"With the accelerating pace of research and development in so many areas of microscopy, keeping abreast of the widespread literature is becoming increasingly time-consuming. In Advances in Optical & Electron Microscopy the Editors are to be congratulated on bringing together in a convenient and comprehensible form a variety of topics of current interest."--J.A. Chapman in LABORATORY PRACTICE
Contributors vii Preface ix Magneto-Transport as a Probe of Electron Dynamics in Open Quantum Dots J. P. Bird R. Akis D. K. Ferry M. Stopa Introduction 2(4) Magneto-Transport in Open Quantum Dots: Some Theoretical Considerations 6(2) Weak-Field Magneto-Transport in Open Quantum Dots: Low-Temperature Properties 8(16) Weak-Field Magneto-Transport in Open Quantum Dots: High-Temperature Properties 24(20) High-Field Magneto-Transport in Open Quantum Dots 44(19) Concluding Discussion 63(10) References 67(6) External Optical Feedback Effects in Distributed Feedback Semiconductor Lasers Mohammad F. Alam Mohammad A. Karim Introduction 73(1) Distributed Feedback Laser Fundamentals 74(8) Experimentally Observed Effects 82(15) Theories on Optical Feedback 97(10) External Optical Feedback Sensitivity 107(7) Conclusion 114(7) References 115(6) Atomic Scale Strain and Composition Evaluation from High-Resolution Transmission Electron Microscopy Images A. Rosenauer D. Gerthsen Introduction 121(4) Strain-State Analysis 125(29) Composition Evaluation by Lattice Fringe Analysis 154(28) Applications 182(40) Summary and Discussion of the Atomic Scale Analysis Methods 222(10) Appendix A: List of Variables 225(7) Hexagonal Sampling in Image Processing R. C. Staunton Introduction 232(4) Image Sampling on a Hexagonal Grid 236(23) Processor Architecture 259(20) Binary Image Processing 279(10) Monochrome Image Processing 289(10) Conclusions 299(11) References 302(8) The Group Representation Network: A General Approach to Invariant Pattern Classification Jeffrey Wood Pattern Classification and the Invariance Problem 310(3) Group Representation Theory 313(16) Linear and Nonlinear Concomitants 329(15) Adaptivity in Group Representation Networks 344(18) Practical Considerations and Simulations 362(8) The Computational Power of the Group Representation Network Model 370(8) The Group Representation Network and Other Invariant Classification Methods 378(13) Summary and Open Questions 391(18) Proof of Theorem III.1 395(11) References 406(3) Index 409
Peter Hawkes obtained his M.A. and Ph.D (and later, Sc.D.) from the University of Cambridge, where he subsequently held Fellowships of Peterhouse and of Churchill College. From 1959 1975, he worked in the electron microscope section of the Cavendish Laboratory in Cambridge, after which he joined the CNRS Laboratory of Electron Optics in Toulouse, of which he was Director in 1987. He was Founder-President of the European Microscopy Society and is a Fellow of the Microscopy and Optical Societies of America. He is a member of the editorial boards of several microscopy journals and serial editor of Advances in Electron Optics.
