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Handbook of Surface and Interface Analysis: Methods for Problem-Solving, Second Edition 2nd edition [Kietas viršelis]

Edited by (Oxford University, Yarnton, UK), Edited by (Oxford University, Yarnton, UK)
  • Formatas: Hardback, 680 pages, aukštis x plotis: 254x178 mm, weight: 1428 g, 42 Tables, black and white; 402 Illustrations, black and white
  • Išleidimo metai: 24-Jun-2009
  • Leidėjas: CRC Press Inc
  • ISBN-10: 0849375584
  • ISBN-13: 9780849375583
Kitos knygos pagal šią temą:
  • Formatas: Hardback, 680 pages, aukštis x plotis: 254x178 mm, weight: 1428 g, 42 Tables, black and white; 402 Illustrations, black and white
  • Išleidimo metai: 24-Jun-2009
  • Leidėjas: CRC Press Inc
  • ISBN-10: 0849375584
  • ISBN-13: 9780849375583
Kitos knygos pagal šią temą:
The original Handbook of Surface and Interface Analysis: Methods for Problem-Solving was based on the authors firm belief that characterization and analysis of surfaces should be conducted in the context of problem solving and not be based on the capabilities of any individual technique. Now, a decade later, trends in science and technology appear to have validated their assertions.

Major instrumental assets are generally funded and maintained as central facilities to help potential users make informed decisions about their appropriate use in solving analytical problem(s). Building on the popular first edition, this long-awaited second edition was motivated by the increasingly common industry view that it is more cost-effective to contract out analytical services than to maintain in-house facilities. Guided by that trend, this book focuses on developing strategic thinking for those who decide which facilities to access and where to subcontract analytical work. It covers most of the major tactical issues that are relevant at the location in which data are being produced.

New Information in this Second Edition Includes:











Electron-optical imaging techniques and associated analytical methods





Techniques based on synchrotron sources





Convenient and versatile scanning probe group methods





Scanning tunneling microscopy, biocompatible materials, and nano-structured materials

Assessing benefits and limitations of different methodologies, this volume provides the essential physical basis and common modes of operation for groups of techniques. Exploring methods for characterization and analysis of particular types of materials and/or their relevant applicationsthe text synergizes traditional and novel ideas to help readers develop a versatile and rational approach to surface and interface analysis.

Recenzijos

This handbook on surface and interface analysis can help to create that knowledgeable person sufficient in-depth technical information to satisfy those who want to know the details Material scientists, engineers, materials researchers, or anyone who needs information about a material obtained using surface analysis methods will find this handbook an excellent resource for determining the best approach and the right techniques to use.

IEEE Electrical Insulation Magazine, Vol. 26, No. 3, May-June 2010

Preface vii
Editors xi
Contributors xiii
Authors xv
Introduction
1(6)
John C. Riviere
Sverre Myhra
Problem Solving: Strategy, Tactics, and Resources
7(12)
Sverre Myhra
John C. Riviere
Photoelectron Spectrocopy (XPS and UPS), Auger Electron Spectroscopy (AES), and Ion Scattering Spectroscopy (ISS)
19(46)
Vaneica Y. Young
Gar B. Hoflund
Ion Beam Techniques: Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS)
65(32)
Birgit Hagenhoff
Reinhard Kersting
Derk Rading
Surface and Interface Analysis by Scanning Probe Microscopy
97(42)
Sverre Myhra
Transmission Electron Microscopy: Instrumentation, Imaging Modes, and Analytical Attachments
139(54)
John M. Titchmarsh
Synchrotron-Based Techniques
193(30)
Andrea R. Gerson
David J. Cookson
Kevin C. Prince
Quantification of Surface and Near-Surface Composition by AES and XPS
223(22)
Sven Tougaard
Structural and Analytical Methods for Surfaces and Interfaces: Transmission Electron Microscopy
245(36)
John M. Titchmarsh
In-Depth Analysis/Profiling
281(38)
Francois Reniers
Craig R. Tewell
Characterization of Nanostructured Materials
319(32)
Matthias Werner
Alison Crossley
Colin Johnston
Problem-Solving Methods in Tribology with Surface-Specific Techniques
351(38)
Christophe Donnet
Jean-Michel Martin
Problem-Solving Methods in Metallurgy with Surface Analysis
389(32)
R. K. Wild
Composites
421(36)
Peter M. A. Sherwood
Minerals, Ceramics, and Glasses
457(44)
Roger St. C. Smart
Zhaoming Zhang
Catalyst Characterization
501(28)
Wolfgang E. S. Unger
Thomas Gross
Surface Analysis of Biomaterials
529(36)
Marek Jasieniak
Daniel Graham
Peter Kingshott
Lara J. Gamble
Hans J. Griesser
Adhesion Science and Technology
565(38)
John F. Watts
Electron Spectroscopy in Corrosion Science
603(32)
James E. Castle
Index 635
Oxford University, Yarnton. UK Oxford University, Yarnton, UK Santa Barbara Science Project, Santa Barbara, USA