Preface |
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xi | |
Authors |
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xiii | |
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1 | (10) |
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Observing Nature: Sequentiality and Simultaneity |
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1 | (5) |
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Combination Macroscopic/Microscopic: Extending Measurable Range to Better Understand the Connection between Ultrastructure and Function |
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4 | (1) |
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Combination Model-Based/Direct Observation |
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4 | (1) |
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4 | (1) |
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How to Judge the Applicability of a Model |
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5 | (1) |
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Combination Preparative/Measuring Technique |
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5 | (1) |
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Combination of Local Techniques to Track the Dynamics of Processes |
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6 | (1) |
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Combination of Local Techniques of Different Contrast |
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6 | (1) |
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Systems That Can Profit from Combined Techniques |
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6 | (2) |
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6 | (2) |
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8 | (1) |
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8 | (1) |
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9 | (2) |
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Chapter 2 Scanning Probe Microscopy as an Imaging Tool: The Blind Microscope |
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11 | (44) |
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11 | (40) |
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24 | (1) |
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The Scanning Probe Microscope |
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25 | (1) |
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26 | (1) |
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26 | (1) |
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26 | (2) |
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28 | (2) |
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30 | (3) |
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33 | (3) |
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Detection of the Tip's Position |
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36 | (1) |
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36 | (1) |
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37 | (1) |
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38 | (1) |
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38 | (1) |
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Feedback Mechanism: Controlling the Property X |
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39 | (2) |
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41 | (1) |
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Feedback in Noncontact Mode |
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41 | (2) |
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Feedback in Intermittent-Contact Mode |
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43 | (1) |
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Topography and More: Feedback on X Mapping Y |
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44 | (2) |
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46 | (3) |
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Time Resolution in SPM Imaging |
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49 | (2) |
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51 | (2) |
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53 | (2) |
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Chapter 3 What Brings Optical Microscopy: The Eyes at the Microscale |
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55 | (64) |
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Fundamentals of Optical Microscopy |
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55 | (17) |
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Essential Parts of an Optical Microscope: The Image and Diffraction Planes |
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64 | (2) |
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Diffraction Sets the Limit of Detection, Spatial Resolution, and Depth of Focus |
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66 | (3) |
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Interference Sets Image Formation |
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69 | (1) |
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69 | (1) |
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70 | (1) |
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Differential Interference Contrast |
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71 | (1) |
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Fluorescence Microscopy: Bestowing Specificity |
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72 | (9) |
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Optical Microscopy of Fluorescent Objects |
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77 | (1) |
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78 | (1) |
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Collecting the Emitted Fluorescence: The Dichroic Mirror and the Emission Filter |
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78 | (2) |
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Drawbacks of Fluorescence Microscopy: The Ever-Present Photobleaching |
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80 | (1) |
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High-Performance Modes of Fluorescence Microscopy |
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81 | (14) |
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Confocal Laser Scanning Microscopy (CLSM) |
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81 | (2) |
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Fluorescence Lifetime Imaging Microscopy (FLIM) |
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83 | (3) |
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Total Internal Reflection Fluorescence (TIRF): A Near-Field Microscopy |
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86 | (1) |
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TIRF Is Based on the Optical Principles of Total Internal Reflection |
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86 | (1) |
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An Evanescent Wave Acts as the Excitation Source in TIRF |
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86 | (3) |
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Fluorescence Scanning Near-Field Optical Microscopy (Fluorescence SNOM) |
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89 | (4) |
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More than Near-Field Fluorescence Imaging |
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93 | (1) |
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Photobleaching or Background---Despite Weak and Highly Localized Illumination |
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93 | (2) |
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Optical Microscopies: Summary |
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95 | (1) |
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Combined OM-SPM Techniques: Eyesight to the Blind |
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95 | (11) |
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SPM and Optical Fluorescence Microscopy |
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98 | (8) |
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Fluorescence SNOM and Single-Molecule Detection |
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106 | (9) |
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Single Fluorescent Molecules as Test Samples |
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107 | (1) |
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Single-Molecule Imaging: Obtaining Molecular Orientations |
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108 | (1) |
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Conformations of Single-Polymer Chains in Films |
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109 | (2) |
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Single-Molecule Diffusion |
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111 | (1) |
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Distribution of Molecules and Molecular Complexes of Biological Interest in Synthetic and Native Membranes |
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112 | (3) |
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115 | (4) |
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Chapter 4 What Brings Scanning Near-Field Optical Microscopy: The Eyes at the Nanoscale |
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119 | (34) |
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Fundamentals of Scanning Near-Field Optical Microscopy |
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119 | (24) |
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124 | (2) |
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The Nature of the SNOM Probe: Aperture and Apertureless SNOM |
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126 | (1) |
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126 | (2) |
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128 | (3) |
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The History of SNOM Is the History of Its Probes |
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131 | (1) |
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132 | (3) |
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135 | (1) |
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135 | (1) |
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135 | (2) |
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Contrast Mechanisms in SNOM |
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137 | (3) |
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140 | (2) |
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Refractive Index Contrast |
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142 | (1) |
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Infrared-Vibrational Contrast (Infrared Apertureless SNOM) |
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142 | (1) |
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142 | (1) |
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143 | (6) |
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149 | (4) |
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Chapter 5 Adding Label-Free Chemical Spectroscopy: Who Is Who? |
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153 | (50) |
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153 | (13) |
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Raman (and IR) Microscopy |
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166 | (17) |
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Raman Microscopy beyond the Diffraction Limit: Near-Field Raman Spectroscopy |
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168 | (1) |
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Aperture Near-Field Raman Spectroscopy |
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169 | (1) |
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Tip-Enhanced Near-Field Raman Spectroscopy (TERS) |
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169 | (4) |
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Tip-Enhanced Coherent Anti-Stokes Raman Scattering (CARS) |
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173 | (1) |
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Sources of Enhancement of the Raman Signal in Near-Field Raman Spectroscopy |
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173 | (5) |
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IR Microscopy beyond the Diffraction Limit: IR Near-Field Spectroscopy |
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178 | (1) |
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Aperture SNOM + IR Spectroscopy |
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179 | (1) |
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Apertureless SNOM + IR Spectroscopy |
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180 | (2) |
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Another Source of Enhancement in Near-Field IR Microscopy: Phonon Excitation |
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182 | (1) |
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183 | (2) |
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Applications of SPM + Raman Spectroscopy |
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185 | (9) |
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(Sub-) Monolayers of Dyes |
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185 | (1) |
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Single-Wall Carbon Nanotubes |
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185 | (2) |
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Inorganic Materials: Silicon and Semiconductors |
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187 | (1) |
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187 | (1) |
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Virus, Bacteria, and Human Cells |
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188 | (6) |
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Applications of SPM + IR Spectroscopy |
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194 | (5) |
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194 | (1) |
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194 | (1) |
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195 | (4) |
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199 | (4) |
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Chapter 6 Combining the Nanoscopic with the Macroscopic: SPM and Surface-Sensitive Techniques |
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203 | (54) |
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Model-Based Surface Techniques |
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203 | (11) |
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Fundamentals of Surface Plasmon Resonance |
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214 | (7) |
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Surface Plasmons on Metal Surfaces |
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214 | (3) |
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Photon Creation/Excitation of SPPs |
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217 | (2) |
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219 | (2) |
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Fundamentals of Ellipsometry |
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221 | (8) |
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Basic Equation of Ellipsometry |
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221 | (1) |
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222 | (3) |
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Experimental Determination of Ellipsometric Angles |
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225 | (1) |
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Rotating-Element Techniques |
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226 | (1) |
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Rotating Polarizer/Analyzer |
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226 | (1) |
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227 | (1) |
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227 | (1) |
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228 | (1) |
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Fundamentals of Quartz Crystal Microbalance |
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229 | (12) |
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Electromechanical Analogy of a QCM Sensor: Equivalent Circuit of a Resonator |
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231 | (2) |
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Small-Load Approximation: Connecting Frequency Shifts to Load Impedance |
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233 | (2) |
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Measuring Frequency Shifts and More: Modes of Operation in QCM |
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235 | (1) |
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235 | (1) |
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236 | (2) |
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Frequency Shifts and Viscoelastic Parameters: Some Case Examples |
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238 | (1) |
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The Special Case of Rigid Films in Air: Sauerbrey Equation and Film Thickness |
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238 | (1) |
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Viscoelastic Films and the Importance of Measuring at Different Overtones |
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239 | (2) |
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Main Drawback: The Importance of Qualitative Interpretation |
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241 | (1) |
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241 | (1) |
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The Combination SPM and Model-Based Surface Techniques |
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241 | (13) |
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241 | (3) |
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244 | (4) |
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248 | (6) |
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254 | (3) |
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Chapter 7 Scanning Probe Microscopy to Measure Surface Interactions: The Nano Push-Puller |
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257 | (46) |
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Force Curves: Surface Forces and More |
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257 | (11) |
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Measuring the Probe-Sample Interaction as a Function of the Relative Displacement |
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268 | (5) |
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272 | (1) |
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Quantitative Determination of Forces: Instrument and Cantilever Calibration |
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273 | (1) |
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Voltage to Deflection: Determination of the Sensitivity |
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273 | (7) |
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Deflection to Force: Determination of Spring Constant |
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273 | (4) |
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The Issue of Getting Absolute Distances |
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277 | (3) |
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Qualitative Interpretation of Force Curves |
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280 | (1) |
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Chemical Force Microscopy |
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281 | (1) |
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The Science of Pulling Single Molecules or Ligand-Receptor Pairs |
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282 | (8) |
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Statistical Description of Bond Rupture: Two-State Model |
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283 | (3) |
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Particularities of Molecular Recognition Spectroscopy |
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286 | (1) |
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286 | (1) |
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Inferring Single Ligand-Receptor Interactions from Adhesion Events |
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287 | (1) |
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Particularities of Molecular Unfolding |
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288 | (2) |
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The Science of Pushing: Contact Nanomechanics |
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290 | (4) |
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A Short Note on Probes for Nanomechanics |
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290 | (1) |
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Contact Region of the Force Curve: Beyond the Point of Contact |
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291 | (3) |
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294 | (4) |
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294 | (2) |
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296 | (1) |
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Molecular Recognition Imaging |
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297 | (1) |
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298 | (2) |
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300 | (3) |
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Chapter 8 Tidying Loose Ends for the Nano Push-Puller: Microinterferometry and the Film Balance |
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303 | (32) |
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303 | (4) |
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Fundamentals of Reflection Interference Contrast Microscopy |
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307 | (11) |
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Lateral and Vertical Resolution in RICM |
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311 | (1) |
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312 | (2) |
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Dual-Wavelength RICM (DW-RICM) |
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314 | (1) |
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315 | (1) |
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316 | (2) |
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The Combined SPM/RICM Technique |
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318 | (3) |
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The Film Balance and Air-Fluid Interfaces |
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321 | (4) |
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Fundamentals of the Film Balance |
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325 | (4) |
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The Transfer of Monolayers onto Solid Supports |
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328 | (1) |
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The Langmuir-Blodgett Technique |
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328 | (1) |
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The Langmuir-Schaeffer Technique |
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328 | (1) |
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The Film Balance: Summary |
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329 | (1) |
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The Combined AFM + Film Balance: The Monolayer Particle Interaction Apparatus (MPIA) |
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329 | (4) |
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333 | (2) |
Index |
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335 | |