Atnaujinkite slapukų nuostatas

Introduction to Optical Metrology 2nd edition [Kietas viršelis]

(Austin, Texas, USA)
  • Formatas: Hardback, 592 pages, aukštis x plotis: 234x156 mm, weight: 453 g, 8 Tables, black and white; 303 Line drawings, black and white; 303 Illustrations, black and white
  • Serija: Optical Sciences and Applications of Light
  • Išleidimo metai: 18-Sep-2025
  • Leidėjas: CRC Press
  • ISBN-10: 1032872799
  • ISBN-13: 9781032872797
  • Formatas: Hardback, 592 pages, aukštis x plotis: 234x156 mm, weight: 453 g, 8 Tables, black and white; 303 Line drawings, black and white; 303 Illustrations, black and white
  • Serija: Optical Sciences and Applications of Light
  • Išleidimo metai: 18-Sep-2025
  • Leidėjas: CRC Press
  • ISBN-10: 1032872799
  • ISBN-13: 9781032872797
This book describes both theory and practice of optical techniques to measure various parameters encountered routinely in science and engineering.

Introduction to Optical Metrology, Second Edition examines the theory and practice of various measurement methodologies utilizing both the corpuscular and the wave nature of light. The book begins by introducing the subject of optics and then addresses the propagation of laser beams through free space and optical systems. It discusses interferometry, holography, speckle metrology, moiré phenomenon, photoelasticity, and microscopy. Remaining chapters describe techniques and methods of measurements of refractive index, thickness, radii of curvature, angle, velocity, pressure, length, optical testing, and fiber-optic based methods. Apart from these, this edition includes a chapter on temperature measurement, sections on fringe unwrapping methods, testing of freeform optics, shearography etc. Featuring new and updated exercise problems at the end of each chapter, this edition provides an applied understanding of essential optical measurement concepts, techniques, and procedures.

The primary audience for this book is undergraduate and graduate students who specialize in optics. It will also be useful to researchers and professionals working on optical testing and fiber optic- and MEMS-based measurements. A solutions manual and figure slides are available for adopting professors.
Chapter 1 Introduction to Optics
Chapter 2 Laser Beams
Chapter 3
Sources, Detectors and Recording media
Chapter 4 Interferometry
Chapter 5
Holography and Digital Holography
Chapter 6 Speckle Phenomenon, Speckle
Photography and Speckle Interferometry
Chapter 7 The Moiré Phenomenon
Chapter
8 Photoelasticity
Chapter 9 Microscopy
Chapter 10 Measurement of Refractive
Index
Chapter 11 Measurement of radius of curvature and focal length
Chapter
12 Optical Testing
Chapter 13 Angle Measurement
Chapter 14 Thickness
measurement
Chapter 15 Measurement of Velocity
Chapter 16 Pressure
Measurement
Chapter 17 Temperature Measurement
Chapter 18 Fiber Optic and
MEMs based Measurements
Chapter 19 Length Measurement
Professor Rajpal Singh Sirohi served as Professor of Physics at IIT Madras for more than two decades, as well as Director of IIT Delhi and Vice Chancellor to several Universities in India. He was a Distinguished Scholar to Rose-Hulman Institute of Technology, Terre Haute, USA, Chair Professor Tezpur University, Assam India, Faculty at Alabama A&M University, Huntsville, Alabama USA. Prof. Rajpal Singh Sirohi is now retired, and spends his time reading books on history of science and spends mornings and evenings with his grandchildren. Prof. Sirohis research areas are Optical Metrology, Optical Instrumentation, Laser Instrumentation, Holography and Speckle Phenomenon.