El. knyga: Microbeam Analysis: Proceedings of the International Conference on Microbeam Analysis, 8-15 July, 2000

IUMAS Presidents Address v IUMAS Program Committee vii Scholarship Winners ix Sponsors x Plenary symposium The role of microanalysis in the characterization of interfaces 1(2) M Ruhle C Elsasser C Scheu W Sigle Nanotechnology: promises and challenges for tomorrow 3(2) A D Romig Jr J R Michael T A Michalske Light microscopy---without lasers, fourier transforms etc 5(2) W C McCrone Recent progress in Monte Carlo simulation approach to microbeam analysis 7(2) R Shimizu Symposium 1: 30 years of optical spectroscopy Historical developments, state of the art and perspectives of Raman microspectroscopy and microscopy 9(2) P Dhamelincourt Effective designs of Raman microprobes for confocal and near-field performance 11(2) S Webster G D Pitt D N Batchelder High resolution Raman images of stress in bonded silicon microstructures 13(2) D J Gardiner M Bowden Raman microspectroscopy and imaging as probes for the response of bone tissue to mechanical stress 15(2) A Carden M D Morris Micro-Raman spectroscopy of photonic device materials: group theory and polarization selection rules 17(2) D D Tuschel Linear and nonlinear Raman spectroscopy on single microdroplets 19(2) W Kiefer J Popp V E Roman O Sbanski Spectroscopy of organic and biological single particles on nanometer and micrometer scales using a near-infrared laser Raman trapping system 21(2) K Ajito K Torimitsu Visible/near IR Raman and photoluminescence microspectroscopy using CCD and InGaAs dual detectors 23(2) F Adar A Whitley M Leclercq M Moreau J Rebello H Reich Raman imaging of semiconductor materials: characterization of static and dynamic properties 25(2) S Nakashima H Harima Characterization of carrier and stress distributions in semiconductor devices by cathodoluminescence spectroscopy and Raman microprobe 27(2) M Yoshikawa R Sugie G Katagiri Single-pass spectroscopic and Raman imaging systems---the new developments 29(2) G D Pitt Detection of interstitial molecules and observation of their micro-segregation using cathodoluminescence microanalysis 31(2) M A Stevens Kalceff Confocal Raman microscopy---why the depth resolution is much worse than you think! Modelling and measuring the effect of refraction in transparent media 33(2) N Everall Integrated spectroscopic imaging: applications using micro X-ray fluorescence, micro Raman and micro infrared 35(2) G J Harvilla J R Schoonover Current state of the art in Raman microscopy and chemical imaging 37(2) P J Treado M P Nelson T H Myers II Development of infrared microspectroscopy instrumentation and applications 39(2) J A Reffner FTIR-microspectroscopy of polymers advances into the 21st century! 41(2) J M Chalmers N J Everall M D Schaerberle I W Levin E N Lewis L H Kidder M Pearson M A Chesters L Bozec H M Pollock A Hammiche FTIR imaging of phase-separated polymeric systems 43(2) J L Koenig S-Q Wang R Bhargava Microanalysis of human matrices for foreign substances 45(2) K S Kalasinsky V F Kalasinsky FTIR photoacoustic spectral depth profiling: putting A G Bells discovery to work in analytical materials science 47(2) R A Palmer Analysis of laminates, compositional gradients and isolated regions in polymers by Raman and infrared microscopy 49(2) M Smith K Kempfert M Longmire F Deck E Y Jiang Resolution limits for scanning infrared microspectroscopy: theory and practice 51(2) G L Carr M Ramotowski L M Miller `What are the next steps?---Beyond the current use of FT-IR and FT-Raman biochemical images 53(2) C P Schultz Multivariate Raman microscopy: application to biological materials and synthetic materials 55(2) M D Morris C P Tarnowski J A Timlin Light scattering and Raman spectroscopy for biomedical analysis and disease diagnosis 57(2) R R Dasari M S Feld Infrared microscopic analysis of skin: a comparison of methodologies 59(2) M Jackson FT-IR microspectroscopy of cells and tissues 61(2) D Naumann J Kneipp C Kirschner N A Ngo Thi P Lasch In vivo Raman spectroscopy 63(2) G J Puppels Infrared microbeam analysis of intricate biological specimens 65(2) D L Wetzel S M LeVine Inside living cells: a new vision through optical micro- and nano-spectroscopies 67(2) G D Sockalingum H Morjani F Lei M Manfait Optical spectroscopy and imaging: application to detection of early gastrointestinal cancer 69(2) B C Wilson R DaCosta M Shim L Lilge N Marcon L M WongKee Song Analysis of the orientational nature of molecules and crystals within biomaterials using Raman microspectroscopy 71(2) E Wentrup-Byrne C A Armstrong R S Armstrong New applications and analytical methods for vibrational spectroscopic imaging 73(2) E N Lewis A S Haka I W Levin L H Kidder Applications of synchrotron infrared microspectroscopy to the study of biological cells and tissues 75(2) L M Miller P Dumas N Jamin J L Teillaud J L Bantignies G L Carr Infrared microspectroscopy of cells and tissue: infrared spectra and infrared spectral maps of human tissues 77(2) M Diem L Chiriboga A Pacifico H Yee Comparison of FTIR microspectroscopy methods for analysis of breast tissue samples 79(2) R K Dukor G M Story C Marcott A new portable Raman imaging probe 81(2) T Ikeda H Tashiro Y Ozaki A study of the phase behaviour of polyethylene blends using micro-Raman imaging 83(2) A van der Pol R L Morgan B J Kip R Ottjes J van Ruiten M J Hill P J Barham Raman microscopy in art and archaeology: illumination of historical mysteries 85(2) H G M Edwards F Rull Perez A R David High-pressure infrared synchrotron and Raman microspectroscopy of Earth and planetary materials 87(2) R J Hemley A F Goncharov Z Liu H K Mao S Merkel Raman microscopy as a non-destructive method for the analysis of minerals 89(2) J T Kloprogge R L Frost Advances in fiber-coupled Raman microprobes and chemical mapping 91(2) I R Lewis J M Shaver M L Samford Raman microscopy of kaolinite phases expanded through intercalation with potassium acetate 93(2) R L Frost J T Kloprogge Multi-channel confocal micro-Raman spectroscopy of minerals and glasses at ambient and high pressures 95(2) S K Sharma T F Cooney Confocal laser-Raman microprobe analysis of radiation-damaged minerals 97(2) L Nasdala M Wenzel Effect of signal-to-noise ratio on multivariate curve resolution of Raman spectroscopic image data 99(2) S L Zhang T M Hancewicz J J Andrew Field and routine laboratory use of Raman spectroscopy for mineral identification: applications to rocks 101(2) L A Haskin A Wang B L Jolliff Development of a flight Raman spectrometer for the ``Athena rover scientific instrument payload for Mars Surveyor missions 103(2) A Wang L A Haskin Evaluation of multi-channel micro-Raman spectrometry for rock analysis 105(2) P Deb C H Chio S K Sharma D W Muenow New instrumental approaches for vibrational spectroscopic imaging 107(2) L H Kidder K S Haber E N Lewis Quantitation of composition in inhomogeneous polymers with NEXAFS microscopy 109(2) H Ade Segregated phases in flexible polyurethanes by X-ray spectromicroscopy 111(2) E Rightor S Urquhart A Hitchcock H Ade G Mitchell M T Dineen F Hayes R Priester W Lidy Characterization of microscopic variation in crosslink density in polymer gels using scanning transmission X-ray microscopy 113(2) G Mitchell L R Wilson E G Rightor M T Dineen F Hayes S Urquhart A Hitchcock H Ade Near-field Raman spectroscopy: electric field gradient effects 115(2) E J Ayars M A Paesler H D Hallen Design and application of an ultra-high spatial resolution mapping system using near-field spectroscopy 117(2) T Ikeda Y Narita T Williams M Ohtsu Confocal optical imaging in highly scattering media: quantification using photon time-of-flight measurements 119(2) D H Burns W F Long C E W Gributs Raman intensity calibration with glass luminescence standards 121(2) E S Etz W S Hurst S J Choquette Modulations used to transmit information in spectrometry and imaging 123(2) W G Fateley R M Hammaker R A DeVerse R R Coifman Symposium 2: Advances in X-ray instrumentation Microcalorimeter EDS for low voltage microanalysis 125(2) D A Wollman D E Newbury S W Nam G C Hilton K D Irwin D A Rudman S Deiker N F Bergren J M Martinis Design and principles of high resolution microcalorimeter type X-ray spectrometers 127(2) J Hohne M Buhler T Hertrich U Hess Applications of high resolution microcalorimeter type X-ray spectrometers in material analysis 129(2) J Hohne M Buhler T Hertrich U Hess Monochromatic X-ray microprobe using doubly curved crystals 131(2) Z W Chen M W McColgan D M Gibson Small area analysis using micro-diffraction techniques 133(2) R P Goehner R G Tissot J R Michael XRMF with capillary optics and low-power micro-focus source 135(2) D A Carpenter The application of polycapillary X-ray lens in XRF microanalysis 137(2) Y Yan X Ding Q Pan Y He Development of the multi-energy X-ray generation system with higher intensity than that of synchrotron radiation for X-ray photoelectron diffraction measurements 139(2) H Ishii S Shiraki S Omori M Owari M Doi S Kojima E Yamada S Takahashi K Tsukamoto T Koshikawa Y Nihei Symposium 3: X-ray microanalysis of thin specimens Modification of -factor method for quantitative X-ray microanalysis in analytical electron microscopy 141(2) T Fujita M Watanabe Z Horita Information obtained by X-ray mapping large sample areas in a FEGSTEM 143(2) A J Papworth D B Williams Compositional mapping of nanolayered metal composites 145(2) V J Keast H Kung A Misra T E Mitchell Automated unbiased information extraction of STEM-EDS spectrum images 147(2) P G Kotula M R Keenan STEM X-ray elemental mapping of a cermet Cu-Al2O3 (5 wt) produced by in-situ reduction 149(2) M S Motta I G Solorzano E A Brocchi P K Jena Atomic structural environment of grain boundary segregated Y in creep resistant alumina 151(2) C M Wang G S Cargill III H M Chan M P Harmer D B Williams Investigation of self-absorption correction in thin foil EDS by spectrum modelling 153(2) J M Titchmarsh Theoretical simulation of probe sizes for microanalysis in AEM 155(2) M Watanabe D B Williams Analytical electron microscopy of SmFeTaN-based permanent-magnet materials 157(2) G Drazic P McGuiness K Zuzek S Kobe ALCHEMI for interstitial and sublattice site identification 159(2) C J Rossouw The application of AEM and APFIM to the analysis of precipitation behavior in alloy 718 161(2) M G Burke M K Miller Interface analysis of Si-Al-O-N materials by a 300kV FE-TEM 163(2) F F Xu C M Wang Y Bando M Mitomo Microstructural and micro-compositional analysis of WC/Co composities, prepared by microwave and conventional thermal sintering 165(2) A J Papworth H Jain D K Agrawal J Cheng D B Williams Microanalytical characterization of second phases in melt spun Mg-1.5wtCa-6wtZn alloys 167(2) P M Jardim I G Solorzano J B Vander Sande B S You TZP-based composites---an analytical approach 169(2) M Faryna K Haberko Microcharacterization of composite membranes of electrospun nanofibers and microparticles 171(2) D Ziegler C Sung T Dolukhanyan H L Schreuder-Gibson Microanalysis of neutron-irradiated fuel cladding materials 173(2) D M Farkas R W Warner A study on the carbide precipitation in a ferritic steel 175(2) J G Nawrocki J N DuPont A R Marder STEM analysis of FIB damage in silicon 177(2) C Urbanik Shannon B I Prenitzer L A Giannuzzi S R Brown T L Shofner B Rossi C A Vartuli R B Irwin F A Stevie Cross-sectional TEM of ceramic interfaces and layers 179(2) D R G Mitchell C J Barbe D J Cassidy D J Attard Symposium 4: Biological microanalysis Imaging of molecular and atomic distributions in biological specimens at high spatial resolution 181(2) F P Ottensmeyer J A Davis Y M Heng M M G Barfels Data acquisition strategies for determination of subsarcomere Ca distributions using EPXMA 183(2) M E Cantino J G Eichen S B Daniels Strategies for optimizing detection limits in elemental mapping of biological specimens by electron energy-loss spectrum-imaging 185(2) R D Leapman S B Andrews Proposal of an electron microscope for biological sample observation 187(2) H Suga M Kotera Analytical electron microscopy---an ultimate tool for exploring the environmental living conditions 5300 years ago and nowadays 189(2) M A Pabst C Mitterbauer I Papst F Hofer Ion microscopy of fresh frozen dried cryosections for ion images 191(2) K Takaya L He M Okabe Symposium 5: Convergent beam and electron backscatter diffraction Characterization of deformed microstructures by OIM 193(2) H Weiland D P Field An economical approach to miniaturize electron back-scattering diffraction system in a SEM 195(2) V Thaveeprungsriporn D Thong-Aram The past and future of convergent-beam diffraction 197(2) J A Eades Symmetry breakdown in HOLZ lines from the L12 phase of Al3Ti 199(2) C J Rossouw K Tsuda Advances in symmetry analysis by convergent-beam electron diffraction 201(2) M Terauchi M Tanaka Ab-initio primitive cell calculations from EBSD patterns 203(2) J R Michael R P Goehner Developments in quantitative convergent beam electron diffraction (CBED) 205(2) M Saunders A comparison of lattice-source and divergent-beam X-ray interferences as well as electron backscattering diffraction for the determination of crystal parameters 207(2) S Dabritz E Langer W Hauffe OIM and EDX determination of the orientation dependence of corrosion in uranium metal 209(2) D A Carpenter J S Bullock IV Symposium 6: Electron energy-loss spectroscopy High energy-resolution electron energy-loss spectroscopy based on electron microscopy 211(2) M Terauchi M Tanaka High brightness monochromator for STEM 213(2) P E Batson H W Mook P Kruit Energy filtering in UHV reflection electron microscopy 215(2) Y Tanishiro T Suzuki N Ishiguro H Minoda K Yagi An 0.2eV energy resolution analytical electron microscope 217(2) M Tanaka M Terauchi K Tsuda K Saitoh T Honda K Tsuno M Naruse T Tomita T Kaneyama The end of the road for silicon dioxide---and beyond: characterizing gate dielectrics for atomic-scale transistors 219(2) D A Muller J Rosamelia T Sorsch K Evans-Lutterodt G Timp J Neaton STEM-EELS analysis of advanced semiconductor materials 221(2) B Foran D Brazeau J Bennett Electron energy-loss (EELS) spectroscopic profiling of microelectronic devices 223(2) J Bruley P Flaitz Electron energy loss spectrometry on lithiated graphite 225(2) A Hightower C C Ahn B Fultz HRTEM and EELS study of carbon and boron nitride cones 227(2) L Bourgeois Y Bando W Q Han T Sato Quantitative composition mapping by EFTEM 229(2) J Bentley Energy-filtered imaging and growth mechanism of YBa2Cu3O7-δ ultrathin films 231(2) W Grogger M Varela del Arco C Ballesteros K Krishnan STEM-EELS study of catalysts composed of ultrafine gold particles 233(2) T Akita K Tanaka M Haruta EELS investigation of CVD α-Al2O3 κ-Al2O3 and γ-Al2O3 coatings 235(2) A Larsson J Zackrisson M Halvarsson S Ruppi Quantitative electron energy-loss spectroscopy and imaging of a Ti(C,N) based cermet material 237(2) J Zackrisson W Grogger Investigating the electronic structure of defects and interfaces using atomic resolution EELS 239(2) N D Browning E M James Y Xin I Arslan Atomic scale characterization of oxygen-deficient ceramic membranes by EELS and Z-contrast imaging 241(2) R F Klie Y Ito N D Browning S Stemmer T J Mazanec Towards single atom column EELS in an aberration-corrected STEM 243(2) S J Pennycook B Rafferty G Duscher Symposium 7: Variable pressure and low voltage scanning electron microscopy On the contrast and resolution of backscattering images in the FE-SEM 245(2) R Gauvin Recent developments in low-voltage imaging and microanalysis of heterogeneous catalysts in the FE-SEM 247(2) J Liu Quantitative measurement of field emission scanning electron microscope (FESEM) spatial resolution 249(2) D Drouin V Aimez J Fraser P Poole J Beauvais J Beerens A new type of electron energy analysis system with a low-energy electron point source 251(2) T Ishikawa N Endo M Goto C Oshima H Iwai Application of petroleum geology by SEM & EDS 253(2) C Yin A study of FIB irradiation damage by low voltage microanalysis 255(2) T C Baroni B J Griffin F J Lincoln Off-axis electron holography of field emission nanotips 257(2) B G Frost D C Joy Dynamic LEEM observation of Cu nanostructure formation processes on Si(111) with and without hydrogen 259(2) T Koshikawa T Yasue M Jalochowski E Bauer Secondary electron spectroscopy 261(2) D C Joy D Braski Low voltage and low vacuum-imaging and X-ray microanalysis 263(2) B J Griffin J R Browne T C Baroni Irradiation induced specimen damage in an environmental scanning electron microscope 265(2) M A Stevens Kalceff Analysis of conjugated polymer multilayer structures in the environmental SEM 267(2) I C Bache D S Thomas A M Donald Charging phenomena of wide bandgap materials in a VP-SEM 269(2) G Remond C E Nockolds M R Phillips J Cazaux Combined seconday and backscattered electron detector for variable pressure scanning electron microscopes (VPSEM) 271(2) D Drouin V Aimez X Hugon B J Griffin J Beauvais J Beerens Charge neutralization of insulators in an ESEM 273(2) M R Phillips M Toth Charge contrast in SE images obtained using the ESEM 275(2) M Toth M R Phillips S O Kucheyev J S Williams C Jagadish G Li Symposium 8: Monte Carlo simulations A Monte Carlo study of EPMA of porous alumina 277(2) C Merlet L Sorbier E Rosenberg F Salvat Monte Carlo simulation study of secondary electron emission and surface excitation 279(2) Z J Ding R Shimizu Analysis of primary energy dependence of secondary electron polarization 281(2) M Yasuda K Tamura H Kawata K Murata Monte Carlo model of charging in resists in e-beam lithography and metrology 283(2) Y-U Ko J J Hwu D C Joy X-ray emission from rough surfaces 285(2) R Gauvin E Lifshin Simulation of electron scattering for the Mott polarimeter 287(2) K Tamura M Yasuda K Murata M Kotera Development of Monte Carlo simulation of characteristic and continuum X-ray generation by electron impact 289(2) T Nagatomi K Fujii Y Kimura Y Takai R Shimizu T Yurugi K Obori Quantitative electron microprobe analysis of thin films on substrates 291(2) S Yamauchi M Yasuda K Murata Applications of Monte Carlo simulation of electron scattering to electron probe microanalysis of alloys 293(2) K Murata S Yamauchi The potential of Monte Carlo calculations for quantitative analysis 295(2) E Lifshin R Gauvin Symposium 9: Particle microanalysis A three dimensional view of basalt crystallization in ``lava straws from Kilauea 297(2) G P Meeker C R Thornber A new method for EPMA of individual micro-particles in a matrix 299(2) A Berner O Sideleva The improvement of the individual particle analysis of suspended particulate matter (SPM) at urban site atmosphere with EPMA 301(2) B Kim B Tomiyasu M Owari Y Nihei Challenges and new directions in the microanalysis of particles, defects and other small structures in the semiconductor industry 303(2) A L Testoni Improving the accuracy of particle analysis 305(2) J A Small J R Michael D E Newbury Analysis of small extraterrestrial particles 307(2) D E Brownlee Natural ``fly ash from the Kilauea volcano, Hawaii 309(2) G P Meeker C R Thornber T K Hinkley Microbeam characterisation of nano-precipitates in steel 311(2) H Dillen G Dupuis C Xhoffer A De Vyt Symposium 10: Surface analysis Hetero-epitaxial double-atomic-layer system of monolayer graphene/monolayer h-BN on Ni(111) studied by HREELS 313(2) C Oshima A Itoh E Rokuta N Tanaka K Yamashita Dependencies of secondary electron yields on work function for metals by electron and ion bombardment 315(2) M Kudo Y Sakai T Ichinokawa Quantum conductance and electron field emission of carbon nanotubes 317(2) Z L Wang Z G Bai R P Gao Z R Dai P Poncharal W A de Heer Surface analysis at high temperatures as applied to Sc-O/W(100) system 319(2) T Kawano Y Takai R Shimizu Vibrational spectra of two systems: monolayer hexagonal boron nitride/fcc-iron/Ni(111) and hexagonal boron nitride/monolayer graphene/Ni(111) 321(2) T Tanaka A Itoh K Yamashita A Tajima E Rokuta C Oshima Symposium 11: Secondary ion mass spectrometry Challenges in ultra-high depth resolution profiling of semiconductor materials by SIMS 323(2) J Bennett Advanced sample preparation techniques for SIMS analysis of semiconductor materials 325(2) F A Stevie T L Shofner F Hillion H Francois-Saint-Cyr T Kimble E Elshot K A Richardson Optimization of SIMS analysis conditions for ultra-shallow phosphorus and arsenic implants 327(2) J L Hunter T B Bates S B Patel R Loesing G Guraynov D P Griffis In situ ion implantation for trace quantitative SIMS analysis of wide-band gap (WBG) electronic device materials 329(2) R T Lareau M Wood F Chmara SIMS/TOF-SIMS study of microparticles: surface analysis, imaging and quantification 331(2) R Gijbels G Verlinden I Geuens Organic particle analysis using time-of-flight secondary ion mass spectrometry 333(2) S M Hues Surface OH group governing adsorption property and surface reactivity on the top and bottom faces of float glass 335(2) Y Hayashi M Kudo ToFSIMS and laser post-ionisation imaging of biomolecules at high spatial resolution 337(2) N P Lockyer J C Vickerman Secondary ion mass spectrometry using polyatomic and cluster primary ion beams 339(2) G Gillen Isotopic imaging by dynamic SIMS ion microscopy in biology and medicine 341(2) S Chandra Development of nano-scale FIB SIMS apparatus 343(2) M Nojima B Tomiyasu T Shibata M Owari Y Nihei Highly reliable quantitative analysis with Ga-FIB SIMS measurement by simultaneous multi-element detection system 345(2) B Tomiyasu M Owari Y Nihei A novel apparatus for three-dimensional microanalysis using ion and electron dual focused beams 347(2) T Sakamoto K Takanashi Zh H Cheng N Ono H Wu M Owari Y Nihei The laser ablation ICP-MS trace element microprobe: methods development for analysis of geologic materials 349(2) W I Ridley P J Aruscavage S A Wilson Characterization of the electron beam specimen interaction in the ESEM with SIMS imaging 351(2) S A Wight G Gillen G B Saupe Effects of incident angle and target rotation on SIMS crater roughening 353(2) L A Giannuzzi B I Prenitzer J M McKinley F A Stevie Three-dimensional microanalysis of the wire-pad contact region of integrated circuit 355(2) K Takanashi H Wu N Ono Zh H Cheng T Sakamoto M Owari Y Nihei Application of SIMS to condensation dust sample in flue gas 357(2) S Oishi M Shirahase R Oiwa K Kusama Improvements to SIMS in-depth profile resolution with a new rotational stage 359(2) M C Wood R T Lareau M H Ervin Real time monitoring of hydrogen-surfactant effect using ion scattering and recoiling spectroscopy in gas phase atmosphere 361(2) K Oura T Fujino M Katayama Y Yamazaki S Inoue J-T Ryu Nuclear microprobe analysis of beam-processed miniaturized structures by focused ion and electron beams 363(2) M Takai O Yavas C Ochiai Y K Park Symposium 12: Scanning probe microscopy/nanomechanics Studies of the nanomechanical properties of Au thin films by interfacial force microscopy 365(2) J E Houston Scratching and healing investigations on self-assembled monolayers using atomic force microscopy 367(2) B R A Neves M E Salmon D N Leonard E B Troughton Jr P E Russell Touching on the nanometer scale: slip, roll and tear 369(2) R Superfine M Falvo J Steele G Matthews M Guthold D Erie A Helser M G Jones R M Taylor II S Washburn Atomic force mapping and control of atomic force on a Si(111) 3x3-Ag surface using a noncontact atomic force microscope 371(2) S Morita Y Sugawara Painful but rewarding application of C-V and I-V measurements to the nanoscale using SPM 373(2) A Erickson P De Wolf E Brazel M Lefevre Ultrahigh vacuum scanning electron/tunneling combined microscope system 375(2) Y Homma P Finnie T Ogino Failure analysis with scanning probe microscopes 377(2) K F Jarausch R J Kline J F Richards A challenge to atom-by-atom chemical analysis on solid surfaces by scanning probe technique 379(2) T Shimizu H Tokumoto STM light emission from Ag deposited surfaces on Si(111) 381(2) N Yamamoto S Kagami H Minoda Mechanism of atomic scale variations in contact potential difference on Au/Si (111) surface by UHV SKPM 383(2) S Kitamura K Suzuki M Iwatsuki C B Mooney Atomic structure and growth of the Cu/Si(111) ``5 x 5 phase 385(2) T Kawasaki T An H Ito T Ichinokawa Effects of humidity on biological fibres measured using the scanning probe microscope 387(2) J M Maxwell M G Huson X J Dai Environmental atomic force microscopy: probing diblock polymer thin films and self-assembling molecules at various temperatures and pressures 389(2) D N Leonard R J Spontak P E Russell Investigation and modeling of electric field gradients by electric force microscopy (EFM) 391(2) G J Thorogood K T Short M Stevens Kalceff Symposium 13: Standardization for microbeam analysis Reference materials for microprobe analysis of carbon and nitrogen 393(2) S R J Saunders P Karduck W G Sloof M Whitwood P Busch J Almagro J-F Thiot T Wirth H Schneider New needs for imaging and X-ray microanalysis standards: ESEM, CHIME and low voltage microanalysis 395(2) B J Griffin C E Nocklods M R Phillips G Remond Activities of the international organization for standardization technical committee 202 microbeam analysis 397(2) J A Small ASTM standards in microscopy and microanalysis 399(2) J J Friel Characterization of Corning standard glasses 95IRV, 95IRW, and 95IRX, by ICP-AES, XRF, and EPMA 401(2) P Carpenter D Counce E Kluk C Nabelek The development of an ASTM standard for automated inclusion analysis in steels using SEM/EDS methodology 403(2) N C Barbi Status of microanalysis standards at the National Institute of Standards and Technology (NIST) 405(2) R B Marinenko Reference materials for microbeam analysis---developments in Europe 407(2) U Watjen The institution and application of standard sample referential document of sedimentary mineral 409(2) B Shujing C Wenxue Z Jianwen W Shenwen Symposium 14: Quantitative X-ray microanalysis of bulk specimens Microanalysis, mapping and soft X-ray spectroscopy---inseparable companions in microcharacterisation 411(2) I R Harrowfield C M MacRae H Takahashi N Wilson Irregular effects in X-ray spectra of Mg-Se compounds 413(2) M Zelechower Use of spectrum simulation to predict detection limits and improve confidence in X-ray analysis 415(2) P Statham Setting up quantitative WDS EPMA analysis: a new `on line assistance tool 417(2) P-F Staub C Fournier C Merlet Thin film thickness semi-empirical measurement by EPMA 419(2) H Qin Y Yang C Lu Depth profile analysis in the sub-micron range by sputter-assisted EPMA 421(2) S Richter P Karduck Quantitative EPMA of ultra-light elements: strategies and pitfalls 423(2) G F Bastin H J M Heijligers Analysis of boron by EPMA: correction for dual Mo and Si interferences for phases in the Mo-B-Si system 425(2) J H Fournelle J J Donovan S Kim J H Perepezko Quantitative electron probe microanalysis of rough, bulk samples 427(2) D E Newbury Optimal methods for the quantitative analysis of individual microparticles and irregular surfaces 429(2) J T Armstrong Averaging of electron backscatter and X-ray continuum intensities in multi-element compounds 431(2) J J Donovan A Westphal An evaluation of the accuracy of EPMA measurements in the system HgTe-CdTe 433(2) P Carpenter Novel methods to the mapping analysis and the spectroscopy in electron probe X-ray microanalysis (EPMA) using digital techniques 435(2) H Takahashi Spectrum imaging: the future of quantitative X-ray mapping? 437(2) I M Anderson Electron microprobe age mapping and dating of monazite: techniques and applications 439(2) M J Jercinovic M L Williams X-ray maps acquisition of mineral forming elements performed by electron probe microanalysis 441(2) R Cossio A Borghi F Olmi G Vaggelli Quantitative X-ray mapping in wavelength dispersive electron probe microanalysis 443(2) S Bremier M Mostert C T Walker Applications of EPMA to solid materials 445(2) J I Goldstein Ni-solute redistribution for the δ/γ competitive growth of the directionally solidifying Fe-Ni alloys 447(2) T Okane A Dytkowicz J Kloch T Umeda W Wolczynski SEM/EDS, AFM and XRD analysis of ternary nitride coatings produced by magnetron co-sputtering at different nitrogen pressures 449(2) R Wuhrer W Yeung M R Phillips Microanalysis of early-medieval glass gems found in the Bohemian and Moravian region 451(2) V Hulinsky O Gedeon E Cerna Comparison between major and trace element concentrations in rock-forming minerals performed by EPMA and microPIXE techniques 453(2) A Borghi R Cossio G Della Mea C Mazzoli R Ruffini Quantitative modal analysis of meteorite thin sections: image processing of X-ray element maps 455(2) T L Hicks T J Fagan C S Todd K Keil Sn/Bi solder element map comparisons between a superprobe and a standard SEM EDS system 457(2) W J D Shaw M A Fraser Microanalysis and microtextures of Hawaiian pahoehoe lavas 459(2) J S Lowther K A Brunstad Microbeam analysis of lava from the current Kilauea eruption: an integral part of volcano monitoring 461(2) C R Thornber G P Meeker Extended X-ray emission fine structure (EXEFS) of EPMA 463(2) J Kawai Symposium 15: General applications, techniques and instrumentation Property nanomeasurements of individual nanostructures by in-situ TEM 465(2) Z L Wang R P Gao Z G Bai P Poncharal W A de Heer Gradient concentration profile of high energy IBAD SiNx thin film measured by RBS method and comparison with mathematical model 467(2) F Cerny S Konvickova V Hnatowicz Identification of unknown single phases with composition data by weight- using the modified PDF-2™ and NIST-crystal-data™ file 469(2) A R Hoelzel New findings in analysis of alkali silicate glass in electron beam techniques 471(2) O Gedeon V Hulinsky K Jurek Evaluating the stability of BN interfacial coatings in SiC/SiC composites exposed to oxygen- and H2O-containing environments 473(2) K L More P F Tortorelli L R Walker Study on the fractal characterization of 30CrMnSi fractured surfaces 475(2) S Zhou A novel CCD video camera with operation-function incorporated 477(2) K Nishikata Y Kimura Y Takai R Shimizu T Ikuta Modeling of electron beam deflection from charging in electron beam lithography 479(2) J J Hwu Y Ko D C Joy Field emission spectra from a superconducting Nb tip 481(2) K Matsuda H Fujii M Komaki Y Murata K Nagaoka C Oshima A floating type compact low energy ion gun for nm-etching 483(2) T Matsutani Y W Beag Y Takai R Shimizu R Aihara Y Sakuma Visualization of electric potential distribution by amplitude-division three-wave interference 485(2) T Hirayama K Miyashita Optimized weighting problem in the defocus image modulation processing 487(2) T Ikuta Structure and characteristic of amorphous carbon films prepared by pulse laser deposition 489(2) P R Zhu S B Wang Z J Zhang Author Index 491

D Williams, R Shimizu