Preface to the Second Edition |
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xv | |
Preface to the First Edition |
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xix | |
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Part XIV Electron--Specimen Interactions |
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1997 | (88) |
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Chapter 69 Electron--Specimen Interactions |
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1999 | (86) |
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1999 | (1) |
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69.2 Electron Interactions in Amorphous Specimens |
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2000 | (29) |
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69.2.1 Definition of the Elastic Cross-Sections |
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2000 | (2) |
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69.2.2 The First-Order Born Approximation for Elastic Scattering |
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2002 | (9) |
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69.2.3 The High-Energy Approximation |
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2011 | (4) |
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69.2.4 Partial Wave Analysis |
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2015 | (3) |
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69.2.5 Inelastic Electron Scattering |
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2018 | (4) |
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69.2.6 Plural and Multiple Electron Scattering |
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2022 | (6) |
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69.2.7 The Scattering Contrast |
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2028 | (1) |
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69.3 Electron Interactions in Crystalline Specimens |
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2029 | (37) |
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2029 | (1) |
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69.3.2 Fundamentals of Crystallography |
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2030 | (4) |
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69.3.3 The Periodic Potential |
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2034 | (4) |
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69.3.4 Kinematic Theory of Electron Scattering |
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2038 | (7) |
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69.3.5 General Formulation of the Dynamical Theory |
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2045 | (9) |
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2054 | (7) |
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69.3.7 Applications and Extensions of the Dynamical Theory |
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2061 | (5) |
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69.4 Simulation and Structure Retrieval |
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2066 | (11) |
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2066 | (3) |
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2069 | (2) |
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2071 | (6) |
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69.5 Multislice Electron Optics |
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2077 | (8) |
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Part XV Digital Image Processing |
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2085 | (236) |
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2087 | (14) |
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70.1 Organization of the Subject |
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2087 | (2) |
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2089 | (8) |
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2089 | (1) |
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70.2.2 Images and Templates |
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2090 | (3) |
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2093 | (1) |
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70.2.4 Operations Involving Images and Templates |
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2094 | (3) |
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70.2.5 Concluding Remarks |
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2097 | (1) |
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2097 | (4) |
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Chapter 71 Acquisition, Sampling and Coding |
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2101 | (18) |
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2101 | (1) |
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2102 | (8) |
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71.2.1 The Sampling Theorem |
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2102 | (5) |
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71.2.2 Degrees of Freedom |
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2107 | (3) |
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2110 | (1) |
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2111 | (4) |
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71.4.1 Use of Image Transforms |
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2112 | (1) |
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2113 | (2) |
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71.4.3 Huffman and Vector Codes |
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2115 | (1) |
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71.5 Electron Optical Considerations |
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2115 | (4) |
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2115 | (1) |
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2116 | (3) |
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2119 | (638) |
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72.1 Operations on Individual Pixels |
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2119 | (5) |
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72.1.1 Elementary Operations |
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2119 | (1) |
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72.1.2 Histogram-Based Enhancement |
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2120 | (4) |
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2124 | (7) |
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2126 | (1) |
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2126 | (4) |
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72.2.3 Hexagonal Sampling |
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2130 | (1) |
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72.2.4 Generalized Convolution |
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2130 | (1) |
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72.2.5 Periodic Specimens |
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2130 | (1) |
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2131 | (17) |
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72.3.1 Nonlinear Exploitation of Linear Filtering |
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2131 | (2) |
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72.3.2 Median and Rank-Order Filtering |
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2133 | (2) |
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72.3.3 Morphological Filters |
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2135 | (13) |
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72.4 Image Algebraic Representation of Enhancement |
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2148 | (2) |
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72.4.1 Formation of the Histogram |
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2148 | (1) |
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72.4.2 Convolutional Filters |
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2149 | (1) |
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72.5 Enhancement in Electron Microscopy |
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2150 | (607) |
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Chapter 73 Linear Restoration |
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2757 | (12) |
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2151 | (1) |
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73.2 Extended Wiener Filters |
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2151 | (8) |
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73.3 Filtering With Constraints |
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2159 | (4) |
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73.4 Hoenders `Procedure' |
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2163 | (2) |
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2165 | (3) |
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2168 | (1) |
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Chapter 74 Nonlinear Restoration - The Phase Problem |
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2169 | (1) |
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2169 | (1) |
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74.1.1 Formal Statement of the Problem |
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2170 | (1) |
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74.2 Extended Linear Approximation |
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2170 | (4) |
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74.3 Multiple Recordings (Circular Symmetry) |
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2174 | (1) |
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2174 | (1) |
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74.3.2 The Gerchberg-Saxton Algorithm |
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2174 | (3) |
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74.3.3 The Multiple-Image Algorithm |
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2177 | (2) |
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74.3.4 Bright-Field/Dark-Field Subtraction |
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2179 | (1) |
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2179 | (2) |
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74.3.6 Modulation of the Incident Beam |
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2181 | (1) |
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74.3.7 One Image and Its Derivative with Respect to Defocus |
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2181 | (2) |
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74.3.8 Closely Spaced Images: The Transport-of-Intensity Equation |
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2183 | (12) |
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2195 | (1) |
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2196 | (17) |
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2196 | (1) |
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74.4.2 Analytic Continuation of Wavefunctions |
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2197 | (3) |
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74.4.3 Use of Half-Plane Apertures |
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2200 | (5) |
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74.4.4 Logarithmic Hilbert Transform Pairs |
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2205 | (2) |
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74.4.5 Uniqueness in One and Two Dimensions |
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2207 | (6) |
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74.4.6 Summary and List of Further Reading |
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2213 | (1) |
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74.5 Maximum Entropy and Related Probabilistic Methods |
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2213 | (2) |
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74.6 Exit-Wave Reconstruction |
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2215 | (6) |
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Chapter 75 Three-Dimensional Reconstruction |
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2221 | (54) |
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2221 | (8) |
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2229 | (25) |
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2230 | (2) |
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2232 | (5) |
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75.2.3 Reconstruction From a Single View of an Oblique Section |
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2237 | (1) |
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2238 | (1) |
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75.2.5 The Missing Wedge or Cone |
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2238 | (3) |
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75.2.6 Compressed Sensing |
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2241 | (8) |
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75.2.7 Breakdown of the Projection Requirement; Artificial Neural Networks |
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2249 | (4) |
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75.2.8 Reconstruction Quality |
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2253 | (1) |
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2254 | (10) |
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2254 | (1) |
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2255 | (1) |
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75.3.3 Classification by Correspondence Analysis |
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2256 | (3) |
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75.3.4 Random Tilt Series |
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2259 | (1) |
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75.3.5 Removal of Distortion |
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2259 | (3) |
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2262 | (2) |
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75.4 Three-Dimensional Reconstruction in Materials Science |
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2264 | (2) |
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75.5 Deep Learning, Machine Learning |
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2266 | (6) |
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75.5.1 Introduction and Principles |
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2266 | (3) |
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2269 | (1) |
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2269 | (1) |
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2269 | (1) |
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2269 | (1) |
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75.5.6 Exit-Wave Reconstruction |
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2270 | (1) |
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2270 | (2) |
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2272 | (1) |
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2272 | (1) |
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2273 | (2) |
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Chapter 76 Image Analysis |
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2275 | (20) |
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2275 | (1) |
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2276 | (3) |
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2276 | (1) |
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2277 | (1) |
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2277 | (1) |
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2278 | (1) |
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2278 | (1) |
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76.3 Segmentation and Feature Extraction |
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2279 | (9) |
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2279 | (4) |
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76.3.2 Feature Extraction |
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2283 | (5) |
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2288 | (1) |
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2288 | (2) |
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2290 | (4) |
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2294 | (1) |
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Chapter 77 Microscope Parameter Measurement and Instrument Control |
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2295 | (26) |
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2295 | (1) |
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77.2 Measurement of Microscope Operating Parameters |
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2296 | (20) |
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77.2.1 The Transmission Electron Microscope |
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2296 | (9) |
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77.2.2 The Scanning Transmission Electron Microscope |
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2305 | (2) |
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77.2.3 Aberration Measurement for Corrected Optics |
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2307 | (8) |
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77.2.4 Aberration Determination Using Crystalline Materials |
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2315 | (1) |
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2316 | (5) |
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Part XVI Coherence, Brightness and Spectral Functions |
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2321 | (72) |
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Chapter 78 Coherence and the Brightness Functions |
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2323 | (48) |
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2323 | (1) |
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2324 | (9) |
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2324 | (5) |
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78.2.2 Spectral Functions |
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2329 | (4) |
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2333 | (1) |
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78.4 The Brightness of Partially Coherent Sources |
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2334 | (4) |
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78.5 Consequences for the van Cittert--Zernike Theorem |
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2338 | (1) |
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78.6 Eigenfunction Expansions of the Coherence Functions |
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2339 | (6) |
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2339 | (4) |
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78.6.2 A New Set of Brightness Formulae |
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2343 | (2) |
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78.7 The Quasi-homogeneous Source |
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2345 | (4) |
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78.8 Brightness, Coherence and Quasi-homogeneity |
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2349 | (5) |
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78.9 Temporal and Spatial Coherence |
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2354 | (4) |
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2358 | (3) |
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78.10.1 Operator Formalism |
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2358 | (2) |
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78.10.2 Use of Wigner and Ambiguity Functions |
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2360 | (1) |
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78.11 The Propagation of Coherence Functions |
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2361 | (5) |
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78.11.1 Propagation of the Mutual Intensity in Free Space |
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2361 | (1) |
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78.11.2 Propagation of the Mutual Intensity Through a Lens System |
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2362 | (1) |
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78.11.3 Propagation of the Cross-Spectral Density and Brightness Through a Lens System |
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2363 | (1) |
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78.11.4 Introduction of a Specimen |
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2364 | (2) |
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78.12 Coherence and Illumination |
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2366 | (1) |
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78.13 Degeneracy and Brightness |
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2367 | (1) |
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2368 | (3) |
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2371 | (22) |
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2371 | (6) |
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79.2 Image Formation Expressed in Terms of the Wigner Function |
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2377 | (4) |
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2377 | (1) |
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79.2.2 Effect of an Aperture |
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2378 | (1) |
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79.2.3 Passage through an Electron Lens |
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2379 | (2) |
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2381 | (10) |
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79.3.1 Propagation of the Density Matrix through a Conventional Transmission Electron Microscope |
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2382 | (1) |
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79.3.2 Propagation of the Density Matrix through an Electron Microscope Fitted with a Biprism |
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2383 | (7) |
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79.3.3 Related Holographic Techniques |
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2390 | (1) |
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2391 | (2) |
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Part XVII Vortex Studies, the Quantum Electron Microscope |
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2393 | (86) |
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Chapter 80 Orbital Angular Momentum, Vortex Beams and the Quantum Electron Microscope |
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2395 | (84) |
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2395 | (3) |
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2398 | (8) |
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2398 | (4) |
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2402 | (4) |
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80.3 Interaction With Magnetic Fields |
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2406 | (3) |
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80.4 Production of Vortex Beams |
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2409 | (29) |
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2409 | (2) |
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2411 | (5) |
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80.4.3 Aberration Correctors as Vortex Generators |
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2416 | (5) |
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2421 | (7) |
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80.4.5 A Mirror-Based Method |
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2428 | (4) |
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80.4.6 Vortex Interferometry |
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2432 | (1) |
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80.4.7 Structured Illumination |
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2433 | (5) |
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2438 | (1) |
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80.5 Measurement of Topological Charge |
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2438 | (17) |
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2439 | (3) |
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2442 | (1) |
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80.5.3 Azimuthal to Cartesian Mapping |
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2442 | (13) |
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2455 | (1) |
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80.6 Interactions Between Vortex Beams and Specimens |
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2455 | (1) |
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80.7 Lensless Fourier Transform Holography |
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2456 | (1) |
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2457 | (7) |
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80.9 The Quantum Electron Microscope |
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2464 | (13) |
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|
2477 | (2) |
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Appendix: Corrections and additions to volumes 1, 2 and 3 |
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|
2479 | (4) |
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|
2479 | (1) |
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|
2480 | (1) |
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|
2481 | (2) |
Notes and References |
|
2483 | (130) |
Conference Proceedings |
|
2613 | (12) |
Index |
|
2625 | |