Atnaujinkite slapukų nuostatas

Principles of Electron Optics, Volume 4: Advanced Wave Optics 2nd edition [Minkštas viršelis]

(Instit), (Founder-President of the European Microscopy Society and Fellow, Microscopy and Optical Societies of America; member of the editorial boards of several microscopy journals and Serial Editor, Advances in Electron Optics, France)
  • Formatas: Paperback / softback, 664 pages, aukštis x plotis: 235x191 mm, weight: 1520 g
  • Išleidimo metai: 12-May-2022
  • Leidėjas: Academic Press Inc
  • ISBN-10: 0323916465
  • ISBN-13: 9780323916462
Kitos knygos pagal šią temą:
  • Formatas: Paperback / softback, 664 pages, aukštis x plotis: 235x191 mm, weight: 1520 g
  • Išleidimo metai: 12-May-2022
  • Leidėjas: Academic Press Inc
  • ISBN-10: 0323916465
  • ISBN-13: 9780323916462
Kitos knygos pagal šią temą:
Principles of Electron Optics: Second Edition, Advanced Wave Optics provides a self-contained, modern accounting of electron optical phenomena with the Dirac or Schrödinger equation as a starting point. Knowledge of this branch of the subject is essential to understanding electron propagation in electron microscopes, electron holography and coherence. Sections in this new release include Principles of Electron Optics, Electron Interactions in Thin Specimens, Digital Image Processing, Acquisition, Sampling and Coding, Enhancement, Linear Restoration, Nonlinear Restoration – the Phase Problem, Three-dimensional Reconstruction, Image Analysis, Instrument Control, Instrumental Image Manipulation, and much more.
  • Includes authoritative coverage of many recent developments in wave electron optics
  • Describes the interaction of electrons with solids and the information that can be obtained from electron-beam techniques
  • Includes new content on multislice optics, 3D reconstruction, Wigner optics, vortex beams and the quantum electron microscope
Preface to the Second Edition xv
Preface to the First Edition xix
Part XIV Electron--Specimen Interactions
1997(88)
Chapter 69 Electron--Specimen Interactions
1999(86)
69.1 Introduction
1999(1)
69.2 Electron Interactions in Amorphous Specimens
2000(29)
69.2.1 Definition of the Elastic Cross-Sections
2000(2)
69.2.2 The First-Order Born Approximation for Elastic Scattering
2002(9)
69.2.3 The High-Energy Approximation
2011(4)
69.2.4 Partial Wave Analysis
2015(3)
69.2.5 Inelastic Electron Scattering
2018(4)
69.2.6 Plural and Multiple Electron Scattering
2022(6)
69.2.7 The Scattering Contrast
2028(1)
69.3 Electron Interactions in Crystalline Specimens
2029(37)
69.3.1 Introduction
2029(1)
69.3.2 Fundamentals of Crystallography
2030(4)
69.3.3 The Periodic Potential
2034(4)
69.3.4 Kinematic Theory of Electron Scattering
2038(7)
69.3.5 General Formulation of the Dynamical Theory
2045(9)
69.3.6 The Two-Beam Case
2054(7)
69.3.7 Applications and Extensions of the Dynamical Theory
2061(5)
69.4 Simulation and Structure Retrieval
2066(11)
69.4.1 Introduction
2066(3)
69.4.2 Simulation
2069(2)
69.4.3 Reconstruction
2071(6)
69.5 Multislice Electron Optics
2077(8)
Part XV Digital Image Processing
2085(236)
Chapter 70 Introduction
2087(14)
70.1 Organization of the Subject
2087(2)
70.2 Image Algebra
2089(8)
70.2.1 Introduction
2089(1)
70.2.2 Images and Templates
2090(3)
70.2.3 Operations
2093(1)
70.2.4 Operations Involving Images and Templates
2094(3)
70.2.5 Concluding Remarks
2097(1)
70.3 Notation
2097(4)
Chapter 71 Acquisition, Sampling and Coding
2101(18)
71.1 Acquisition
2101(1)
71.2 Sampling
2102(8)
71.2.1 The Sampling Theorem
2102(5)
71.2.2 Degrees of Freedom
2107(3)
71.3 Quantization
2110(1)
71.4 Coding
2111(4)
71.4.1 Use of Image Transforms
2112(1)
71.4.2 Predictive Coding
2113(2)
71.4.3 Huffman and Vector Codes
2115(1)
71.5 Electron Optical Considerations
2115(4)
71.5.1 Acquisition
2115(1)
71.5.2 Sampling
2116(3)
Chapter 72 Enhancement
2119(638)
72.1 Operations on Individual Pixels
2119(5)
72.1.1 Elementary Operations
2119(1)
72.1.2 Histogram-Based Enhancement
2120(4)
72.2 Linear Filtering
2124(7)
72.2.1 Low-Pass Filters
2126(1)
72.2.2 High-Pass Filters
2126(4)
72.2.3 Hexagonal Sampling
2130(1)
72.2.4 Generalized Convolution
2130(1)
72.2.5 Periodic Specimens
2130(1)
72.3 Nonlinear Filters
2131(17)
72.3.1 Nonlinear Exploitation of Linear Filtering
2131(2)
72.3.2 Median and Rank-Order Filtering
2133(2)
72.3.3 Morphological Filters
2135(13)
72.4 Image Algebraic Representation of Enhancement
2148(2)
72.4.1 Formation of the Histogram
2148(1)
72.4.2 Convolutional Filters
2149(1)
72.5 Enhancement in Electron Microscopy
2150(607)
Chapter 73 Linear Restoration
2757(12)
73.1 Introduction
2151(1)
73.2 Extended Wiener Filters
2151(8)
73.3 Filtering With Constraints
2159(4)
73.4 Hoenders `Procedure'
2163(2)
73.5 Recursive Filtering
2165(3)
73.6 Other Approaches
2168(1)
Chapter 74 Nonlinear Restoration - The Phase Problem
2169(1)
74.1 Introduction
2169(1)
74.1.1 Formal Statement of the Problem
2170(1)
74.2 Extended Linear Approximation
2170(4)
74.3 Multiple Recordings (Circular Symmetry)
2174(1)
74.3.1 Introduction
2174(1)
74.3.2 The Gerchberg-Saxton Algorithm
2174(3)
74.3.3 The Multiple-Image Algorithm
2177(2)
74.3.4 Bright-Field/Dark-Field Subtraction
2179(1)
74.3.5 Direct Methods
2179(2)
74.3.6 Modulation of the Incident Beam
2181(1)
74.3.7 One Image and Its Derivative with Respect to Defocus
2181(2)
74.3.8 Closely Spaced Images: The Transport-of-Intensity Equation
2183(12)
74.3.9 Related Problems
2195(1)
74.4 Analyticity
2196(17)
74.4.1 Introduction
2196(1)
74.4.2 Analytic Continuation of Wavefunctions
2197(3)
74.4.3 Use of Half-Plane Apertures
2200(5)
74.4.4 Logarithmic Hilbert Transform Pairs
2205(2)
74.4.5 Uniqueness in One and Two Dimensions
2207(6)
74.4.6 Summary and List of Further Reading
2213(1)
74.5 Maximum Entropy and Related Probabilistic Methods
2213(2)
74.6 Exit-Wave Reconstruction
2215(6)
Chapter 75 Three-Dimensional Reconstruction
2221(54)
75.1 Introduction
2221(8)
75.2 Methods
2229(25)
75.2.1 Direct Methods
2230(2)
75.2.2 Iterative Methods
2232(5)
75.2.3 Reconstruction From a Single View of an Oblique Section
2237(1)
75.2.4 Ptycho-Tomography
2238(1)
75.2.5 The Missing Wedge or Cone
2238(3)
75.2.6 Compressed Sensing
2241(8)
75.2.7 Breakdown of the Projection Requirement; Artificial Neural Networks
2249(4)
75.2.8 Reconstruction Quality
2253(1)
75.3 Preprocessing
2254(10)
75.3.1 Background
2254(1)
75.3.2 Alignment
2255(1)
75.3.3 Classification by Correspondence Analysis
2256(3)
75.3.4 Random Tilt Series
2259(1)
75.3.5 Removal of Distortion
2259(3)
75.3.6 Defocus Gradient
2262(2)
75.4 Three-Dimensional Reconstruction in Materials Science
2264(2)
75.5 Deep Learning, Machine Learning
2266(6)
75.5.1 Introduction and Principles
2266(3)
75.5.2 Noise
2269(1)
75.5.3 Segmentation
2269(1)
75.5.4 Labelling
2269(1)
75.5.5 Sparsity
2269(1)
75.5.6 Exit-Wave Reconstruction
2270(1)
75.5.7 Tomography
2270(2)
75.5.8 General Studies
2272(1)
75.6 Concluding Remarks
2272(1)
75.7 Further Reading
2273(2)
Chapter 76 Image Analysis
2275(20)
76.1 Introduction
2275(1)
76.2 Digital Geometry
2276(3)
76.2.1 Neighbours
2276(1)
76.2.2 Distance
2277(1)
76.2.3 Connectedness
2277(1)
76.2.4 Border
2278(1)
76.2.5 Simplicity
2278(1)
76.3 Segmentation and Feature Extraction
2279(9)
76.3.1 Segmentation
2279(4)
76.3.2 Feature Extraction
2283(5)
76.3.3 Measurement
2288(1)
76.4 Classification
2288(2)
76.5 Description
2290(4)
76.6 Further Reading
2294(1)
Chapter 77 Microscope Parameter Measurement and Instrument Control
2295(26)
77.1 Introduction
2295(1)
77.2 Measurement of Microscope Operating Parameters
2296(20)
77.2.1 The Transmission Electron Microscope
2296(9)
77.2.2 The Scanning Transmission Electron Microscope
2305(2)
77.2.3 Aberration Measurement for Corrected Optics
2307(8)
77.2.4 Aberration Determination Using Crystalline Materials
2315(1)
77.3 Control
2316(5)
Part XVI Coherence, Brightness and Spectral Functions
2321(72)
Chapter 78 Coherence and the Brightness Functions
2323(48)
78.1 Introduction
2323(1)
78.2 Coherence
2324(9)
78.2.1 Definitions
2324(5)
78.2.2 Spectral Functions
2329(4)
78.3 Radiometry
2333(1)
78.4 The Brightness of Partially Coherent Sources
2334(4)
78.5 Consequences for the van Cittert--Zernike Theorem
2338(1)
78.6 Eigenfunction Expansions of the Coherence Functions
2339(6)
78.6.1 The Expansions
2339(4)
78.6.2 A New Set of Brightness Formulae
2343(2)
78.7 The Quasi-homogeneous Source
2345(4)
78.8 Brightness, Coherence and Quasi-homogeneity
2349(5)
78.9 Temporal and Spatial Coherence
2354(4)
78.10 Related Work
2358(3)
78.10.1 Operator Formalism
2358(2)
78.10.2 Use of Wigner and Ambiguity Functions
2360(1)
78.11 The Propagation of Coherence Functions
2361(5)
78.11.1 Propagation of the Mutual Intensity in Free Space
2361(1)
78.11.2 Propagation of the Mutual Intensity Through a Lens System
2362(1)
78.11.3 Propagation of the Cross-Spectral Density and Brightness Through a Lens System
2363(1)
78.11.4 Introduction of a Specimen
2364(2)
78.12 Coherence and Illumination
2366(1)
78.13 Degeneracy and Brightness
2367(1)
78.14 Further Reading
2368(3)
Chapter 79 Wigner Optics
2371(22)
79.1 Introduction
2371(6)
79.2 Image Formation Expressed in Terms of the Wigner Function
2377(4)
79.2.1 Source Properties
2377(1)
79.2.2 Effect of an Aperture
2378(1)
79.2.3 Passage through an Electron Lens
2379(2)
79.3 Holography
2381(10)
79.3.1 Propagation of the Density Matrix through a Conventional Transmission Electron Microscope
2382(1)
79.3.2 Propagation of the Density Matrix through an Electron Microscope Fitted with a Biprism
2383(7)
79.3.3 Related Holographic Techniques
2390(1)
79.4 Further Reading
2391(2)
Part XVII Vortex Studies, the Quantum Electron Microscope
2393(86)
Chapter 80 Orbital Angular Momentum, Vortex Beams and the Quantum Electron Microscope
2395(84)
80.1 Introduction
2395(3)
80.2 Vortex Beams
2398(8)
80.2.1 Properties
2398(4)
80.2.2 Knots and Links
2402(4)
80.3 Interaction With Magnetic Fields
2406(3)
80.4 Production of Vortex Beams
2409(29)
80.4.1 Phase Plates
2409(2)
80.4.2 Holograms
2411(5)
80.4.3 Aberration Correctors as Vortex Generators
2416(5)
80.4.4 Mode Conversion
2421(7)
80.4.5 A Mirror-Based Method
2428(4)
80.4.6 Vortex Interferometry
2432(1)
80.4.7 Structured Illumination
2433(5)
80.4.8 Concluding Note
2438(1)
80.5 Measurement of Topological Charge
2438(17)
80.5.1 Diffraction
2439(3)
80.5.2 Stigmators
2442(1)
80.5.3 Azimuthal to Cartesian Mapping
2442(13)
80.5.4 Induced Currents
2455(1)
80.6 Interactions Between Vortex Beams and Specimens
2455(1)
80.7 Lensless Fourier Transform Holography
2456(1)
80.8 Further Reading
2457(7)
80.9 The Quantum Electron Microscope
2464(13)
Appendix
2477(2)
Appendix: Corrections and additions to volumes 1, 2 and 3
2479(4)
A1 Volume 1
2479(1)
A2 Volume 2
2480(1)
A3 Volume 3
2481(2)
Notes and References 2483(130)
Conference Proceedings 2613(12)
Index 2625
Peter Hawkes obtained his M.A. and Ph.D (and later, Sc.D.) from the University of Cambridge, where he subsequently held Fellowships of Peterhouse and of Churchill College. From 1959 1975, he worked in the electron microscope section of the Cavendish Laboratory in Cambridge, after which he joined the CNRS Laboratory of Electron Optics in Toulouse, of which he was Director in 1987. He was Founder-President of the European Microscopy Society and is a Fellow of the Microscopy and Optical Societies of America. He is a member of the editorial boards of several microscopy journals and serial editor of Advances in Electron Optics. Erwin Kasper studied physics at the Universities of Münster and Tübingen (Germany), where he obtained his PhD in 1965 and the habilitation to teach physics in 1969. After scientific spells in the University of Tucson, Arizona (1966) and in Munich (1970), he resumed his research and teaching in the Institute of Applied Physics, University of Tübingen, where he was later appointed professor. He lectured on general physics and especially on electron optics. The subject of his research was theoretical electron optics and related numerical methods on which he published numerous papers. After his retirement in 1997, he published a book on numerical field calculation (2001).