PREFACE |
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PART I PRINCIPLES OF INDUSTRIAL LASERS |
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1.1 Basic Atomic Structure |
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1.2.2 Population Distribution |
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1.2.4 Spontaneous Emission |
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1.2.5 Stimulated Emission |
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1.2.6 Einstein Coefficients: Ae,B12,B21 |
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1.7 Two-Photon Absorption |
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2.1 Standing Waves in a Rectangular Cavity |
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2.2.1.1 Longitudinal Modes |
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2.2.3.1 Transverse Mode Selection |
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2.2.3.2 Longitudinal Mode Selection |
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2.4 Generalized Spherical Resonators |
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2.5 Concentric Resonators |
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2.6 Stability of Optical Resonators |
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3.1.1 Arc or Flash Lamp Pumping |
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3.1.2 Diode Laser Pumping |
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3.1.2.1 Longitudinal Pumping |
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3.1.2.2 Transverse Pumping |
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3.1.4 Energy Distribution in the Active Medium |
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5.2 Line-Broadening Mechanisms |
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5.2.1 Homogeneous Broadening |
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5.2.1.1 Natural Broadening |
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5.2.1.2 Collision Broadening |
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5.2.2 Inhomogeneous Broadening |
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5.3 Comparison of Individual Mechanisms |
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6.2.1 Mechanical Shutters |
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6.2.2 Electro-Optic Shutters |
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6.2.3 Acousto-Optic Shutters |
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6.4.1 Active Mode Locking |
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6.4.2 Passive Mode-Locking |
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7.4 Intensity and Brightness |
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7.5 Frequency Stabilization |
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8.1.2.2 The Nd:Glass Laser |
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8.2.1 Neutral Atom Lasers |
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8.2.4 Molecular Gas Lasers |
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8.2.4.1 VibrationalRotational Lasers |
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8.4 Semiconductor (Diode) Lasers |
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8.4.1 Semiconductor Background |
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8.4.2 Semiconductor Lasers |
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8.4.3 Semiconductor Laser Types |
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8.4.3.1 Homojunction Lasers |
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8.4.3.2 Heterojunction Lasers |
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8.4.3.3 Quantum Well Lasers |
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8.4.4 Low-Power Diode Lasers |
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8.4.5 High-Power Diode Lasers |
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8.4.6 Applications of High-Power Diode Lasers |
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8.6 New Developments in Industrial Laser Technology |
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8.6.3 Ultrafast (Femtosecond) Lasers |
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9.1 The Electromagnetic Spectrum |
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9.2 Reflection and Refraction |
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9.9 Beam Delivery Systems |
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9.9.1 Conventional Systems |
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9.9.2 Fiber Optic Systems |
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9.9.2.1 Optical Fiber Characteristics |
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9.9.2.2 Waveguide Structure |
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9.9.2.6 Application of Optical Fibers in High-Power Laser Systems |
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PART II ENGINEERING BACKGROUND |
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10.1 Energy Balance During Processing |
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10.2 Heat Flow in The Workpiece |
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10.2.1 Temperature Distribution |
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10.2.1.1 Thick Plate with Point Heat Source (Three Dimensional) |
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10.2.1.2 Thin Plate with Line Heat Source (Two Dimensional) |
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10.2.5 Gaussian Heat Source |
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10.2.6 The Two-Temperature Model |
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10.3 Fluid Flow in Molten Pool |
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10.3.1 Continuity Equation |
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10.3.2 NavierStokes Equations |
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10.3.3 Surface Tension Effect |
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10.3.4 Free Surface Modeling |
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Appendix 10B Derivation of Equation (10.2A) |
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Appendix 10C Moving Heat Source |
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11.1 Process Microstructure |
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11.1.1.1 Initial Solidification |
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11.1.1.3 Nucleation and Grain Refinement in Molten Pool |
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11.1.2 Zone of Partial Melting |
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11.1.3 Heat-Affected Zone |
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11.1.3.2 Precipitation-Hardening and Nonferrous Alloys |
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11.2.2.2 Liquation Cracking |
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11.2.2.5 Lamellar Tearing |
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11.2.4 Incomplete Penetration |
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12.1 Solidification Without Flow |
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12.1.1 Solidification of a Pure Metal |
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12.1.2 Solidification of a Binary Alloy |
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12.1.2.1 Temperature and Concentration Variation in a Solidifying Alloy |
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12.1.2.2 Interface Stability Theories |
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12.2 Solidification with Flow |
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12.2.2 Columnar Dendritic Structure |
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12.3 Rapid Solidification |
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Appendix 12B Criterion for Solidification of an Alloy |
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13 Residual Stresses and Distortion |
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13.1 Causes of Residual Stresses |
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13.1.2 Nonuniform Plastic Deformation |
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13.2 Basic Stress Analysis |
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13.2.1 Equilibrium Conditions |
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13.2.2 StrainDisplacement Relations |
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13.2.3 StressStrain Relations |
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13.2.3.1 Linear Elastic Behavior |
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13.2.3.2 Plastic Flow of Metals |
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13.2.3.3 ElasticPlastic Conditions |
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13.2.4 Plane Stress and Plane Strain |
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13.2.4.3 Plane Stress/Plane Strain Equations |
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13.2.4.4 Compatibility Equation |
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13.2.4.5 StressStrain Relations for Plane Stress/Plane Strain |
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13.3 Effects of Residual Stresses |
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13.3.1 Apparent Change in Strength |
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13.4 Measurement of Residual Stresses |
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13.4.1 Stress Relaxation Techniques |
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13.4.1.1 Sectioning Technique |
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13.4.1.2 Drilling Technique |
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13.4.2 X-Ray Diffraction Technique |
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13.4.2.1 Principle of the X-Ray Diffraction Technique |
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13.4.2.2 The Film Technique |
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13.4.2.3 The Diffractometer Technique |
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13.4.3 Neutron Diffraction Technique |
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13.4.4 Residual Stress Equilibrium |
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13.5 Relief of Residual Stresses and Distortion |
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13.5.1 Thermal Treatments |
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13.5.2 Mechanical Treatments |
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13.5.2.3 Vibratory Stress Relief |
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PART III LASER MATERIALS PROCESSING |
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14 Background on Laser Processing |
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14.1 System-Related Parameters |
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14.1.1 Power and Power Density |
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14.1.2 Wavelength and Focusing |
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14.1.2.1 Determining the Focal Position |
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14.1.6.1 Measurement of Absorptivity |
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14.1.6.2 BeamPlasma Interaction |
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14.3 Disturbances that Affect Process Quality |
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14.4 General Advantages and Disadvantages of Laser Processing |
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15 Laser Cutting and Drilling |
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15.1.1 Forms of Laser Cutting |
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15.1.1.2 Sublimation Cutting |
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15.1.1.3 Photochemical Ablation |
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15.1.2 Components of a Laser Cutting System |
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15.1.3 Processing Conditions |
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15.1.3.2 Beam Characteristics |
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15.1.3.4 Assist Gas Functions |
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15.1.3.5 Effect of Focal Position |
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15.1.4 Laser Cutting Principles |
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15.1.4.1 Beam Absorption During Laser Cutting |
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15.1.4.2 Process Modeling |
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15.1.5 Quality of Cut Part |
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15.1.5.1 Striations of the Cut Surface |
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15.1.6 Material Considerations |
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15.1.7 Advantages and Disadvantages of Laser Cutting |
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464 | |
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15.1.8 Specific Comparison with Conventional Processes |
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465 | |
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15.1.8.1 Laser, Plasma Arc, and Oxyacetylene (Oxy-Fuel) Cutting |
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15.1.8.2 Laser Cutting and Electrical Discharge Machining |
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466 | |
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15.1.8.3 Laser Cutting and Abrasive Waterjet Machining |
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15.1.8.4 Laser Cutting and Punching/Nibbling |
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15.1.9 Special Techniques |
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467 | |
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468 | |
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15.2.1 Forms of Laser Drilling |
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468 | |
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15.2.1.1 Single-Pulse Drilling |
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468 | |
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15.2.1.2 Multipulse Percussion Drilling |
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470 | |
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15.2.2 Process Parameters |
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470 | |
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15.2.2.1 Beam Characteristics |
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470 | |
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15.2.2.2 Drilling Characteristics |
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471 | |
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15.2.3 Analysis of Material Removal During Drilling |
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472 | |
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473 | |
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15.2.3.2 Approximate Analysis |
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478 | |
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15.2.4 Advantages and Disadvantages of Laser Drilling |
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15.3.1.1 Transparent Dielectric Materials |
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485 | |
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15.3.1.2 Metals and Semiconductors |
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486 | |
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15.3.2 Laser-Assisted Machining |
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16.1 Laser Welding Parameters |
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502 | |
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16.1.1 Beam Power and Traverse Speed |
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503 | |
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16.1.2 Effect of Beam Characteristics |
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505 | |
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16.1.2.3 Beam Polarization |
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16.1.3 Plasma Formation, Gas Shielding, and Effect of Ambient Pressure |
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506 | |
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16.1.3.1 Plasma Formation |
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506 | |
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508 | |
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16.1.3.3 Effect of Ambient Pressure |
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511 | |
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16.1.4 Beam Size and Focal Point Location |
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511 | |
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16.1.5 Joint Configuration |
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512 | |
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514 | |
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16.3 Mechanism of Laser Welding |
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515 | |
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16.3.1 Conduction Mode Welding |
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515 | |
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516 | |
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16.3.2.1 Power Absorption in the Keyhole |
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519 | |
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16.3.2.2 Keyhole Characteristics |
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521 | |
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16.4 Material Considerations |
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528 | |
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529 | |
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531 | |
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16.5 Weldment Discontinuities |
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532 | |
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16.6 Advantages and Disadvantages of Laser Welding |
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534 | |
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16.7.1 Multiple-Beam Welding |
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535 | |
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16.7.1.1 Multiple-Beam Preheating and Postweld Heat Treatment |
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535 | |
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16.7.1.2 Multiple-Beam Flow Control |
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540 | |
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16.7.2 Arc-Augmented Laser Welding |
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545 | |
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16.8 Specific Applications |
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547 | |
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547 | |
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16.8.2 Laser-Welded Tailored Blanks |
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547 | |
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16.8.2.1 Advantages of Tailored Blank Welding |
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548 | |
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16.8.2.2 Disadvantages of Tailored Blank Welding |
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549 | |
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16.8.2.3 Applications of Laser-Welded Tailored Blanks |
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550 | |
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16.8.2.4 Formability of Tailor-Welded Blanks |
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551 | |
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16.8.2.5 Limiting Thickness or Strength Ratio |
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556 | |
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559 | |
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17 Laser Surface Modification |
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568 | |
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17.1 Laser Surface Heat Treatment |
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568 | |
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17.1.1 Important Criteria |
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570 | |
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17.1.2 Key Process Parameters |
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570 | |
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17.1.2.1 Beam Power, Size, Speed, and Shielding Gas |
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570 | |
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571 | |
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577 | |
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17.1.2.4 Initial Workpiece Microstructure |
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579 | |
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580 | |
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17.1.4 Microstructural Changes in Steels |
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581 | |
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17.1.4.1 Pearlite Dissolution |
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581 | |
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17.1.4.2 Austenite Homogenization |
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585 | |
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17.1.4.3 Transformation to Martensite |
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586 | |
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588 | |
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17.1.5.1 Solution Treatment |
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589 | |
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589 | |
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17.1.6 Hardness Variation |
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589 | |
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592 | |
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17.1.8 Advantages and Disadvantages of Laser Surface Treatment |
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592 | |
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592 | |
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593 | |
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17.2 Laser Surface Melting |
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594 | |
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17.3 Laser Direct Metal Deposition |
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595 | |
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17.3.1 Processing Parameters |
|
|
596 | |
|
17.3.2 Methods for Applying the Coating Material |
|
|
596 | |
|
|
600 | |
|
17.3.4 Advantages and Disadvantages of Laser Cladding |
|
|
601 | |
|
|
601 | |
|
|
601 | |
|
17.4 Laser Physical Vapor Deposition (LPVD) |
|
|
601 | |
|
|
603 | |
|
17.5.1 Background Analysis |
|
|
605 | |
|
17.5.2 Advantages and Disadvantages of Laser Shock Peening |
|
|
608 | |
|
|
608 | |
|
|
608 | |
|
|
608 | |
|
|
609 | |
|
|
612 | |
|
|
613 | |
|
|
614 | |
|
|
616 | |
|
18.1 Principle of Laser Forming |
|
|
616 | |
|
|
618 | |
|
18.3 Laser Forming Mechanisms |
|
|
619 | |
|
18.3.1 Temperature Gradient Mechanism |
|
|
619 | |
|
18.3.2 Buckling Mechanism |
|
|
620 | |
|
18.3.3 Upsetting Mechanism |
|
|
622 | |
|
18.3.4 Summary of the Forming Mechanisms |
|
|
623 | |
|
|
624 | |
|
18.5 Advantages and Disadvantages |
|
|
629 | |
|
|
629 | |
|
|
629 | |
|
|
629 | |
|
|
630 | |
|
|
630 | |
|
|
631 | |
|
|
632 | |
|
|
633 | |
|
19.1 Computer-Aided Design |
|
|
633 | |
|
19.1.1 Geometric Transformation |
|
|
634 | |
|
|
635 | |
|
|
635 | |
|
|
636 | |
|
19.1.2 Curve and Surface Design |
|
|
637 | |
|
|
637 | |
|
|
639 | |
|
19.1.2.3 Surface Representation |
|
|
640 | |
|
|
642 | |
|
19.1.3.1 Constructive Solid Geometry |
|
|
642 | |
|
19.1.3.2 Boundary Representation |
|
|
644 | |
|
19.1.4 Rapid Prototyping Software Formats |
|
|
644 | |
|
19.1.4.1 The STL (Stereolithography) Format |
|
|
644 | |
|
|
646 | |
|
19.1.5 Supports for Part Building |
|
|
646 | |
|
|
647 | |
|
|
648 | |
|
19.2.1 Liquid-Based Systems |
|
|
649 | |
|
|
650 | |
|
19.2.1.2 Parallel Processing |
|
|
654 | |
|
19.2.2 Powder-Based Systems |
|
|
655 | |
|
19.2.2.1 Selective Laser Sintering (SLS) |
|
|
655 | |
|
|
657 | |
|
19.2.2.3 Ballistic Particle Manufacturing |
|
|
658 | |
|
19.2.3 Solid-Based Systems |
|
|
658 | |
|
19.2.3.1 Fused Deposition Modeling |
|
|
659 | |
|
19.2.3.2 Laminated Object Manufacturing |
|
|
659 | |
|
19.2.4 Qualitative Comparison of Some Major Systems |
|
|
661 | |
|
|
662 | |
|
|
662 | |
|
|
663 | |
|
19.4.2 Engineering, Analysis, and Planning |
|
|
663 | |
|
19.4.3 Manufacturing and Tooling |
|
|
663 | |
|
|
664 | |
|
|
665 | |
|
|
665 | |
|
|
666 | |
|
20 Medical and Nanotechnology Applications of Lasers |
|
|
669 | |
|
20.1 Medical Applications |
|
|
669 | |
|
|
670 | |
|
20.1.2 Therapeutic Applications |
|
|
672 | |
|
20.1.2.1 Surgical Procedures |
|
|
673 | |
|
|
673 | |
|
|
674 | |
|
|
674 | |
|
20.2 Nanotechnology Applications |
|
|
675 | |
|
20.2.1 Nanoholes and Grating |
|
|
676 | |
|
|
677 | |
|
20.2.3 Two-Photon Polymerization |
|
|
680 | |
|
20.2.4 Laser-Assisted Nanoimprint Lithography |
|
|
686 | |
|
|
686 | |
|
|
687 | |
|
21 Sensors for Process Monitoring |
|
|
689 | |
|
21.1 Laser Beam Monitoring |
|
|
689 | |
|
|
690 | |
|
21.1.1.1 Pyroelectric or Thermopile Detector |
|
|
690 | |
|
|
690 | |
|
|
691 | |
|
21.1.2.1 Laser Beam Analyzers |
|
|
691 | |
|
21.1.2.2 Plastic Burn Analysis |
|
|
696 | |
|
|
697 | |
|
|
697 | |
|
|
698 | |
|
|
698 | |
|
|
699 | |
|
|
699 | |
|
|
701 | |
|
|
703 | |
|
|
705 | |
|
21.2.1.4 Traditional AE Signal Analysis |
|
|
706 | |
|
|
707 | |
|
21.2.3 Audible Sound Emission |
|
|
709 | |
|
21.2.4 Infrared/Ultraviolet (IR/UV) Detection Techniques |
|
|
711 | |
|
21.2.4.1 Infrared Detection |
|
|
711 | |
|
21.2.4.2 Ultraviolet Detection |
|
|
718 | |
|
21.2.5 Optical (Vision) Sensing |
|
|
719 | |
|
21.2.5.1 Optical Detectors |
|
|
719 | |
|
|
719 | |
|
21.2.5.3 Edge Detection Methodology |
|
|
720 | |
|
|
724 | |
|
|
724 | |
|
|
727 | |
|
|
728 | |
|
22 Processing of Sensor Outputs |
|
|
730 | |
|
22.1 Signal Transformation |
|
|
730 | |
|
22.1.1 The Fourier Transform |
|
|
731 | |
|
22.1.2 The Discrete Fourier Transform (DFT) |
|
|
732 | |
|
22.1.3 Properties of the Discrete Fourier Transform |
|
|
733 | |
|
22.1.4 Advantages of Digital Analysis |
|
|
734 | |
|
22.1.5 Pitfalls of Digital Analysis |
|
|
734 | |
|
22.1.6 The Sampling Theorem |
|
|
736 | |
|
|
736 | |
|
|
737 | |
|
|
739 | |
|
22.1.9.1 Rectangular Window |
|
|
739 | |
|
22.1.9.2 Triangular Window |
|
|
739 | |
|
|
740 | |
|
|
741 | |
|
22.1.10 Picket Fence Effect |
|
|
741 | |
|
22.1.11 Segmental Averaging |
|
|
742 | |
|
|
742 | |
|
22.2.1 Optimum Transform for Data Reduction |
|
|
742 | |
|
22.2.2 Variance Criterion |
|
|
747 | |
|
22.2.3 Class Mean Scatter Criterion |
|
|
747 | |
|
22.3 Pattern Classification |
|
|
749 | |
|
22.3.1 Pattern Recognition |
|
|
749 | |
|
22.3.1.1 Bayes Decision Theory |
|
|
749 | |
|
22.3.1.2 Bayes Decision Rule for Minimum Error |
|
|
750 | |
|
22.3.1.3 Discriminant Function Analysis |
|
|
751 | |
|
22.3.1.4 Minimum-Distance Classifier |
|
|
752 | |
|
22.3.1.5 General Linear Discriminant Function |
|
|
755 | |
|
22.3.1.6 Quadratic Discriminant Function |
|
|
756 | |
|
22.3.1.7 Least-Squares Minimum Distance Classification |
|
|
756 | |
|
|
759 | |
|
22.3.2 Neural Network Analysis |
|
|
760 | |
|
|
763 | |
|
22.3.4 TimeFrequency Analysis |
|
|
764 | |
|
22.3.4.1 Short-Time Fourier Transform |
|
|
764 | |
|
22.3.4.2 Wavelet Transforms |
|
|
766 | |
|
22.3.4.3 TimeFrequency Distributions |
|
|
767 | |
|
22.3.4.4 Applications in Manufacturing |
|
|
769 | |
|
|
770 | |
|
|
771 | |
|
|
773 | |
|
|
774 | |
|
|
778 | |
|
|
778 | |
|
23.1.1 Radiation-Related Hazards |
|
|
778 | |
|
23.1.1.1 Mechanisms of Laser Damage |
|
|
779 | |
|
|
780 | |
|
|
782 | |
|
23.1.2.1 Electrical Hazards |
|
|
783 | |
|
23.1.2.2 Chemical Hazards |
|
|
783 | |
|
23.1.2.3 Environmental Hazards |
|
|
783 | |
|
|
784 | |
|
23.1.2.5 Explosion Hazards and Compressed Gases |
|
|
784 | |
|
|
784 | |
|
23.2 Laser Classification |
|
|
784 | |
|
23.3 Preventing Laser Accidents |
|
|
785 | |
|
23.3.1 Laser Safety Officer |
|
|
785 | |
|
23.3.2 Engineering Controls |
|
|
785 | |
|
23.3.3 Administrative and Procedural Controls |
|
|
786 | |
|
23.3.4 Protective Equipment |
|
|
786 | |
|
23.3.4.1 Protective Eyewear |
|
|
786 | |
|
23.3.4.2 Other Protective Equipment |
|
|
790 | |
|
23.3.5 Warning Signs and Labels |
|
|
792 | |
|
|
793 | |
|
|
794 | |
|
|
795 | |
|
|
795 | |
Overall List of Symbols |
|
797 | |
Index |
|
803 | |