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Roadmap of Scanning Probe Microscopy 2007 ed. [Kietas viršelis]

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  • Formatas: Hardback, 201 pages, aukštis x plotis: 235x155 mm, weight: 1100 g, XVII, 201 p., 1 Hardback
  • Serija: NanoScience and Technology
  • Išleidimo metai: 26-Oct-2006
  • Leidėjas: Springer-Verlag Berlin and Heidelberg GmbH & Co. K
  • ISBN-10: 3540343148
  • ISBN-13: 9783540343141
Kitos knygos pagal šią temą:
  • Formatas: Hardback, 201 pages, aukštis x plotis: 235x155 mm, weight: 1100 g, XVII, 201 p., 1 Hardback
  • Serija: NanoScience and Technology
  • Išleidimo metai: 26-Oct-2006
  • Leidėjas: Springer-Verlag Berlin and Heidelberg GmbH & Co. K
  • ISBN-10: 3540343148
  • ISBN-13: 9783540343141
Kitos knygos pagal šią temą:
Scanning tunneling microscopy - with its applications that span not only atomic resolution but also scanning tunneling spectroscopy, atom/molecule manipulation and nanostructuring, and inelastic electron tunneling spectroscopy - has achieved remarkable progress and become the key technology for surface science. Besides, atomic force microscopy is also rapidly developing and achieving remarkable progress and accomplishments such as true atomic resolution, atom/molecule identification, manipulation and nanostructuring. This book that predicts the future development for all of scanning probe microscopy (SPM). Such forecasts may help to determine the course ultimately to be taken and to accelerate research and development on nanotechnology and nanoscience, as well as all SPM-related fields in future.

Scanning tunneling microscopy has achieved remarkable progress and become the key technology for surface science. This book predicts the future development for all of scanning probe microscopy (SPM). Such forecasts may help to determine the course ultimately taken and may accelerate research and development on nanotechnology and nanoscience, as well as all in SPM-related fields in the future.

Recenzijos

From the reviews:









"This book results from a Japanese project aiming to predict the future development of SPM techniques and their potential applications out to the year 2020. The descriptions and historical backgrounds for each technique are adequately written . it will most likely find a use as a reference text and starting point for further reading." (N J Curson, Australian Physics, Vol. 44 (2), 2007)

1 Science and Technology in the Twenty-First Century
Seizo Morita
1
1.1 Trend of Science and Technology in the Twenty-First Century
1
1.2 Previous Prospect in SPM Roadmap 2000 and the State-of-the-Art
3
1.3 SPM Roadmap
4
1.3.1 Roadmap from Both Sides of Seeds and Needs
4
1.3.2 Various Directions of SPM Roadmap
5
References
6
2 Scanning Tunneling Microscopy
Masahiko Tomitori
7
2.1 Basic Principle of Scanning Tunneling Microscopy
7
2.2 History of STM
10
2.3 Present States and Unsettled Issues
12
2.4 Roadmap
13
2.4.1 Further STM Combination with Other Microscopies and Spectroscopies
13
2.4.2 Miniaturized, Multi-, and Intelligent STM
13
2.4.3 Well-Defined Tips and Hybrid Tips
14
2.4.4 Evolution of STM Utilizing Phase of Tunneling Electron and Ballistic Electron
14
References
14
3 Atomic Force Microscopy
Yasuhiro Sugawara
15
3.1 Principle
15
3.2 History
18
3.3 Present Situation and Issues
19
3.4 Roadmap
20
3.4.1 Development of New Force Spectroscopy
20
3.4.2 Development of AFM Imaging Operating in Special Environments
20
3.4.3 Development of Imaging Method Under the Surface
21
References
21
4 -Near-Field Scanning Optical Microscope
Toshiharu Saiki
23
4.1 Principle of NSOM
23
4.2 Progress in Fundamental Performance of NSOM
24
4.3 Current State of NSOM
26
4.3.1 Probe
26
4.3.2 Operation Environment
26
4.3.3 Near-Field Optical Spectroscopy
27
4.4 Roadmap
28
4.4.1 Enhancement of Spatial Resolution
28
4.4.2 Functional Probes
29
4.4.3 Extension of NSOM Operation Wavelength
30
4.4.4 Nanoscale Light—Matter Interaction
31
References
32
5 Scanning Capacitance Microscope
Yoshitsugu Nakagawa
35
5.1 Principle of SCM
35
5.2 Practical Dopant Profiling by SCM
37
5.3 Other SPMs for Dopant Profiling
39
5.4 Roadmap
40
References
42
6 Electrostatic Force Microscopy
Masakazu Nakamura and Hirofumi Yamada
43
6.1 Fundamentals
43
6.2 Present State and Problems
46
6.3 Roadmap
49
References
51
7 Magnetic Force Microscope
Stimio Hosaka
53
7.1 Principle of MFM [ 1,2]
53
7.1.1 Estimated Resolution of MFM
53
7.1.2 Detectable Sensitivity of MFM
55
7.2 History of MFM
57
7.3 MFM Applications to Magnetic Recording Media
57
7.3.1 Observation of Ultrahigh Density Perpendicular Magnetic Recording
57
7.3.2 Evaluation of Recording Property in High Density Magnetic Recording
58
7.4 Roadmap of MFM
59
References
61
8 STM-Induced Photon Emission Spectroscopy
Tooru Murashita
63
8.1 Characteristics
63
8.2 Emission Mechanism
64
8.2.1 Electron–Hole Recombination Radiation
64
8.2.2 Surface Plasmon Emission
65
8.3 History of Research and Development
66
8.4 Present Situation and Issues
66
8.5 Roadmap
67
8.5.1 Equipment Performance
67
8.5.2 Applications
69
References
70
9 Scanning Atom Probe
Osamu Nishikawa
71
9.1 What is the Scanning Atom Probe?
71
9.2 Mass Analysis of Nonmetallic Specimens by the SAP
72
9.3 Present State and Problems
74
9.4 Roadmap
75
References
76
10 Chemical Discrimination of Atoms and Molecules
Komeda Tadahiro, Seizo Morita and Yauhiro Sugawara
77
10.1 Recognition of Atom and Molecules; Inelastic Tunneling Spectroscopy
77
10.2 Chemical Identification of Atoms by AFM
79
10.2.1 Chemical Identification of Atom Species by AFM
79
10.3 Roadmap
82
10.3.1 Recognition of Atom and Molecules; Inelastic Tunneling Spectroscopy
82
10.3.2 Future Prospect of Chemical Identification of Atoms by AFM
82
References
83
11 Manipulation of Atoms and Molecules
Tadahiro Komeda, Seizo Morita, Shukichi Tanaka and Hirofumi Yamada
85
11.1 Manipulation of Atoms and Molecules: With the Use of STM Through Vibrational Excitation of Molecules
85
11.2 Manipulation of Atoms and Molecules by AFM
87
11.2.1 Atom Manipulation by AFM
87
11.2.2 AFM Manipulation of Organic Molecules
89
11.3 Roadmap
92
11.3.1 Manipulation of Atoms and Molecules: with the Use of STM Electrons
92
11.3.2 Future Prospect of Atom Manipulation by AFM
92
11.3.3 Future Prospect of AFM Manipulation of Organic Molecules
93
References
94
12 Multiprobe SPM
Shuji Hasegawa
95
12.1 Present Status
95
12.1.1 Improvements
97
12.1.2 Roadmap
98
References
99
13 AFM Measurement in Liquid
Hirofumi Yamada
101
13.1 Demand for AFM Imaging in Liquid
101
13.2 Dynamic Mode AFM Imaging in Liquid
102
13.2.1 AM-AFM and Q-Control Method
102
13.2.2 High-Resolution Imaging by FM-AFM
103
13.3 Technical Issues
105
13.3.1 Force Sensitivity Improvement
105
13.3.2 Spurious Peaks in Oscillation Spectrum
105
13.3.3 High-Resolution Imaging of a Sample Having Large Height Variations
106
13.4 Roadmap
106
13.4.1 High-Speed FM-AFM Imaging
106
13.4.2 Charge Density Mapping in Liquid
106
13.4.3 Mapping of Three-Dimensional Solvation Structure
107
References
108
14 High-Speed SPM
Toshio Ando
109
14.1 Optimization of AFM Devices for High-Speed Scanning
109
14.1.1 Scanner and Related Devices
110
14.1.2 Cantilevers and Related Devices
110
14.1.3 Feedback Control and Related Techniques
111
14.2 World Trends in the High-Speed SPM
112
14.3 Roadmap
114
14.3.1 Until 2010
114
14.3.2 Until 2015
114
14.3.3 After 2015
115
References
115
15 Scanning Nonlinear Dielectric Microscope
Yasuo Cho
117
15.1 Principle and Theory for SNDM
117
15.2 Microscopic Observation of Area Distribution of Ferroelectric Domain Using SNDM
118
15.3 Visualization of Stored Charge in Semiconductors Using SNDM
120
15.4 SNDM Ferroelectric Probe Memory
121
15.5 Roadmap
121
References
122
16 SPM Coupled with External Fields
Ken Nakajima and Tadahiro Komeda
123
16.1 Light-Illumination STM
123
16.2 Coupling with Outer Field; Electron Spin Resonance Detection using STM
124
16.3 Roadmap
127
References
127
17 Probe Technology
Masamichi Yoshimura
129
17.1 Introduction
129
17.2 Carbon Nanotube Probe
130
17.2.1 Mechanical Method
130
17.3 Roadmap
132
References
132
18 Characterization of Semiconducting Materials
Shuji Hasegawa and Masahiko Tomitori
133
18.1 Characterization of Semiconductor Surfaces
133
18.2 Characterization of Semiconductor Interfaces
135
18.3 Characterization and Manipulation of Semiconductor Nanostructures
135
18.4 Characterization of Defects in Semiconductors
136
18.5 Characterization of Semiconductor Processes
137
References
137
19 Evaluation of SPM for LSI Devices
Koji Usuda, Takashi Furukawa and Yasushi Kadota
139
19.1 LSI Devices and Forecast
139
19.1.1 Development of Si-LSI Devices
139
19.1.2 Forecast of Si-LSI Devices
140
19.2 Present Evaluation Technologies of LSI Devices and Latest Trend of SPM Characterization
141
19.2.1 LSI Device Evaluation Technology
142
19.2.2 Latest Trend of SPM Evaluations
142
19.2.3 New Evaluation with Advanced SPM Technology
146
19.3 Roadmap
147
References
149
20 SPM Characterization of Catalysts
Hiroshi Onishi
151
20.1 SPM for What?
151
20.2 Roadmap
152
References
153
21 SPM Characterization of Biomaterials
Atsushi Rai and Rehana Afrin
155
21.1 Bioscience
155
21.1.1 Present Status of Nanoprobetechnology in Bioscience
155
21.1.2 Roadmap 2000
156
21.2 Biotechnology
158
21.2.1 Nanoprobetechnology in Biotechnology
158
21.3 Roadmap
160
21.3.1 Nanoprobetechnology in Biological Field
160
21.3.2 Bionanotechnology
164
References
165
22 SPM Characterization of Organic and Polymeric Materials
Shukichi Tanaka and Ken Nakajima
167
22.1 Characterization of Organic Materials
167
22.2 Characterization of Polymeric Materials
171
22.3 Roadmap
174
References
174
23 Theories of SPM
Masaru Tsukada and Shin-ya Hasegawa
177
23.1 Present Status of Theories of STM
177
23.2 Present Status of the Theory for AFM
178
23.3 Development of SPM Simulator
179
23.3.1 Hierarchical Tip and Sample Model
181
23.3.2 STM Simulation for the Decorated Tip
181
23.3.3 Theoretical Simulation Method for the Dynamic AFM in Liquid
182
23.3.4 SPM Simulation for Organic and Protein Molecules
182
23.3.5 The KFM Simulator
183
23.4 Present Status and Problems with Theories and Simulations of NSOM
183
23.5 Roadmap
186
References
188
24 When Will SPM Realize Our Dreams? The Roadmap of SPM
Osamu Kubo
189
Index 197