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Scanning Probe Microscopy: Atomic Force Microscopy and Scanning Tunneling Microscopy 2015 ed. [Kietas viršelis]

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  • Formatas: Hardback, 382 pages, aukštis x plotis: 235x155 mm, weight: 7214 g, 148 Illustrations, color; 41 Illustrations, black and white; XV, 382 p. 189 illus., 148 illus. in color., 1 Hardback
  • Serija: NanoScience and Technology
  • Išleidimo metai: 23-Mar-2015
  • Leidėjas: Springer-Verlag Berlin and Heidelberg GmbH & Co. K
  • ISBN-10: 3662452391
  • ISBN-13: 9783662452394
Kitos knygos pagal šią temą:
Scanning Probe Microscopy: Atomic Force Microscopy and Scanning Tunneling Microscopy 2015 ed.Didesnis paveikslėlis
  • Formatas: Hardback, 382 pages, aukštis x plotis: 235x155 mm, weight: 7214 g, 148 Illustrations, color; 41 Illustrations, black and white; XV, 382 p. 189 illus., 148 illus. in color., 1 Hardback
  • Serija: NanoScience and Technology
  • Išleidimo metai: 23-Mar-2015
  • Leidėjas: Springer-Verlag Berlin and Heidelberg GmbH & Co. K
  • ISBN-10: 3662452391
  • ISBN-13: 9783662452394
Kitos knygos pagal šią temą:
Pastovi nuoroda: https://www.kriso.lt/db/9783662452394.html
Raktažodžiai:
This book explains the principles of operation of scanning force microscopes, scanning tunneling microscopes, and related techniques. The aim of this book is to introduce the reader to scanning probe microscopy in such depth that the reader will be able to operate a scanning probe microscope successfully and understand the data obtained with the microscope. The chapters on the scanning probe techniques are complemented the by chapters on fundamentals and chapters on important technical aspects. The book applies to master s students from physics, chemistry, materials science, nanoscience and engineering, as well as graduate students and researchers new to the field.

Introduction and overview of scanning tunneling microscopy (STM) and scanning force microscopy (SFM).- Technical aspects of scanning probe microscopy: Piezo effect, vibration isolation, tip etching.- STM/AFM designs and design considerations.- Scanning force microscopy, cantilever detection methods (beam deflection), contact SFM Force distance curves.- Non-contact AFM I (amplitude modulation).- Non-contact AFM II (frequency modulation).- STM theory and applications.- Scanning tunneling spectroscopy.- Surface states, manipulation.- Inelastic spectroscopy, vibrational spectroscopy.- SXM , spin-polarized STM, magnetic AFM.- Multi-tip STM.

Recenzijos

The book attempts to provide a technical, theoretical, and conceptual framework to understand how SPM works and what can be done with it so that a reader wishing to further learn about newer topics will have the basis to do so. This book could thus serve as a useful reference and textbook for anyone desiring an advanced introduction to the fascinating world of SPM. (Sidney Cohen, MRS Bulletin, Vol. 41, February, 2016)

The contents of this book are presented in a very clear didactic manner ... . In addition, it includes the foundations of many technical aspects that are not necessarily a part of the methods themselves, but which in practice are required for the application. ... What I particularly like, is the fact that it discusses common artefacts occurring in scanning tunneling microscopy. Such discussions are rare in the literature, although they are essential for a complete training of young scientists. To my mind the book is well suited not only for physicists, but also for chemists, materials and nano-scientists and others with similar background. (Quote translated from German, Jascha Repp, Physik Journal, issue 4, 2016)  

1 Introduction
1(14)
1.1 Introduction to Scanning Tunneling Microscopy
4(3)
1.2 Introduction to Atomic Force Microscopy
7(3)
1.3 A Short History of Scanning Probe Microscopy
10(1)
1.4 Summary
11(4)
Part I Scanning Probe Microscopy Instrumentation
2 Harmonic Oscillator
15(16)
2.1 Free Harmonic Oscillator
15(2)
2.2 Driven Harmonic Oscillator
17(2)
2.3 Driven Harmonic Oscillator with Damping
19(4)
2.4 Transients of Oscillations
23(2)
2.5 Dissipation and Quality Factor of a Damped Driven Harmonic Oscillator
25(1)
2.6 Effective Mass of a Harmonic Oscillator
26(2)
2.7 Linear Differential Equations
28(1)
2.8 Summary
29(2)
3 Technical Aspects of Scanning Probe Microscopy
31(34)
3.1 Piezoelectric Effect
31(3)
3.2 Extensions of Piezoelectric Actuators
34(3)
3.3 Piezoelectric Materials
37(2)
3.4 Tube Piezo Element
39(6)
3.4.1 Resonance Frequencies of Piezo Tubes
43(2)
3.5 Flexure-Guided Piezo Nanopositioning Stages
45(1)
3.6 Non-linearities and Hysteresis Effects of Piezoelectric Actuators
46(4)
3.6.1 Hysteresis
46(3)
3.6.2 Creep
49(1)
3.6.3 Thermal Drift
50(1)
3.7 STM Tip Preparation
50(2)
3.8 Vibration Isolation
52(9)
3.8.1 Isolation of the Microscope from Outer Vibrations
52(4)
3.8.2 The Microscope Considered as a Vibrating System
56(2)
3.8.3 Combining Vibration Isolation and a Microscope with High Resonance Frequency
58(3)
3.9 Building Vibrations
61(2)
3.10 Summary
63(2)
4 Scanning Probe Microscopy Designs
65(12)
4.1 Nanoscope
65(1)
4.2 Inertial Sliders
66(5)
4.3 Beetle STM
71(1)
4.4 Pan Slider
72(1)
4.5 KoalaDrive
73(2)
4.6 Tip Exchange
75(1)
4.7 Summary
75(2)
5 Electronics for Scanning Probe Microscopy
77(24)
5.1 Voltage Divider
77(1)
5.2 Impedance, Transfer Function, and Bode Plot
78(2)
5.3 Output Resistance/Input Resistance
80(1)
5.4 Noise
81(1)
5.5 Operational Amplifiers
82(4)
5.5.1 Voltage Follower/Impedance Converter
83(1)
5.5.2 Voltage Amplifier
84(2)
5.6 Current Amplifier
86(2)
5.7 Feedback Controller
88(3)
5.7.1 Proportional Controller
89(1)
5.7.2 Proportional-Integral Controller
90(1)
5.8 Feedback Controller in STM
91(3)
5.9 Implementation of an STM Feedback Controller
94(2)
5.10 Digital-to-Analog Converter
96(1)
5.11 Analog-to-Digital Converter
97(1)
5.12 High-Voltage Amplifier
98(1)
5.13 Summary
99(2)
6 Lock-In Technique
101(6)
6.1 Lock-In Amplifier---Principle of Operation
101(4)
6.2 Summary
105(2)
7 Data Representation and Image Processing
107(8)
7.1 Data Representation
107(5)
7.2 Image Processing
112(1)
7.3 Data Analysis
113(1)
7.4 Summary
114(1)
8 Artifacts in SPM
115(8)
8.1 Tip-Related Artifacts
115(4)
8.2 Other Artifacts
119(2)
8.3 Summary
121(2)
9 Work Function, Contact Potential, and Kelvin Probe Scanning Force Microscopy
123(12)
9.1 Work Function
123(1)
9.2 Effect of a Surface on the Work Function
124(2)
9.3 Surface Charges and External Electric Fields
126(3)
9.4 Contact Potential
129(1)
9.5 Measurement of Work Function by the Kelvin Method
129(2)
9.6 Kelvin Probe Scanning Force Microscopy (KFM)
131(1)
9.7 Summary
132(3)
10 Surface States
135(10)
10.1 Surface States in a One-Dimensional Crystal
135(4)
10.2 Surface States in 3D Crystals
139(1)
10.3 Surface States Within the Tight Binding Model
140(1)
10.4 Summary
141(4)
Part II Atomic Force Microscopy (AFM)
11 Forces Between Tip and Sample
145(12)
11.1 Tip-Sample Forces
145(4)
11.2 Snap-to-Contact
149(6)
11.3 Summary
155(2)
12 Technical Aspects of Atomic Force Microscopy (AFM)
157(20)
12.1 Requirements for Force Sensors
157(2)
12.2 Fabrication of Cantilevers
159(2)
12.3 Beam Deflection Atomic Force Microscopy
161(4)
12.3.1 Sensitivity of the Beam Deflection Method
162(2)
12.3.2 Detection Limit of the Beam Deflection Method
164(1)
12.4 Other Detection Methods
165(2)
12.5 Calibration of AFM Measurements
167(8)
12.5.1 Experimental Determination of the Sensitivity Factor in AFM
167(1)
12.5.2 Calculation of the Spring Constant from the Geometrical Data of the Cantilever
168(2)
12.5.3 Sader Method for the Determination of the Spring Constant of a Cantilever
170(1)
12.5.4 Thermal Method for the Determination of the Spring Constant of a Cantilever
170(4)
12.5.5 Experimental Determination of the Sensitivity and Spring Constant in AFM Without Tip-Sample Contact
174(1)
12.6 Summary
175(2)
13 Static Atomic Force Microscopy
177(10)
13.1 Principles of Static Atomic Force Microscopy
177(2)
13.2 Properties of Static AFM Imaging
179(1)
13.3 Constant Height Mode in Static AFM
180(1)
13.4 Friction Force Microscopy (FFM)
181(1)
13.5 Force-Distance Curves
182(4)
13.6 Summary
186(1)
14 Amplitude Modulation (AM) Mode in Dynamic Atomic Force Microscopy
187(18)
14.1 Parameters of Dynamic Atomic Force Microscopy
187(1)
14.2 Principles of Dynamic Atomic Force Microscopy I (Amplitude Modulation)
188(5)
14.3 Amplitude Modulation (AM) Detection Scheme in Dynamic Atomic Force Microscopy
193(3)
14.4 Experimental Realization of the AM Detection Mode
196(2)
14.5 Time Constant in AM Detection
198(2)
14.6 Dissipative Interactions in Non-contact AFM in the Small Amplitude Limit
200(3)
14.7 Dependence of the Phase on the Damping and on the Force Gradient
203(1)
14.8 Summary
204(1)
15 Intermittent Contact Mode/Tapping Mode
205(18)
15.1 Atomic Force Microscopy with Large Oscillation Amplitudes
205(6)
15.2 Resonance Curve for an Anharmonic Force-Distance Dependence
211(2)
15.3 Amplitude Instabilities for an Anharmonic Oscillator
213(4)
15.4 Energy Dissipation in Dynamic Atomic Force Microscopy
217(3)
15.5 Properties of the Intermittent Contact Mode/Tapping Mode
220(1)
15.6 Summary
221(2)
16 Mapping of Mechanical Properties Using Force-Distance Curves
223(6)
16.1 Principles of Force-Distance Curve Mapping
223(3)
16.2 Mapping of the Mechanical Properties of the Sample
226(1)
16.3 Summary
227(2)
17 Frequency Modulation (FM) Mode in Dynamic Atomic Force Microscopy---Non-contact Atomic Force Microscopy
229(26)
17.1 Principles of Dynamic Atomic Force Microscopy II
229(9)
17.1.1 Expression for the Frequency Shift
232(3)
17.1.2 Normalized Frequency Shift in the Large Amplitude Limit
235(3)
17.1.3 Recovery of the Tip-Sample Force
238(1)
17.2 Experimental Realization of the FM Detection Scheme
238(12)
17.2.1 Self-excitation Mode
238(6)
17.2.2 Frequency Detection with a Phase-Locked Loop (PLL)
244(4)
17.2.3 PLL Tracking Mode
248(2)
17.3 The Non-monotonous Frequency Shift in AFM
250(1)
17.4 Comparison of Different AFM Modes
251(1)
17.5 Summary
252(3)
18 Noise in Atomic Force Microscopy
255(14)
18.1 Thermal Noise Density of a Harmonic Oscillator
255(3)
18.2 Thermal Noise in the Static AFM Mode
258(1)
18.3 Thermal Noise in the Dynamic AFM Mode with AM Detection
258(2)
18.4 Thermal Noise in Dynamic AFM with FM Detection
260(2)
18.5 Sensor Displacement Noise in the FM Detection Mode
262(1)
18.6 Total Noise in the FM Detection Mode
263(1)
18.7 Comparison to Noise in STM
264(1)
18.8 Signal-to-Noise Ratio in Atomic Force Microscopy FM Detection
265(2)
18.9 Summary
267(2)
19 Quartz Sensors in Atomic Force Microscopy
269(10)
19.1 Tuning Fork Quartz Sensor
269(1)
19.2 Quartz Needle Sensor
270(3)
19.3 Determination of the Sensitivity of Quartz Sensors
273(2)
19.4 Summary
275(4)
Part III Scanning Tunneling Microscopy and Spectroscopy
20 Scanning Tunneling Microscopy
279(30)
20.1 One-Dimensional Potential Barrier Model
279(5)
20.2 Flux of Matter and Charge in Quantum Mechanics
284(2)
20.3 The WKB Approximation for Tunneling
286(2)
20.4 Density of States
288(1)
20.5 Bardeen Model for Tunneling
289(13)
20.5.1 Energy-Dependent Approximation of the Bardeen Model
292(10)
20.5.2 Tersoff-Hamann Approximation of the Bardeen Model
300
20.6 Constant Current Mode and Constant Height Mode
302(2)
20.7 Voltage-Dependent Imaging
304(2)
20.8 Summary
306(3)
21 Scanning Tunneling Spectroscopy (STS)
309(26)
21.1 Scanning Tunneling Spectroscopy---Overview
309(1)
21.2 Experimental Realization of Spectroscopy with STM
310(3)
21.3 Normalized Differential Conductance
313(3)
21.4 Relation Between Differential Conductance and the Density of States
316(3)
21.5 Recovery of the Density of States
319(3)
21.6 Asymmetry in the Tunneling Spectra
322(2)
21.7 Beyond the ID Barrier Approximation
324(1)
21.8 Energy Resolution in Scanning Tunneling Spectroscopy
324(3)
21.9 Barrier Height Spectroscopy
327(2)
21.10 Barrier Resonances
329(1)
21.11 Spectroscopic Imaging
330(3)
21.11.1 Example: Spectroscopy of the Si(7 x 7) Surface
330(3)
21.12 Summary
333(2)
22 Vibrational Spectroscopy with the STM
335(6)
22.1 Principles of Inelastic Tunneling Spectroscopy with the STM
335(2)
22.2 Examples of Vibrational Spectra Obtained with the STM
337(3)
22.3 Summary
340(1)
23 Spectroscopy and Imaging of Surface States
341(8)
23.1 Energy Dependence of the Density of States in Two, One and Zero Dimensions
341(4)
23.2 Scattering of Surface State Electrons at Surface Defects
345(2)
23.3 Summary
347(2)
24 Building Nanostructures Atom by Atom
349(10)
24.1 Positioning of Single Atoms and Molecules by STM
349(5)
24.2 Electron Confinement in Nanoscale Cages
354(2)
24.3 Inducing a Single Molecule Chemical Reaction with the STM Tip
356(1)
24.4 Summary
357(2)
Appendix A Horizontal Piezo Constant for a Tube Piezo Element 359(4)
Appendix B Fermi's Golden Rule and Bardeen's Matrix Elements 363(8)
Appendix C Frequency Noise in FM Detection 371(4)
References 375(2)
Index 377
This book explains the operating principles of atomic force microscopy and scanning tunneling microscopy. The aim of this book is to enable the reader to operate a scanning probe microscope successfully and understand the data obtained with the microscope. The chapters on the scanning probe techniques are complemented by the chapters on fundamentals and important technical aspects. This textbook is primarily aimed at graduate students from physics, materials science, chemistry, nanoscience and engineering, as well as researchers new to the field.