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Scanning Probe Microscopy in Industrial Applications: Nanomechanical Characterization [Kietas viršelis]

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  • Formatas: Hardback, 368 pages, aukštis x plotis x storis: 242x163x24 mm, weight: 667 g
  • Išleidimo metai: 28-Jan-2014
  • Leidėjas: John Wiley & Sons Inc
  • ISBN-10: 1118288238
  • ISBN-13: 9781118288238
Kitos knygos pagal šią temą:
Scanning Probe Microscopy in Industrial Applications: Nanomechanical CharacterizationDidesnis paveikslėlis
  • Formatas: Hardback, 368 pages, aukštis x plotis x storis: 242x163x24 mm, weight: 667 g
  • Išleidimo metai: 28-Jan-2014
  • Leidėjas: John Wiley & Sons Inc
  • ISBN-10: 1118288238
  • ISBN-13: 9781118288238
Kitos knygos pagal šią temą:
Pastovi nuoroda: https://www.kriso.lt/db/9781118288238.html
Raktažodžiai:
"Covering a diverse range of practical applications and real-world examples, Scanning Probe Microscopy for Industrial Applications examines important and successful applications of SPM in various industries, including food science, personal care industry, and forestry applications. Author D. G. Yablon details how SPM has impacted the industrial sector leading to improved product formulation, new understanding of processes, and improvements in manufacturing. The book provides chemists, materials scientists, physicists, polymer scientists, and biophysicists with the most important and successful applications of SPM"--

"This book broadly addresses the use of Scanning Probe Microscopy (SPM) for industrial applications and provides a resource that focuses on the use of SPM for real world applications"--

Describes new state-of-the-science tools and their contribution to industrial R&D

With contributions from leading international experts in the field, this book explains how scanning probe microscopy is used in industry, resulting in improved product formulation, enhanced processes, better quality control and assurance, and new business opportunities. Readers will learn about the use of scanning probe microscopy to support R&D efforts in the semiconductor, chemical, personal care product, biomaterial, pharmaceutical, and food science industries, among others.

Scanning Probe Microscopy for Industrial Applications emphasizes nanomechanical characterization using scanning probe microscopy. The first half of the book is dedicated to a general overview of nanomechanical characterization methods, offering a complete practical tutorial for readers who are new to the topic. Several chapters include worked examples of useful calculations such as using Hertz mechanics with and without adhesion to model a contact, step-by-step instructions for simulations to guide cantilever selection for an experiment, and data analysis procedures for dynamic contact experiments.

The second half of the book describes applications of nanomechanical characterization in industry, including:

  • New formulation development for pharmaceuticals
  • Measurement of critical dimensions and thin dielectric films in the semiconductor industry
  • Effect of humidity and temperature on biomaterials
  • Characterization of polymer blends to guide product formulation in the chemicals sector
  • Unraveling links between food structure and function in the food industry

Contributions are based on the authors' thorough review of the current literature as well as their own firsthand experience applying scanning probe microscopy to solve industrial R&D problems.

By explaining the fundamentals before advancing to applications, Scanning Probe Microscopy for Industrial Applications offers a complete treatise that is accessible to both novices and professionals. All readers will discover how to apply scanning probe microscopy to build and enhance their R&D efforts.

Contributors List xiii
Preface xv
Acknowledgments xix
1 Overview of Atomic Force Microscopy
1(14)
Dalia G. Yablon
1.1 A Word on Nomenclature
2(1)
1.2 Atomic Force Microscopy---The Appeal to Industrial R&D
2(3)
1.3 Mechanical Properties
5(1)
1.4 Overview of AFM Operation
6(5)
1.5 Nanomechanical Methods Surveyed in Book
11(2)
1.6 Industries Represented
13(2)
Acknowledgments
14(1)
References
14(1)
2 Understanding the Tip-Sample Contact: An Overview of Contact Mechanics from the Macro- to the Nanoscale
15(34)
Tevis D. B. Jacobs
C. Mathew Mate
Kevin T. Turner
Robert W. Carpick
2.1 Hertz Equations for Elastic Contact
15(7)
2.2 Adhesive Contacts
22(7)
2.3 Further Extensions of Continuum Contact Mechanics Models
29(5)
2.4 Thin Films
34(3)
2.5 Tangential Forces
37(5)
2.6 Application of Continuum Mechanics to Nanoscale Contacts
42(7)
Acknowledgments
44(1)
Appendix 2A Surface Energy and Work of Adhesion
44(1)
References
45(4)
3 Understanding Surface Forces Using Static and Dynamic Approach-Retraction Curves
49(46)
Sudharsan Balasubramaniam
Daniel Kiracofe
Arvind Raman
3.1 Tip-S ample Interaction Forces
53(5)
3.2 Static F-Z Curves
58(11)
3.3 Dynamic Amplitude/Phase-Distance Curves
69(9)
3.4 Brief Guide to VEDA Simulations
78(12)
3.5 Conclusions Glossary References
90(5)
4 Phase Imaging
Dalia G. Yablon
Greg Haugstad
4.1 Introduction
95(2)
4.2 Bistability: Attractive and Repulsive Mode
97(10)
4.3 Complications in Phase Quantification
107(8)
References
113(2)
5 Dvnamic Contact AFM Methods for Nanomechanical Properties
115(35)
Donna C. Hurley
Jason P. Killgore
5.1 Introduction
115(6)
5.2 Force Modulation Microscopy (FMM)
121(4)
5.3 Contact Resonance (CR) Techniques
125(11)
5.4 Comparison of FMM and CR-FM
136(2)
5.5 Other Dvnamic Contact Approaches
138(2)
5.6 Summary and Conclusions
140(10)
Acknowledgments
141(1)
Appendix 5A Data Analysis Procedure for Contact Resonance Spectroscopy Measurements
141(4)
References
145(5)
6 Guide to Best Practices for AFM Users
150(12)
Greg Haugstad
6.1 Force-Distance Measurements---Instrumental Sources of Nonideality
151(6)
6.2 Force-Distance Measurements---Physical Sources of Nonideality
157(5)
References
161(1)
7 Nanoindentation Measurements of Mechanical Properties of Very Thin Films and Nanostructured Materials at High Spatial Resolution
162(28)
Steve J. Bull
7.1 Introduction
162(1)
7.2 Bulk Materials
163(13)
7.3 Coatings
176(12)
7.4 Conclusions
188(2)
Acknowledgments
188(1)
References
188(2)
8 Scanning Probe Microscopy for Critical Measurements in the Semiconductor Industry
190(20)
Johann Foucher
8.1 Introduction
190(1)
8.2 Critical Dimension in the Semiconductor Industry
191(1)
8.3 CD Metrology Techniques for Production
192(2)
8.4 Obtaining Accurate CD in the Semiconductor Industry
194(9)
8.5 Hybrid Metrology as a Final Solution to Overcome CD-AFM, CD-SEM, and Scatterometry Intrinsic Limitations
203(5)
8.6 Conclusion
208(2)
References
208(2)
9 Atomic Force Microscopy of Polymers
210(22)
Andy H. Tsou
Dalia G. Yablon
9.1 Introduction
210(3)
9.2 Tapping Phase AFM
213(4)
9.3 Nanoindentation
217(1)
9.4 Force Modulation
218(1)
9.5 Pulsed Force Imaging
219(1)
9.6 Force-Volume AFM
220(2)
9.7 HarmoniX and Peak Force QNM Imaging
222(5)
9.8 Summary
227(5)
References
229(3)
10 Unraveling Links between Food Structure and Function with Probe Microscopy
232(19)
A. Patrick Gunning
Victor J. Morris
10.1 Introduction
232(4)
10.2 Gels and Thickeners: Molecular Networks
236(2)
10.3 Emulsions and Foams: Protein-Surfactant Competition
238(3)
10.4 Interfacial Structure and Digestion: Designer Interfaces
241(3)
10.5 Force Spectroscopy: Model Emulsions
244(3)
10.6 Force Spectroscopy: Origins of Bioactivity
247(1)
10.7 Conclusions
248(3)
References
249(2)
11 Microcantilever Sensors for Petrochemical Applications
251(19)
Alan M. Schilowitz
11.1 Introduction
251(1)
11.2 Background
252(5)
11.3 Applications
257(9)
11.4 Conclusion
266(4)
References
267(3)
12 Applications of Scanning Probe Methods in Cosmetic Science
270(17)
Gustavo S. Luengo
Anthony Galliano
12.1 Introduction
270(1)
12.2 Substrates of Cosmetics
271(3)
12.3 Mechanical Properties and Modifications by Cosmetic Products
274(1)
12.4 Scanning Probe Technologies Adapted to Cosmetic Science
275(10)
12.5 Conclusions
285(2)
References
285(2)
13 Applications of Scanning Probe Microscopy and Nanomechanical Analysis in Pharmaceutical Development
287(15)
Matthew S. Lamm
13.1 Introduction
287(1)
13.2 Applications of SPM Imaging
288(3)
13.3 SPM as a Screening Tool
291(2)
13.4 Applications of Nanoindentation
293(6)
13.5 Conclusion
299(3)
Acknowledgments
299(1)
References
300(2)
14 Comparative Nanomechanical Study of Multiharmonic Force Microscopy and Nanoindentation on Low Dielectric Constant Materials
302(21)
Katharine Walz
Robin King
Willi Volksen
Geraud Dubois
Jane Frommer
Kumar Virwani
14.1 Introduction
302(6)
14.2 Experimental
308(3)
14.3 Results and Discussions
311(8)
14.4 Conclusions
319(4)
Acknowledgments
320(1)
References
320(3)
15 Nanomechanlcal Characterization of Biomaterial Surfaces: Polymer Coatings That Elute Drugs
323(19)
Klaus Wormuth
Greg Haugstad
15.1 Introduction
323(2)
15.2 Materials and Methods
325(2)
15.3 Dexamethasone in PBMA or PBMA--PLMA Polymer Blends
327(10)
15.4 Simvastatin in PEO--PBT Copolymers
337(3)
15.5 Concluding Comments
340(2)
Acknowledgments
341(1)
References
341(1)
Index 342
DALIA G. YABLON, PhD, developed and led a state-of-the-art scanning probe microscopy facility for more than ten years in Corporate Strategic Research, the flagship R&D center of ExxonMobil Corporation. Under her direction, scanning probe microscopy was used to characterize, conduct failure analysis, and probe structure-property relationships across all sectors of the vast petroleum business including areas of polymers, tribology, corrosion, geochemistry, and metallurgy. She currently leads SurfaceChar, a characterization consulting company.