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Introduction to Scanning Probe Microscopy |
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1 | (14) |
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2 | (3) |
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5 | (10) |
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6 | (1) |
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7 | (4) |
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11 | (1) |
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Computer Control and Image Processing |
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12 | (3) |
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Introduction to Scanning Tunneling Microscopy |
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15 | (30) |
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Tunneling: A Quantum-Mechanical Effect |
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16 | (3) |
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18 | (1) |
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19 | (10) |
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19 | (2) |
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Implementation in Different Environments |
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21 | (1) |
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21 | (5) |
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26 | (3) |
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29 | (5) |
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Imaging of Semiconductors |
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29 | (1) |
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30 | (1) |
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Imaging of Layered Materials |
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31 | (1) |
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32 | (1) |
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33 | (1) |
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Theoretical Estimates of Resolution Limits |
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33 | (1) |
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Observation of Confined Electrons |
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34 | (7) |
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Scattering of Surface State Electrons at Steps |
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34 | (2) |
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Scattering of Surface State Electrons at Point Defects |
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36 | (1) |
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Electron Confinement to Nanoscale Boxes |
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37 | (3) |
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Summary of Dispersion Relations for Noble-Metal (111) Surfaces |
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40 | (1) |
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41 | (3) |
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Observation of the Kondo Effect and Quantum Mirage |
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44 | (1) |
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45 | (52) |
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Concept and Instrumental Aspects |
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45 | (6) |
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Deflection Sensors: Techniques to Measure Small Cantilever Deflections |
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45 | (1) |
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Spring Constants of Rectangular Cantilevers |
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46 | (3) |
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Cantilever and Tip Preparation |
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49 | (1) |
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Implementations of Force Microscopy |
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50 | (1) |
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51 | (7) |
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51 | (1) |
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52 | (1) |
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53 | (2) |
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55 | (1) |
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56 | (1) |
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57 | (1) |
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Operation Modes in Force Microscopy |
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58 | (3) |
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61 | (12) |
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61 | (3) |
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Lateral Resolution and Contact Area |
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64 | (1) |
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Friction Force Microscopy |
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65 | (2) |
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Atomic Friction Processes |
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67 | (3) |
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Lateral Contact Stiffness |
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70 | (2) |
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Velocity Dependence of Atomic Friction |
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72 | (1) |
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73 | (14) |
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Modelling Dynamic Force Microscopy |
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74 | (2) |
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76 | (2) |
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Spectroscopic Measurements |
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78 | (1) |
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79 | (2) |
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Dissipation Force Microscopy |
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81 | (6) |
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Tapping Mode Force Microscopy |
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87 | (3) |
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87 | (1) |
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88 | (1) |
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89 | (1) |
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Further Modes of Force Microscopy |
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90 | (2) |
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Force Resolution and Thermal Noise |
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92 | (5) |
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MFM and Related Techniques |
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97 | (30) |
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98 | (4) |
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Tip-Sample Distance Control |
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98 | (3) |
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Measurement of Magnetic Forces |
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101 | (1) |
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102 | (22) |
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102 | (2) |
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Stray Fields of Simple Micromagnetic Structures |
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104 | (4) |
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108 | (7) |
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115 | (4) |
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Irreversible Modifications |
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119 | (2) |
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Separation of Topography and Magnetic Signal |
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121 | (3) |
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Magnetic Resonance Force Microscopy |
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124 | (3) |
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Other Members of the SPM Family |
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127 | (26) |
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Scanning Near-Field Optical Microscopy (SNOM) |
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127 | (5) |
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Scanning Near-Field Acoustic Microscopy (SNAM) |
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132 | (1) |
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Scanning Ion Conductance Microscopy (SICM) |
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133 | (2) |
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Photoemission Microscopy with Scanning Aperture (PEMSA) |
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135 | (1) |
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STM with Inverse Photoemission (STMiP) |
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135 | (1) |
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Laser Scanning Tunneling Microscopy (LSTM) |
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136 | (1) |
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Electrochemical Scanning Tunneling Microscopy (ECSTM) |
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137 | (2) |
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Scanning Thermal Microscopy (SThM) |
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139 | (2) |
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Scanning Noise Microscopy (SNM) |
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141 | (1) |
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Scanning Tunneling Potentiometry (SPotM) |
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142 | (1) |
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Scanning Capacitance Microscopy (SCM) |
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142 | (4) |
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Scanning Spreading Resistance Microscopy (SSRM) |
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146 | (4) |
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Scanning Tunneling Atom Probe (STAP) |
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150 | (3) |
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153 | (20) |
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Tip Artifact: Convolution with Tip Shape |
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153 | (7) |
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Influence of Local Inhomogeneities on Topography |
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160 | (3) |
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160 | (1) |
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161 | (2) |
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Influence of Topography on Local Measurements |
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163 | (4) |
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STM-Induced Photon Emission |
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164 | (1) |
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Lateral Force Measurement |
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165 | (2) |
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167 | (6) |
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Piezoelectric Hysteresis, Scanner Creep, Non-Linearities and Calibration Errors |
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167 | (2) |
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Tip Crashes, Feedback Oscillations, Noise, Thermal drift |
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169 | (1) |
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Interference Patterns with Beam Deflection SFM |
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170 | (3) |
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173 | (8) |
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Parallel Operation of SFM Cantilever Arrays |
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173 | (2) |
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Novel Sensors Based on Cantilevers |
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175 | (3) |
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176 | (1) |
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176 | (1) |
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176 | (1) |
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177 | (1) |
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178 | (1) |
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179 | (1) |
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Local Modification Experiments |
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179 | (2) |
References |
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181 | (26) |
Index |
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207 | |