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Part I Scanning Probe Microscopy Techniques |
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1 Time-Resolved Tapping-Mode Atomic Force Microscopy |
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3 | (36) |
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3 | (2) |
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1.2 Tip-Sample Interactions in TM-AFM |
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5 | (3) |
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1.2.1 Interaction Forces in TM-AFM |
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5 | (1) |
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1.2.2 Cantilever Dynamics and Mechanical Bandwidth in TM-AFM |
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6 | (2) |
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1.3 AFM Probes with Integrated Interferometric High Bandwidth Force Sensors |
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8 | (22) |
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9 | (4) |
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1.3.2 Interferometric Grating Sensor |
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13 | (6) |
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1.3.3 Sensor Mechanical Response & Temporal Resolution |
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19 | (2) |
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21 | (2) |
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23 | (3) |
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1.3.6 Characterization and Calibration |
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26 | (1) |
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1.3.7 Time-Resolved Force Measurements |
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27 | (3) |
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30 | (4) |
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1.4.1 Nanomechanical Material Mapping |
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31 | (1) |
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1.4.2 Imaging of Molecular Structures in Self Assembled Monolayers |
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32 | (1) |
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1.4.3 Imaging Microphase Seperation in Triblock Copolymer |
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33 | (1) |
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34 | (5) |
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35 | (4) |
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2 Small Amplitude Atomic Force Spectroscopy |
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39 | (20) |
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39 | (3) |
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2.2 Small Amplitude Spectroscopy |
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42 | (12) |
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2.2.1 Actuation Techniques |
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43 | (10) |
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2.2.2 Effect Frequency Dependent Damping |
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53 | (1) |
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54 | (5) |
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57 | (2) |
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3 Combining Scanning Probe Microscopy and Transmission Electron Microscopy |
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59 | (42) |
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60 | (2) |
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3.1.1 Why Combine SPM and TEM? |
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60 | (2) |
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3.2 Some Aspects of TEM Instrumentation |
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62 | (1) |
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3.3 Incorporating an STM Inside a TEM Instrument |
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63 | (12) |
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3.3.1 Applications of TEMSTM |
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66 | (9) |
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3.4 Incorporating an AFM Inside a TEM Instrument |
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75 | (9) |
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3.4.1 Optical Force Detection Systems |
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76 | (1) |
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3.4.2 Non-optical Force Detection Systems |
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77 | (3) |
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3.4.3 TEMAFM Applications |
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80 | (4) |
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3.5 Combined TEM and SPM Sample Preparation |
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84 | (8) |
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3.5.1 Nanowires and Nanoparticles |
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85 | (2) |
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3.5.2 A Proper Electrical Contact for TEMSPM |
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87 | (3) |
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90 | (1) |
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3.5.4 Electron Beam Irradiation Effects |
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90 | (2) |
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92 | (9) |
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93 | (8) |
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4 Scanning Probe Microscopy and Grazing-Incidence Small-Angle Scattering as Complementary Tools for the Investigation of Polymer Films and Surfaces |
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101 | (34) |
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101 | (2) |
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4.2 Statistical Analysis of SPM Data |
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103 | (6) |
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4.3 Introduction to Grazing-Incidence Small-Angle Scattering |
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109 | (4) |
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4.4 Comparison of Real and Reciprocal Space Data |
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113 | (4) |
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4.5 Complementary and In Situ Experiments |
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117 | (10) |
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4.6 Combined In Situ GISAXS and SPM Measurements |
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127 | (1) |
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128 | (7) |
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129 | (6) |
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5 Near-Field Microwave Microscopy for Nanoscience and Nanotechnology |
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135 | (38) |
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5.1 Principles of Microwave Microscope |
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135 | (4) |
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135 | (1) |
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5.1.2 Near-field Interaction |
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136 | (2) |
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5.1.3 Microwave Frequencies |
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138 | (1) |
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5.2 Detailed Description of the Near-field Microwave Microscope |
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139 | (5) |
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139 | (1) |
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5.2.2 Dipole-Dipole Interaction |
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140 | (1) |
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5.2.3 Tip-sample Distance Control in NFMM |
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141 | (2) |
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5.2.4 The Basic Experimental Setup of NFMM |
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143 | (1) |
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5.3 Theory of Near-field Microwave Microscope |
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144 | (8) |
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5.3.1 Transmission Line Theory |
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144 | (2) |
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5.3.2 Perturbation Theory |
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146 | (1) |
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5.3.3 Finite-Element Model |
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147 | (5) |
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5.4 Electromagnetic Field Distribution |
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152 | (4) |
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5.4.1 Probe-tip-fluid Interaction |
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152 | (1) |
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5.4.2 Probe-tip-photosensitive Heterojunction Interaction |
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153 | (1) |
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5.4.3 Probe-Tip-Ferromagnetic Thin Film, Magnetic Domain Interaction |
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154 | (2) |
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5.5 Experimental Results and Images Obtained by Near-Field Microwave Microscope |
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156 | (17) |
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5.5.1 NFMM Characterization of Dielectrics and Metals |
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156 | (1) |
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5.5.2 NFMM Characterization of Semiconductor Thin Films |
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157 | (1) |
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5.5.3 NFMM Characterization of DNA Array, SAMs, and Mixture Fluids |
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158 | (2) |
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5.5.4 Biosensing of Fluids by a NFMM |
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160 | (2) |
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5.5.5 NFMM Characterization of Solar Cells |
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162 | (3) |
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5.5.6 NFMM Characterization of Organic FET |
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165 | (2) |
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5.5.7 NFMM Characterization of Magnetic Domains |
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167 | (2) |
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169 | (4) |
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6 Single Cluster AFM Manipulation: a Specialized Tool to Explore and Control Nanotribology Effects |
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173 | (24) |
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173 | (2) |
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6.2 Manipulation and Friction Effects Explored by Dynamic AFM |
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175 | (11) |
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6.2.1 Experimental Evidences |
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175 | (4) |
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6.2.2 Controlled Movements |
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179 | (2) |
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6.2.3 Depinning and Energy Dissipation |
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181 | (5) |
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6.3 The Problem of Contact Area in Nanotribology Explored by AFM Cluster Manipulation |
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186 | (5) |
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191 | (6) |
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192 | (5) |
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7 Cell Adhesion Receptors Studied by AFM-Based Single-Molecule Force Spectroscopy |
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197 | (20) |
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198 | (4) |
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7.2 AFM-Based Single-Molecule Force Spectroscopy |
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202 | (1) |
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7.3 Receptor-Ligand Interactions |
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203 | (1) |
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7.4 Cell Adhesion Interactions on Living Cells |
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204 | (8) |
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7.5 Limitations of the AFM Method |
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212 | (5) |
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213 | (4) |
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8 Biological Application of Fast-Scanning Atomic Force Microscopy |
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217 | (30) |
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217 | (2) |
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8.2 Principles of Biological Fast-Scanning AFM |
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219 | (2) |
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8.2.1 Hansma's Fast-Scanning AFM |
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219 | (1) |
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8.2.2 Miles' Fast-Scanning AFM |
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219 | (1) |
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8.2.3 Ando's Fast-Scanning AFM |
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220 | (1) |
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8.3 Effects of a Scanning Probe and Mica Surface on Biological Specimens |
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221 | (4) |
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8.3.1 Experimental Conditions Required for Fast-Scanning AFM Imaging |
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221 | (1) |
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8.3.2 Effects of High-Speed Scanning on the Behavior of DNA in Solution |
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222 | (1) |
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8.3.3 Effects of High-Speed Scanning on Protein Movement |
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222 | (3) |
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8.4 Application to Biological Macromolecule Interactions |
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225 | (8) |
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8.4.1 Application to Protein-Protein Interaction |
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225 | (4) |
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8.4.2 Application to DNA-Protein Interaction |
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229 | (4) |
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8.5 Mechanisms of Signal Transduction at the Single-Molecule Level |
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233 | (5) |
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8.5.1 Conformational Changes of Ligand-Gated Ion Channels |
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235 | (1) |
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8.5.2 Conformational Changes of G-protein Coupled Receptors |
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235 | (1) |
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8.5.3 Direct Visualization of Albers-Post Scheme of P-Type ATPases |
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236 | (2) |
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238 | (9) |
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238 | (9) |
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9 Transport Properties of Graphene with Nanoscale Lateral Resolution |
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247 | (40) |
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248 | (4) |
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9.2 Transport Properties of Graphene |
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252 | (17) |
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9.2.1 Electronic Bandstructure and Dispersion Relation |
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252 | (4) |
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256 | (1) |
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256 | (2) |
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9.2.4 Quantum Capacitance |
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258 | (1) |
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9.2.5 Transport Properties: Mobility, Electron Mean Free Path |
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259 | (10) |
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9.3 Local Transport Properties of Graphene by Scanning Probe Methods |
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269 | (12) |
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9.3.1 Lateral Inhomogeneity in the Carrier Density and in the Density of States |
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269 | (4) |
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9.3.2 Nanoscale Measurements of Graphene Quantum Capacitance |
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273 | (2) |
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9.3.3 Local Electron Mean Free Path and Mobility in Graphene |
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275 | (3) |
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9.3.4 Local Electronic Properties of Epitaxial Graphene/4H-SiC (0001) Interface |
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278 | (3) |
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281 | (6) |
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282 | (5) |
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10 Magnetic Force Microscopy Studies of Magnetic Features and Nanostructures |
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287 | (34) |
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10.1 Magnetic Force Microscopy |
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287 | (4) |
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287 | (1) |
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10.1.2 MFM Basic Principles |
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288 | (1) |
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10.1.3 MFM Image Contrast |
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289 | (1) |
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10.1.4 Magnetic Imaging Resolution |
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290 | (1) |
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10.2 High-Resolution MFM Tips |
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291 | (5) |
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296 | (5) |
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10.4 Patterned Nanomagnetic Films |
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301 | (8) |
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10.4.1 FIB Milled Patterns |
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301 | (2) |
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10.4.2 Arrays of Magnetic Dots by Direct Laser Patterning |
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303 | (6) |
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10.5 Template-Mediated Assembly of FePt Nanoclusters |
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309 | (1) |
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10.6 Interlayer Exchange-Coupled Nanocomposite Thin Films |
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310 | (4) |
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10.6.1 (Co/Pt)/NiO/(CoPt) Multilayers with Perpendicular Anisotropy |
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311 | (2) |
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10.6.2 Co/Ru/Co Trilayers with In-Plane Anisotropy |
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313 | (1) |
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10.7 Conclusion (Outlook) |
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314 | (7) |
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315 | (6) |
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11 Semiconductors Studied by Cross-sectional Scanning Tunneling Microscopy |
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321 | (34) |
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321 | (1) |
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11.2 Cleaving Methods and Geometries |
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322 | (5) |
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11.3 Properties of Cleaved Surfaces |
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327 | (3) |
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11.3.1 The (111) Surface of Silicon and Germanium |
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327 | (2) |
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11.3.2 The (110) Surface of Silicon |
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329 | (1) |
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11.3.3 The (110) Surface of III-V Semiconductors |
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329 | (1) |
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11.3.4 The (110) Surface of II-VI Semiconductors |
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330 | (1) |
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11.4 Semiconductor Bulk Properties |
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330 | (2) |
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11.4.1 Ordering in Semiconductor Alloys |
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330 | (2) |
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11.4.2 Phase Separation Effects |
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332 | (1) |
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11.5 Low-Dimensional Semiconductor Nanostructures |
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332 | (12) |
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333 | (4) |
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337 | (7) |
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11.6 Impurities in Semiconductors |
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344 | (11) |
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11.6.1 Impurity Atoms in Silicon |
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345 | (1) |
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11.6.2 Impurity Atoms in III-V and II-VI Semiconductors |
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346 | (3) |
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349 | (6) |
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12 A Novel Approach for Oxide Scale Growth Characterization: Combining Etching with Atomic Force Microscopy |
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355 | (30) |
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356 | (1) |
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12.2 Oxidation of Silicon Carbide |
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357 | (1) |
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12.3 Silica: Growth and Crystallization |
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358 | (4) |
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362 | (1) |
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12.5 Scale and Interface Morphology |
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363 | (8) |
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12.6 Kinetics: Details and Overall Model |
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371 | (6) |
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12.7 Conclusion and Outlook |
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377 | (8) |
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378 | (7) |
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13 The Scanning Probe-Based Deep Oxidation Lithography and Its Application in Studying the Spreading of Liquid n-Alkane |
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385 | (30) |
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385 | (1) |
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13.2 Part 1 The Chemical Patterning Method for Alkane Spreading Study |
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386 | (11) |
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13.2.1 Octadecyltrichlorosilane as the Substrate for Pattern Fabrication |
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386 | (2) |
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13.2.2 Fabricating Hydrophilic Chemical Patterns on OTS: The Scanning Probe Deep Oxidation Lithography |
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388 | (2) |
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13.2.3 The Structure and Chemistry of the OTSpd Pattern |
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390 | (1) |
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13.2.4 The Depth of the OTSpd Pattern |
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391 | (2) |
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13.2.5 OTSpd Is Terminated with Carboxylic Acid Group |
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393 | (2) |
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13.2.6 The Two-Step Patterning Method for Liquid Spreading Studies |
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395 | (1) |
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13.2.7 The Validity of the Two-Step Patterning Approach |
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395 | (1) |
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13.2.8 The Time Scale of the Heating-Freezing Cycle and the Time Scale of the Spreading |
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396 | (1) |
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13.3 Part 2 Structures of Long-Chain Alkanes on Surface |
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397 | (6) |
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13.3.1 Alkane Structures on Hydrophilic Surfaces and on Hydrophobic Surfaces |
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398 | (3) |
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13.3.2 The Multiple Domains Within a Seaweed-Shaped Layer |
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401 | (2) |
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13.4 Part 3 The Role of Vapor During the Spreading of Liquid Alkane |
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403 | (7) |
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13.4.1 The Stability of the Parallel Layer During the Spreading |
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407 | (3) |
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410 | (5) |
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411 | (4) |
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14 Self-assembled Transition Metal Nanoparticles on Oxide Nanotemplates |
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415 | (24) |
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415 | (2) |
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14.2 The Structure of the UT Oxide Layers |
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417 | (6) |
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418 | (2) |
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420 | (2) |
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422 | (1) |
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14.3 The Oxide Layers as Nanotemplates for Metal NPs |
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423 | (12) |
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14.3.1 Au and Fe on z'-TiOx-Pt(111) |
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424 | (3) |
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14.3.2 Metals on Al2O3/Ni3Al(111) |
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427 | (4) |
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431 | (4) |
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435 | (4) |
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435 | (4) |
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15 Mechanical and Electrical Properties of Alkanethiol Self-Assembled Monolayers: A Conducting-Probe Atomic Force Microscopy Study |
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439 | (34) |
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439 | (2) |
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15.2 Order, Orientation, and Surface Coverage |
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441 | (3) |
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15.3 Conducting-Probe Atomic Force Microscopy |
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444 | (5) |
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15.4 Theoretical Framework |
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449 | (5) |
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15.4.1 Elastic Adhesive Contact |
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449 | (1) |
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15.4.2 Effective Elastic Modulus of a Film-Substrate System |
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450 | (2) |
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15.4.3 Electron Tunneling Through Thin Insulating Films |
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452 | (2) |
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15.5 Mechanical Properties |
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454 | (4) |
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15.6 Electrical Properties |
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458 | (5) |
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15.7 Conclusions and Future Directions |
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463 | (10) |
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465 | (8) |
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16 Assessment of Nanoadhesion and Nanofriction Properties of Formulated Cellulose-Based Biopolymers by AFM |
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473 | (32) |
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473 | (1) |
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16.2 Application of Cellulose-Based Biopolymers in Pharmaceutical Formulations |
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474 | (1) |
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16.3 General Composition of Pharmaceutical Film Coatings |
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475 | (2) |
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475 | (1) |
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16.3.2 Surfactants and Lubricants |
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476 | (1) |
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16.4 Structure and Bulk Properties of HPMC Biopolymers |
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477 | (4) |
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16.4.1 Chemical Structure of HPMC |
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477 | (1) |
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16.4.2 Physicochemical Properties |
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478 | (3) |
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16.5 Physicochemical Properties of HPMC-Formulated Films |
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481 | (5) |
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481 | (1) |
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16.5.2 Pure HPMC Film Formation |
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482 | (1) |
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16.5.3 Formulation of HPMC-Stearic Acid Films and HPMC-PEG Films |
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482 | (1) |
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16.5.4 Thermomechanical Properties of HPMC-PEG Films |
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483 | (1) |
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16.5.5 Thermo-Mechanical Properties of HPMC-SA Films |
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483 | (3) |
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16.6 Surface Properties of HPMC-Formulated Films Adhesion |
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486 | (16) |
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16.6.1 Surface Topography and Morphologies by AFM |
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486 | (4) |
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16.6.2 AFM Force-Distance Experiments |
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490 | (6) |
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16.6.3 LFM Nanofriction Experiments |
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496 | (6) |
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502 | (3) |
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503 | (2) |
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17 Surface Growth Processes Induced by AFM Debris Production. A New Observable for Nanowear |
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505 | (28) |
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505 | (2) |
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17.2 Single Asperity Nanowear Experiments |
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507 | (6) |
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17.2.1 Surface Growth Processes Induced by AFM Tip: Experimental Results |
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511 | (2) |
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17.3 A Model for Wear Debris Production in a UHV AFM Scratching Test |
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513 | (10) |
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17.3.1 Localisation of the Free Energy Changes Due to Stressing AFM Tip |
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514 | (2) |
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17.3.2 Flux of Adatoms Induced by the AFM Stressing Tip |
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516 | (3) |
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17.3.3 Evaluation of Number Cluster Density via Nucleation Theory |
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519 | (4) |
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17.4 Continuum Approach for the Surface Growth Induced by Abrasive Adatoms |
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523 | (6) |
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17.5 Conclusions and Future Perspectives |
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529 | (4) |
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530 | (3) |
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18 Frictional Stick-Slip Dynamics in a Deformable Potential |
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533 | (18) |
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533 | (2) |
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18.2 The Model and Equation of motion |
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535 | (5) |
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18.2.1 Potential and geometry |
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535 | (2) |
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18.2.2 Frictional Force and Static Friction as a Function of the Shape Parameter |
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537 | (1) |
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18.2.3 Equation of Motion |
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538 | (2) |
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540 | (5) |
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18.3.1 Phase Space and Stroboscope Observation |
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540 | (1) |
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18.3.2 Stick-Slip Phenomena |
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541 | (3) |
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18.3.3 Influence of the Shape Parameter on the Transition from Stick-Slip Motion to Modulated Sliding State |
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544 | (1) |
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545 | (3) |
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548 | (3) |
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548 | (3) |
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19 Capillary Adhesion and Nanoscale Properties of Water |
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551 | (22) |
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551 | (2) |
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19.2 Metastable Liquid Capillary Bridges |
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553 | (8) |
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19.2.1 Negative Pressure in Water |
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553 | (2) |
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19.2.2 Negative Pressure in Capillary Bridges in AFM Experiments |
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555 | (2) |
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19.2.3 Disjoining Pressure |
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557 | (1) |
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19.2.4 Calculating Pressure in Capillary Bridges |
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558 | (3) |
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19.3 Capillarity-Induced Low-Temperature Boiling |
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561 | (2) |
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19.4 Room Temperature Ice in Capillary Bridges |
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563 | (5) |
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19.4.1 Humidity Dependence of the Adhesion Force |
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563 | (2) |
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19.4.2 Ice in the Capillary Bridges |
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565 | (1) |
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19.4.3 Water Phase Behavior Near a Surface and in Confinement |
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566 | (2) |
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568 | (5) |
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568 | (5) |
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20 On the Sensitivity of the Capillary Adhesion Force to the Surface Roughness |
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573 | (16) |
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573 | (2) |
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20.2 Capillary Force Between Rough Surfaces |
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575 | (6) |
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20.2.1 Shape of the Meniscus |
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576 | (2) |
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578 | (3) |
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20.3 Case-Study: Two-Tiered Roughness |
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581 | (1) |
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582 | (3) |
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585 | (4) |
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586 | (3) |
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Part III Industrial Applications |
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21 Nanoimaging, Molecular Interaction, and Nanotemplating of Human Rhinovirus |
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589 | (56) |
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589 | (1) |
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21.2 Contact Mode AFM Imaging |
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590 | (3) |
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21.3 Dynamic Force Microscopy Imaging |
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593 | (3) |
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21.3.1 Magnetic AC Mode (MAC mode) AFM Imaging |
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594 | (2) |
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21.4 Introduction to Molecular Recognition Force Spectroscopy |
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596 | (9) |
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597 | (3) |
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21.4.2 Applications of Molecular Recognition Force Spectroscopy |
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600 | (3) |
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21.4.3 Topography and Recognition Imaging |
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603 | (2) |
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605 | (7) |
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21.5.1 Applications of Nanolithography |
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605 | (6) |
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21.5.2 Native Protein Nanolithography |
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611 | (1) |
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21.6 Imaging and Force Measurements of Virus-Receptor Interactions |
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612 | (33) |
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21.6.1 Virus Particle Immobilization and Characterization |
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613 | (6) |
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21.6.2 Virus-Receptor Interaction Analyzed by Molecular Recognition Force Spectroscopy |
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619 | (5) |
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21.6.3 Virus Immobilization on Receptor Arrays |
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624 | (9) |
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633 | (12) |
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22 Biomimetic Tailoring of the Surface Properties of Polymers at the Nanoscale: Medical Applications |
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645 | (46) |
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645 | (8) |
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22.1.1 Biomimetic Material Design Criteria for Biomedical Applications |
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645 | (3) |
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22.1.2 Techniques for the Characterization of Surfaces at the Nanoscale |
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648 | (5) |
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22.2 Realization of Biomimetic Surfaces by Coating Strategies |
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653 | (11) |
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653 | (2) |
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655 | (9) |
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22.3 Realization of Biomimetic Surfaces by Chemical Modification |
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664 | (8) |
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22.3.1 Introduction of Functional Groups on Polymer Surfaces by Irradiation and Chemical Techniques |
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666 | (2) |
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22.3.2 Immobilization of Bioactive and Biomimetic Compounds |
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668 | (1) |
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22.3.3 Not-Conventional Approaches Towards Nanoscale Tailoring of Biomimetic Surfaces |
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669 | (3) |
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22.4 Scanning Probe Techniques for Optical and Spectroscopic Characterization of Surfaces at High Resolution |
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672 | (12) |
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22.4.1 Dynamic-Mode AFM for the Characterization of Organosilane Self-Assembled Monolayers |
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672 | (4) |
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22.4.2 SNOM for Fluorescence Imaging |
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676 | (4) |
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22.4.3 TERS for Chemical Mapping at the Nanoscale |
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680 | (4) |
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684 | (7) |
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684 | (7) |
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23 Conductive Atomic-Force Microscopy Investigation of Nanostructures in Microelectronics |
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691 | (32) |
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691 | (2) |
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23.2 Technical Implementation of C-AFM |
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693 | (4) |
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23.3 C-AFM to Study Gate Dielectrics |
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697 | (6) |
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23.3.1 Local Current-Voltage Characteristics, Dielectric Breakdown, and Two-Dimensional Current Maps |
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698 | (3) |
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23.3.2 Investigation of High-k Dielectrics |
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701 | (2) |
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23.4 Conductivity Measurements of Phase-Separated Semiconductor Nanostructures |
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703 | (6) |
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23.4.1 Exploration of Supported Nanowires and Nanodots |
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704 | (3) |
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23.4.2 Investigation of Defects in Ternary Semiconductor Alloys |
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707 | (2) |
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23.5 C-AFM Investigations of Nanorods |
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709 | (5) |
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23.6 Application of C-AFM to Electroceramics |
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714 | (2) |
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23.7 Outlook to Photoconductive AFM |
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716 | (1) |
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23.8 Overall Summary and Perspectives |
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717 | (6) |
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718 | (5) |
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24 Microscopic Electrical Characterization of Inorganic Semiconductor-Based Solar Cell Materials and Devices Using AFM-Based Techniques |
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723 | (68) |
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723 | (2) |
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24.2 AFM-Based Nanoelectrical Characterization Techniques |
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725 | (7) |
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24.2.1 Scanning Probe Force Microscopy |
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725 | (3) |
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24.2.2 Scanning Capacitance Microscopy |
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728 | (3) |
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731 | (1) |
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24.3 Characterization of Junctions of Solar Cells |
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732 | (26) |
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24.3.1 Junction Location Determination |
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732 | (13) |
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24.3.2 Electrical Potential and Field on Junctions |
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745 | (13) |
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24.4 Characterization of Grain Boundaries of Polycrystalline Materials |
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758 | (13) |
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24.4.1 Carrier Depletion and Grain Misorientation on Individual Grain Boundaries of Polycrystalline Si Thin Films |
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759 | (6) |
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24.4.2 Electrical Potential Barrier on Grain Boundaries of Chalcopyrite Thin Films |
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765 | (6) |
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24.5 Localized Structural and Electrical Properties of nc-Si:H and a-Si:H Thin Films and Devices |
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771 | (13) |
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24.5.1 Localized Electrical Properties of a-Si:H and nc-Si:H Mixed-Phase Devices |
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|
772 | (7) |
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24.5.2 Doping Effects on nc-Si:H Phase Formation |
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779 | (5) |
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784 | (7) |
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786 | (5) |
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25 Micro and Nanodevices for Thermoelectric Converters |
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791 | (22) |
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791 | (6) |
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792 | (1) |
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793 | (2) |
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25.1.3 Nanodevices and Superlattices |
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|
795 | (2) |
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25.2 Thermoelectric Converters Models |
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797 | (5) |
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25.2.1 Peltier Effect on Hot and Cold Sides |
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800 | (1) |
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801 | (1) |
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25.3 Thin-Films Technology for Thermoelectric Materials |
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802 | (7) |
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25.3.1 Bismuth and Antimony Tellurides Depositions |
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|
804 | (4) |
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25.3.2 Optimization of Thermoelectric Properties |
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|
808 | (1) |
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25.4 Superlattices for Fabrication of Thermoelectric Converters |
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|
809 | (4) |
|
25.4.1 Why Superlattices? |
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|
809 | (1) |
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25.4.2 Materials and Properties |
|
|
810 | (1) |
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|
810 | (1) |
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|
811 | (2) |
Index |
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813 | |