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Stray Light Analysis and Control [Minkštas viršelis]

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  • Formatas: Paperback / softback, 228 pages, weight: 415 g
  • Serija: Press Monographs
  • Išleidimo metai: 30-Apr-2013
  • Leidėjas: SPIE Press
  • ISBN-10: 0819493252
  • ISBN-13: 9780819493255
Kitos knygos pagal šią temą:
Stray Light Analysis and ControlDidesnis paveikslėlis
  • Formatas: Paperback / softback, 228 pages, weight: 415 g
  • Serija: Press Monographs
  • Išleidimo metai: 30-Apr-2013
  • Leidėjas: SPIE Press
  • ISBN-10: 0819493252
  • ISBN-13: 9780819493255
Kitos knygos pagal šią temą:
Pastovi nuoroda: https://www.kriso.lt/db/9780819493255.html
Raktažodžiai:
Stray light is defined as unwanted light in an optical system, a familiar concept for anyone who has taken a photograph with the sun in or near their camera's field of view. In a low-cost consumer camera, stray light may be only a minor annoyance, but in a space-based telescope, it can result in the loss of data worth millions of dollars. It is imperative that optical system designers understand its consequences on system performance and adapt the design process to control it.

This book addresses stray light terminology, radiometry, and the physics of stray light mechanisms, such as surface roughness scatter and ghost reflections. The most-efficient ways of using stray light analysis software packages are included. The book also demonstrates how the basic principles are applied in the design, fabrication, and testing phases of optical system development.
Preface xi
Acknowledgments xv
Chapter 1 Introduction and Terminology
1(12)
1.1 Book Prerequities
4(1)
1.2 Book Organization
4(2)
1.3 Stray Light Terminology
6(4)
1.3.1 Stray light paths
6(1)
1.3.2 Specular and scatter stray light mechanisms
7(1)
1.3.3 Critical and illuminated surfaces
8(1)
1.3.4 In-field and out-of-field stray light
8(1)
1.3.5 Internal and external stray light
9(1)
1.3.6 "Move it or Block it or Paint/coat it or Clean it"
9(1)
1.4 Summary
10(3)
Chapter 2 Basic Radiometry for Stray Light Analysis
13(28)
2.1 Radiometric Terms
13(16)
2.1.1 Flux, or power, and radiometric versus photometric units
14(2)
2.1.2 Reflectance, transmittance, and absorption
16(1)
2.1.3 Solid angle and projected solid angle
16(2)
2.1.4 Radiance
18(1)
2.1.5 Blackbody radiance
18(4)
2.1.6 Throughput
22(1)
2.1.7 Intensity
23(1)
2.1.8 Exitance
23(1)
2.1.9 Irradiance
24(1)
2.1.10 Bidirectional scattering distribution function
25(4)
2.2 Radiative Transfer
29(7)
2.2.1 Point source transmittance
31(1)
2.2.2 Detector field of view
32(1)
2.2.3 Veiling glare index
32(1)
2.2.4 Exclusion angle
32(1)
2.2.5 Estimation of stray light using basic radiative transfer
33(3)
2.2.6 Uncertainty of stray light estimates
36(1)
2.3 Detector Responsivity
36(2)
2.3.1 Noise equivalent irradiance
36(1)
2.3.2 Noise equivalent delta temperature
37(1)
2.4 Summary
38(3)
Chapter 3 Basic Ray Tracing for Stray Light Analysis
41(20)
3.1 Building the Stray Light Model
41(2)
3.1.1 Defining optical and mechanical geometry
41(2)
3.1.2 Defining optical properties
43(1)
3.2 Ray Tracing
43(15)
3.2.1 Using ray statistics to quantify speed of convergence
43(2)
3.2.2 Aiming scattered rays to increase the speed of convergence
45(3)
3.2.3 Backward ray tracing
48(1)
3.2.4 Finding stray light paths using detector FOV
49(1)
3.2.5 Determining critical and illuminated surfaces
50(1)
3.2.6 Performing internal stray light calculations
51(4)
3.2.7 Controlling ray ancestry to increase speed of convergence
55(1)
3.2.8 Using Monte Carlo ray splitting to increase speed of convergence
55(1)
3.2.9 Calculating the effect of stray light on modulation transfer function
56(2)
3.3 Summary
58(3)
Chapter 4 Scattering from Optical Surface Roughness and Coatings
61(16)
4.1 Scattering from Uncoated Optical Surface Roughness
62(11)
4.1.1 BSDF from RMS surface roughness
68(2)
4.1.2 BSDF from PSD
70(1)
4.1.3 BSDF from empirical fits to measured data
71(1)
4.1.4 Artifacts from roughness scatter
72(1)
4.2 Scattering from Coated Optical Surface Roughness
73(2)
4.3 Scattering from Scratches and Digs
75(1)
4.4 Summary
75(2)
Chapter 5 Scattering from Particulate Contaminants
77(24)
5.1 Scattering from Spherical Particles (Mie Scatter Theory)
78(2)
5.2 Particle Density Function Models
80(11)
5.2.1 The IEST CC1246D cleanliness standard
81(6)
5.2.2 Measured (tabulated) distribution
87(1)
5.2.3 Determining the particle density function using typical cleanliness levels, fallout rates, or direct measurement
87(2)
5.2.3.1 Use of typical cleanliness levels
89(1)
5.2.3.2 Use of fallout rates (uncleaned surfaces only)
89(1)
5.2.3.3 Use of a measured (tabulated) density function
90(1)
5.3 BSDF Models
91(4)
5.3.1 BSDF from PAC
91(1)
5.3.2 BSDF from Mie scatter calculations
92(1)
5.3.3 BSDF from empirical fits to measured data
92(1)
5.3.4 Determining the uncertainty in BSDF from the uncertainty in particle density function
92(1)
5.3.5 Artifacts from contamination scatter
93(2)
5.4 Comparison of Scatter from Contaminants and Scatter from Surface Roughness
95(1)
5.5 Scattering from Inclusions in Bulk Media
95(3)
5.6 Molecular Contamination
98(1)
5.7 Summary
98(3)
Chapter 6 Scattering from Black Surface Treatments
101(22)
6.1 Physics of Scattering from Black Surface Treatments
102(10)
6.1.1 BRDF from empirical fits to measured data
104(5)
6.1.2 Using published BRDF data
109(2)
6.1.3 Artifacts from black surface treatment scatter
111(1)
6.2 Selection Criteria for Black Surface Treatments
112(2)
6.2.1 Absorption in the sensor waveband
113(1)
6.2.2 Specularity at high AOIs
113(1)
6.2.3 Particulate contamination
114(1)
6.2.4 Molecular contamination
114(1)
6.2.5 Conductivity
114(1)
6.3 Types of Black Surface Treatments
114(6)
6.3.1 Appliques
115(1)
6.3.2 Treatments that reduce surface thickness
115(1)
6.3.3 Treatments that increase surface thickness
116(1)
6.3.3.1 Painting
116(1)
6.3.3.2 Fused powders
116(3)
6.3.3.3 Black oxide coatings
119(1)
6.3.3.4 Anodize
119(1)
6.4 Survey of Widely Used Black Surface Treatments
120(1)
6.5 Summary
120(3)
Chapter 7 Ghost Reflections, Aperture Diffraction, and Diffraction from Diffractive Optical Elements
123(22)
7.1 Ghost Reflections
123(9)
7.1.1 Reflectance of uncoated and coated surfaces
124(1)
7.1.1.1 Uncoated surfaces
124(1)
7.1.1.2 Coated surfaces
125(1)
7.1.2 Reflectance from typical values
126(2)
7.1.3 Reflectance from the stack definition or predicted performance data
128(1)
7.1.4 Reflectance from measured data
128(1)
7.1.5 Artifacts from ghost reflections
128(3)
7.1.6 "Reflective" ghosts
131(1)
7.2 Aperture Diffraction
132(5)
7.2.1 Aperture diffraction theory
132(1)
7.2.2 Calculation of aperture diffraction in stray light analysis programs
133(1)
7.2.3 Artifacts from aperture diffraction
134(1)
7.2.4 Expressions for wide-angle diffraction calculations
135(2)
7.3 Diffraction from Diffractive Optical Elements
137(5)
7.3.1 DOE diffraction theory
138(2)
7.3.2 Artifacts from DOE diffraction
140(1)
7.3.3 Scattering from DOE transition regions
140(2)
7.4 Summary
142(3)
Chapter 8 Optical Design for Stray Light Control
145(18)
8.1 Use a Field Stop
145(2)
8.2 Use an Unobscured Optical Design
147(1)
8.3 Minimize the Number of Optical Elements between the Aperture Stop and the Focal Plane
148(2)
8.4 Use a Lyot Stop
150(3)
8.4.1 Calculating Lyot stop diameter from analytic expressions
151(1)
8.4.2 Calculating Lyot stop diameter from coherent beam analysis
152(1)
8.5 Use a Pupil Mask to Block Diffraction and Scattering from Struts and Other Obscurations
153(1)
8.6 Minimize Illumination of the Aperture Stop
154(1)
8.7 Minimize the Number of Optical Elements, Especially Refractive Elements
154(1)
8.8 Avoid Optical Elements at Intermediate Images
155(1)
8.9 Avoid Ghosts Focused at the Focal Plane
155(1)
8.10 Minimize Vignetting, Including the Projected Solid Angle of Struts
156(1)
8.11 Use Temporal, Spectral, or Polarization Filters
157(1)
8.12 Use Nonuniformity Compensation and Reflective Warm Shields in IR Systems
157(3)
8.13 Summary
160(3)
Chapter 9 Baffle and Cold Shield Design
163(20)
9.1 Design of the Main Baffles and Cold Shields
164(3)
9.2 Design of Vanes for Main Baffles and Cold Shields
167(7)
9.2.1 Optimal aperture diameter, depth, and spacing for baffle vanes
168(4)
9.2.2 Edge radius, bevel angle, and angle for baffle vanes
172(1)
9.2.3 Groove-shaped baffle vanes
172(2)
9.3 Design of Baffles for Cassegrain-Type Systems
174(4)
9.4 Design of Reflective Baffle Vanes
178(3)
9.5 Design of Masks
181(1)
9.6 Summary
181(2)
Chapter 10 Measurement of BSDF, TIS, and System Stray Light
183(12)
10.1 Measurement of BSDF (Scatterometers)
183(3)
10.2 Measurement of TIS
186(2)
10.3 Measurement of System Stray Light
188(5)
10.3.1 Sensor radiometric calibration
188(1)
10.3.2 Collimated source test
189(1)
10.3.3 Extended source test
190(1)
10.3.4 Solar tests
191(1)
10.3.4.1 Using direct sunlight
191(1)
10.3.4.2 Using a heliostat
192(1)
10.4 Internal Stray Light Testing
193(1)
10.5 Summary
193(2)
Chapter 11 Stray Light Engineering Process
195(10)
11.1 Define Stray Light Requirements
195(3)
11.1.1 Maximum allowed image plane irradiance and exclusion angle
196(2)
11.1.2 Inheritance of stray light requirements from comparable systems
198(1)
11.2 Design Optics, Pick Surface Roughness, Contamination Levels, and Coatings
198(1)
11.3 Build Stray Light Model, Add Baffles and Black Surface Treatments
198(1)
11.4 Compute Stray Light Performance
199(1)
11.5 Build and Test
200(2)
11.6 Process Completion
202(1)
11.7 Summary
202(1)
11.8 Guidelines and Rules of Thumb
202(3)
Index 205