Preface to the Fourth Edition |
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xiii | |
Symbols and Abbreviations |
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xv | |
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1 | (12) |
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1 | (4) |
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5 | (5) |
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10 | (3) |
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13 | (60) |
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Maxwell's Equations and Plane Electromagnetic Waves |
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13 | (8) |
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18 | (3) |
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21 | (21) |
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23 | (4) |
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27 | (1) |
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28 | (2) |
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30 | (1) |
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The Optical Admittance for Oblique Incidence |
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31 | (2) |
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Normal Incidence in Absorbing Media |
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33 | (5) |
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Oblique Incidence in Absorbing Media |
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38 | (4) |
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The Reflectance of a Thin Film |
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42 | (3) |
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The Reflectance of an Assembly of Thin Films |
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45 | (3) |
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Reflectance, Transmittance, and Absorptance |
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48 | (3) |
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51 | (1) |
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Summary of Important Results |
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52 | (5) |
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57 | (3) |
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A Theorem on the Transmittance of a Thin-Film Assembly |
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60 | (1) |
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61 | (5) |
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Incoherent Reflection at Two or More Surfaces |
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66 | (5) |
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71 | (2) |
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73 | (32) |
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Quarter- and Half-Wave Optical Thicknesses |
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73 | (1) |
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74 | (6) |
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Electric Field and Losses in the Admittance Diagram |
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80 | (7) |
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87 | (2) |
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89 | (1) |
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Alternative Method of Calculation |
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89 | (3) |
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Smith's Method of Multilayer Design |
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92 | (3) |
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95 | (2) |
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Reflection Circle Diagrams |
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97 | (6) |
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103 | (2) |
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105 | (80) |
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Antireflection Coatings on High-Index Substrates |
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106 | (23) |
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The Single-Layer Antireflection Coating |
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106 | (6) |
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Double-Layer Antireflection Coatings |
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112 | (9) |
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121 | (8) |
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Antireflection Coatings on Low-Index Substrates |
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129 | (27) |
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The Single-Layer Antireflection Coating |
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130 | (1) |
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Two-Layer Antireflection Coatings |
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130 | (10) |
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Multilayer Antireflection Coatings |
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140 | (16) |
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156 | (12) |
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Antireflection Coatings for Two Zeros |
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168 | (4) |
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Antireflection Coatings for the Visible and the Infrared |
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172 | (7) |
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179 | (3) |
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182 | (1) |
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183 | (2) |
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Neutral Mirrors and Beam Splitters |
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185 | (24) |
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High-Reflectance Mirror Coatings |
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185 | (13) |
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185 | (2) |
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Protection of Metal Films |
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187 | (6) |
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Overall System Performance, Enhanced Reflectance |
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193 | (3) |
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Reflecting Coatings for the Ultraviolet |
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196 | (2) |
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198 | (7) |
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Beam Splitters Using Metallic Layers |
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198 | (3) |
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Beam Splitters Using Dielectric Layers |
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201 | (4) |
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205 | (2) |
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207 | (2) |
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Multilayer High-Reflectance Coatings |
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209 | (32) |
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The Fabry-Perot Interferometer |
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209 | (6) |
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Multilayer Dielectric Coatings |
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215 | (19) |
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All-Dielectric Multilayers with Extended High-Reflectance Zones |
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225 | (5) |
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Coating Uniformity Requirements |
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230 | (4) |
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234 | (4) |
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238 | (3) |
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241 | (58) |
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Thin-Film Absorption Filters |
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241 | (1) |
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Interference Edge Filters |
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242 | (55) |
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243 | (1) |
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Symmetrical Multilayers and the Herpin Index |
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244 | (4) |
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Application of the Herpin Index to the Quarter-Wave Stack |
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248 | (5) |
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Application of the Herpin Index to Multilayers of Other Than Quarter-Waves |
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253 | (3) |
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256 | (1) |
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Transmission at the Edge of a Stop Band |
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256 | (2) |
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Transmission in the Center of a Stop Band |
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258 | (2) |
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Transmission in the Pass Band |
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260 | (2) |
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Reduction of Pass-Band Ripple |
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262 | (3) |
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Summary of Design Procedure so Far |
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265 | (1) |
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More Advanced Procedures for Eliminating Ripple |
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266 | (15) |
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281 | (2) |
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Extending the Rejection Zone by Interference Methods |
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283 | (4) |
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Extending the Transmission Zone |
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287 | (8) |
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Reducing the Transmission Zone |
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295 | (1) |
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296 | (1) |
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297 | (2) |
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299 | (104) |
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299 | (3) |
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302 | (40) |
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The Metal-Dielectric Single-Cavity Filter |
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302 | (8) |
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The All-Dielectric Single-Cavity Filter |
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310 | (3) |
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Even Number (2x) of Layers |
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313 | (2) |
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Odd Number (2x + 1) of Layers |
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315 | (1) |
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316 | (1) |
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317 | (8) |
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325 | (4) |
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The Effect of Varying the Angle of Incidence |
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329 | (1) |
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Simple Tilts in Collimated Light |
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329 | (3) |
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332 | (1) |
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333 | (2) |
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Effect of an Incident Cone of Light |
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335 | (6) |
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341 | (1) |
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342 | (14) |
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Thelen's Method of Analysis |
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349 | (7) |
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Higher Performance in Multiple-Cavity Filters |
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356 | (14) |
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364 | (3) |
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Losses in Multiple Cavity Filters |
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367 | (1) |
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368 | (1) |
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369 | (1) |
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369 | (1) |
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370 | (7) |
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Multiple Cavity Metal-Dielectric Filters |
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377 | (19) |
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The Induced-Transmission Filter |
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380 | (1) |
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381 | (1) |
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382 | (2) |
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Maximum Potential Transmittance |
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384 | (1) |
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384 | (2) |
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Front Surface Equivalent Admittance |
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386 | (1) |
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Examples of Filter Designs |
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386 | (10) |
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Measured Filter Performance |
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396 | (3) |
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399 | (4) |
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403 | (68) |
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Modified Admittances and the Tilted Admittance Diagram |
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403 | (8) |
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Application of the Admittance Diagram |
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411 | (14) |
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425 | (6) |
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The Brewster Angle Polarizing Beam Splitter |
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425 | (5) |
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430 | (1) |
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431 | (1) |
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431 | (11) |
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Edge Filters at Intermediate Angle of Incidence |
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432 | (5) |
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Reflecting Coatings at Very High Angles of Incidence |
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437 | (4) |
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Edge Filters at Very High Angles of Incidence |
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441 | (1) |
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442 | (5) |
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442 | (1) |
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443 | (1) |
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s-and p-Polarization Together |
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444 | (3) |
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447 | (17) |
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The Ellipsometric Parameters and Relative Retardation |
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447 | (1) |
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Series of Coated Surfaces |
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448 | (1) |
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449 | (2) |
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451 | (4) |
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Multilayer Retarders at One Wavelength |
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455 | (4) |
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Multilayer Retarders for a Range of Wavelengths |
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459 | (5) |
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464 | (3) |
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467 | (4) |
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Color in Optical Coatings |
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471 | (18) |
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471 | (7) |
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The 1964 Supplementary Colorimetric Observer |
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478 | (1) |
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479 | (1) |
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480 | (1) |
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481 | (1) |
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Brightness and Optimal Stimuli |
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482 | (3) |
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485 | (2) |
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487 | (2) |
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Production Methods and Thin-Film Materials |
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489 | (80) |
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The Production of Thin Films |
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490 | (30) |
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491 | (10) |
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501 | (12) |
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513 | (4) |
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517 | (3) |
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Measurement of the Optical Properties |
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520 | (20) |
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Measurement of the Mechanical Properties |
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540 | (10) |
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550 | (1) |
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Summary of Some Properties of Common Materials |
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551 | (10) |
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561 | (8) |
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Factors Affecting Layer and Coating Properties |
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569 | (26) |
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Microstructure and Thin-Film Behavior |
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569 | (15) |
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Sensitivity to Contamination |
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584 | (8) |
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592 | (3) |
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Layer Uniformity and Thickness Monitoring |
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595 | (46) |
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595 | (9) |
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597 | (1) |
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598 | (1) |
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598 | (5) |
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603 | (1) |
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604 | (3) |
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Thickness Monitoring and Control |
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607 | (14) |
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Optical Monitoring Techniques |
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608 | (10) |
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The Quartz-Crystal Monitor |
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618 | (2) |
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Monitoring by Deposition Time |
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620 | (1) |
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621 | (15) |
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636 | (5) |
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Specification of Filters and Environmental Effects |
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641 | (14) |
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641 | (7) |
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Performance Specification |
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641 | (3) |
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Manufacturing Specification |
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644 | (1) |
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644 | (4) |
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648 | (5) |
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648 | (3) |
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651 | (1) |
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652 | (1) |
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653 | (2) |
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System Considerations: Applications of Filters and Coatings |
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655 | (52) |
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Potential Energy Grasp of Interference Filters |
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659 | (6) |
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Narrowband Filters in Astronomy |
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665 | (5) |
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Atmospheric Temperature Sounding |
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670 | (9) |
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Order Sorting Filters for Grating Spectrometers |
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679 | (12) |
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Glare Suppression Filters and Coatings |
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691 | (4) |
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Some Coatings Involving Metal Layers |
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695 | (10) |
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Electrode Films for Schottky-Barrier Photodiodes |
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695 | (3) |
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Spectrally Selective Coatings for Photothermal Solar Energy Conversion |
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698 | (5) |
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Heat Reflecting Metal-Dielectric Coatings |
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703 | (2) |
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705 | (2) |
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707 | (52) |
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707 | (11) |
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718 | (11) |
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729 | (11) |
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740 | (8) |
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744 | (4) |
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748 | (8) |
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What Is a Photonic Crystal? |
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750 | (1) |
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Two-Dimensional Photonic Crystals |
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750 | (1) |
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One-Dimensional Photonic Crystals |
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751 | (5) |
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756 | (3) |
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Characteristics of Thin-Film Dielectric Materials |
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759 | (12) |
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766 | (5) |
Bibliography |
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771 | (2) |
Index |
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773 | |