(Išleidimo metai: 15-Dec-2010, Paperback / softback, Leidėjas: Springer-Verlag Berlin and Heidelberg GmbH & Co. K, ISBN-13: 9783642058448)
This book presents recent advances in the field of nanoscale characterization of ferroelectric materials using scanning probe microscopy (SPM). It addresses various imaging mechanisms of ferroelectric domains in SPM, quantitative analysis of the piez...Daugiau...
(Išleidimo metai: 30-Sep-2011, Paperback / softback, Leidėjas: Springer-Verlag Berlin and Heidelberg GmbH & Co. K, ISBN-13: 9783642059155)
The topics include bonding-based fabrication methods of silicon-on-insulator, photonic crystals, VCSELs, SiGe-based FETs, MEMS together with hybrid integration and laser lift-off. The non-specialist will learn about the basics of wafer bonding and...Daugiau...
(Išleidimo metai: 14-May-2004, Hardback, Leidėjas: Springer-Verlag Berlin and Heidelberg GmbH & Co. K, ISBN-13: 9783540210498)
The topics include bonding-based fabrication methods of silicon-on-insulator, photonic crystals, VCSELs, SiGe-based FETs, MEMS together with hybrid integration and laser lift-off. The non-specialist will learn about the basics of wafer bonding and it...Daugiau...
(Išleidimo metai: 06-Apr-2004, Hardback, Leidėjas: Springer-Verlag Berlin and Heidelberg GmbH & Co. K, ISBN-13: 9783540206620)
This book presents recent advances in the field of nanoscale characterization of ferroelectric materials using scanning probe microscopy (SPM). It addresses various imaging mechanisms of ferroelectric domains in SPM, quantitative analysis of the piez...Daugiau...
