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1 | (72) |
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1 Resistor-Capacitor Circuits |
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3 | (14) |
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1.1 The Four Primary Circuit Elements |
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3 | (1) |
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4 | (2) |
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1.2.1 Resistance and Ohm's Law |
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4 | (1) |
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5 | (1) |
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1.2.3 Power Consumption in a Resistor |
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6 | (1) |
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6 | (3) |
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1.3.1 Capacitance and Charge on a Capacitor |
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6 | (2) |
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1.3.2 Current through a Capacitor |
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8 | (1) |
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1.3.3 Equivalent Impedance of a Capacitor |
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8 | (1) |
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1.3.4 Energy Stored in a Capacitor |
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9 | (1) |
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1.4 Series Resistor-Capacitor (RC) Circuit |
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9 | (1) |
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9 | (1) |
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1.4.2 Capacitor Discharging |
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10 | (1) |
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1.5 Charge Sharing between Capacitors |
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10 | (2) |
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1.6 Filtering Property of RC Circuits |
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12 | (2) |
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1.7 Impedance of the RC Circuit |
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14 | (1) |
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14 | (3) |
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2 Fundamentals of Semiconductor Devices |
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17 | (34) |
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2.1 Energy Levels and Energy Bands |
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18 | (1) |
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2.2 Metals, Semiconductors, Insulators |
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18 | (1) |
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2.3 Semiconductor Fundamentals |
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19 | (10) |
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20 | (1) |
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2.3.1.1 Free Electrons and Holes |
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20 | (1) |
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20 | (1) |
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20 | (1) |
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2.3.3 The Fermi Level and Fermi Function |
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21 | (2) |
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23 | (2) |
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25 | (2) |
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27 | (1) |
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27 | (1) |
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27 | (1) |
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2.3.7.2 Diffusion Current |
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28 | (1) |
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2.4 Semiconductor Junctions |
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29 | (1) |
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2.5 Metal-Semiconductor Junction |
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30 | (6) |
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31 | (1) |
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2.5.1.1 Analysis of the Electrostatics at Junctions |
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32 | (2) |
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2.5.1.2 Currents across the Junction |
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34 | (1) |
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2.5.1.3 Impedance of the Schottky diode |
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35 | (1) |
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2.5.1.4 Rectifying Contact with p-type Semiconductor |
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35 | (1) |
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35 | (1) |
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36 | (3) |
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2.6.1 Analysis of p-n Junction |
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37 | (1) |
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2.6.2 Currents across the Junction |
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38 | (1) |
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39 | (11) |
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39 | (1) |
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39 | (1) |
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40 | (1) |
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41 | (2) |
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2.7.1.4 Capacitance-Voltage Characteristics |
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43 | (1) |
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2.7.2 Metal Oxide Semiconductor Field Effect Transistors (MOSFETs) |
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44 | (1) |
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45 | (2) |
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2.7.2.2 Current Voltage Characteristics |
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47 | (3) |
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50 | (1) |
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3 Circuit Analysis of MOSFET Circuits |
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51 | (22) |
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3.1 MOSFET Operation and its Impact in Circuit Design |
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52 | (1) |
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3.2 Small Signal Analysis of MOSFET Circuits |
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53 | (7) |
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3.2.1 Small Signal Gate Bias Fluctuations |
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54 | (1) |
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3.2.2 Small Signal Drain Bias Fluctuations |
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55 | (1) |
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3.2.3 Impedance Analysis of MOSFET Circuits |
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55 | (2) |
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57 | (1) |
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3.2.4 Transfer Function Analysis of MOSFET Circuits |
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58 | (1) |
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59 | (1) |
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3.3 High Frequency Response of MOSFET Circuits |
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60 | (4) |
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3.3.1 Capacitive Components in a MOSFET |
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60 | (1) |
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61 | (1) |
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3.3.2.1 Miller Effect and Miller Capacitances |
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61 | (1) |
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62 | (2) |
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64 | (7) |
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3.4.1 Representation of Noise |
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64 | (1) |
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3.4.1.1 Probability Density Function |
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64 | (1) |
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65 | (1) |
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65 | (1) |
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66 | (1) |
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66 | (1) |
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67 | (1) |
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67 | (1) |
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3.4.3 Noise in Field Effect Transistors |
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68 | (1) |
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68 | (1) |
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68 | (1) |
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68 | (1) |
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3.4.4 Noise in MOSFET Circuits |
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69 | (1) |
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3.4.4.1 Representing Noise in MOSFET Circuits |
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69 | (1) |
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70 | (1) |
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71 | (2) |
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II Non Crystalline Semiconductors |
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73 | (28) |
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4 Non-Crystalline Semiconductors |
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75 | (6) |
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4.1 Introduction to Non-Crystalline Semiconductors |
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75 | (2) |
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4.2 Structure and Electronic Transport |
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77 | (2) |
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4.2.1 Inorganic Semiconductors |
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77 | (1) |
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4.2.2 Polymer Semiconductors |
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78 | (1) |
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4.3 Thin Film Transistors |
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79 | (1) |
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80 | (1) |
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5 Device Physics of Thin Film Transistors |
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81 | (12) |
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5.1 Density of States in Non-Crystalline Semiconductors |
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81 | (2) |
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5.1.1 Exponential Density of States |
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82 | (1) |
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5.1.2 Trapped Charge Density |
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82 | (1) |
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5.1.3 Free Charge Density |
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83 | (1) |
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5.2 Device Physics of TFTs |
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83 | (3) |
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83 | (1) |
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5.2.2 Forward Subthreshold Operation |
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84 | (1) |
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5.2.3 Above Threshold Operation |
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85 | (1) |
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5.3 Transfer Characteristics of the TFT |
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86 | (2) |
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88 | (1) |
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5.5 Threshold Voltage Shift |
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88 | (3) |
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5.5.1 Mechanics of Charge Trapping |
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88 | (1) |
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5.5.2 Dynamics of Defect Creation and Threshold Voltage Shift |
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89 | (1) |
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5.5.3 Threshold Voltage Recovery |
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90 | (1) |
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5.5.4 Drain-Source Bias Dependence |
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90 | (1) |
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91 | (2) |
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6 Modeling Threshold Voltage Shift for Circuit Design |
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93 | (8) |
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94 | (2) |
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96 | (1) |
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96 | (4) |
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96 | (1) |
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6.3.2 Thought Experiments |
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97 | (1) |
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6.3.2.1 First Thought Experiment |
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97 | (1) |
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6.3.2.2 Second Thought Experiment |
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97 | (3) |
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100 | (1) |
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III Thin Film Transistor Circuits and Applications |
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101 | (114) |
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103 | (16) |
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7.1 Transistor Biasing for Switch Operation |
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105 | (1) |
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106 | (6) |
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112 | (1) |
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113 | (1) |
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114 | (4) |
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7.5.1 Threshold Voltage Shift |
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114 | (1) |
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115 | (1) |
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115 | (3) |
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118 | (1) |
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8 Diode Connected Transistor |
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119 | (10) |
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8.1 Circuit Configuration and Operation |
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119 | (2) |
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121 | (6) |
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122 | (1) |
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8.2.2 Threshold Voltage Shift Compensation |
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122 | (4) |
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8.2.3 Peak Detect Circuit |
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126 | (1) |
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127 | (2) |
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129 | (16) |
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9.1 Analog and Digital Circuits |
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129 | (1) |
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130 | (1) |
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130 | (5) |
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9.3.1 Common Source Amplifier |
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131 | (1) |
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9.3.2 Common Drain Amplifier |
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132 | (2) |
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9.3.3 Common Gate Amplifier |
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134 | (1) |
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135 | (2) |
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137 | (1) |
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9.6 Static Random Access Memories |
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138 | (2) |
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140 | (3) |
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140 | (2) |
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142 | (1) |
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143 | (1) |
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144 | (1) |
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10 Large-Area Electronic Systems |
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145 | (12) |
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10.1 Large-area Electronic Systems |
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146 | (1) |
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147 | (5) |
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10.2.1 Design of Pixel Circuits for Field and Current Controlled Actuators |
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147 | (1) |
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10.2.1.1 Field Controlled Actuators |
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147 | (1) |
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10.2.1.2 Current Controlled Actuators |
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147 | (2) |
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10.2.2 Design Constraints |
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149 | (1) |
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10.2.2.1 Programming Time |
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150 | (1) |
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10.2.2.2 Power Consumption |
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151 | (1) |
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151 | (1) |
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152 | (3) |
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10.3.1 Design of Pixel Circuits for Sensors |
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152 | (1) |
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153 | (1) |
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10.3.2.1 Noise from the Sensor |
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153 | (1) |
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10.3.2.2 Noise from Reset |
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153 | (1) |
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10.3.2.3 TFT Flicker and Thermal Noise |
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154 | (1) |
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10.3.2.4 Threshold Voltage Shift |
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154 | (1) |
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10.3.2.5 External Readout Noise |
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154 | (1) |
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154 | (1) |
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155 | (2) |
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11 Compensation Circuits for Displays |
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157 | (8) |
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11.1 Compensating for Threshold Voltage Shift |
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157 | (1) |
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11.2 Voltage Programmed Compensation Circuits |
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158 | (2) |
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11.2.1 Capacitor-Diode TFT based Circuits |
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158 | (2) |
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11.2.2 Mirror TFT based Circuits |
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160 | (1) |
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11.3 Current Programmed Compensation Circuits |
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160 | (2) |
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11.3.1 Capacitor-Diode TFT based Circuits |
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161 | (1) |
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11.3.2 Mirror TFT based Circuits |
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161 | (1) |
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11.4 Other Compensation Circuits for Display Applications |
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162 | (2) |
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11.4.1 Feedback based Compensation |
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162 | (1) |
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11.4.2 Statistics based Software compensation |
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163 | (1) |
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164 | (1) |
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12 Self Compensation of Threshold Voltage Shift |
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165 | (30) |
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12.1 The Dancing House Analogy |
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166 | (1) |
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12.2 Graphical Representation of a TFT |
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166 | (4) |
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12.2.1 Constant Voltage Bias |
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167 | (1) |
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12.2.2 Constant Current Bias |
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167 | (1) |
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12.2.3 Equivalence of Current and Voltage Bias |
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167 | (1) |
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12.2.4 Modular Representation of the TFT |
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168 | (1) |
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169 | (1) |
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169 | (1) |
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170 | (1) |
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12.3 Simple TFT Circuits as Node Diagrams |
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170 | (3) |
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170 | (3) |
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173 | (1) |
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12.4 Paradigm for Circuit Synthesis |
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173 | (2) |
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175 | (13) |
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175 | (1) |
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12.5.1.1 Time Zero Behavior |
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175 | (2) |
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12.5.1.2 Evolution with Time |
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177 | (1) |
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178 | (1) |
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12.5.1.4 Experimental Verifications |
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178 | (1) |
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12.5.1.5 Time Varying Input Voltage |
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178 | (4) |
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182 | (1) |
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12.5.2.1 Time Zero Behavior |
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182 | (2) |
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12.5.2.2 Evolution with Time |
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184 | (1) |
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184 | (1) |
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184 | (1) |
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12.5.4 Time Varying Input Current |
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185 | (3) |
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12.6 Extending the Design Paradigm |
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188 | (6) |
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12.6.1 Cascode Voltage Amplifiers |
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189 | (1) |
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12.6.2 Translinear Circuits |
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189 | (1) |
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189 | (5) |
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194 | (1) |
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194 | (1) |
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13 Case Study --- Pseudo PMOS Field Effect Transistor |
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195 | (20) |
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13.1 Role of Complementary Devices |
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196 | (6) |
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13.1.1 TFT as Current Sources and Sinks |
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196 | (1) |
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13.1.2 Benefits of a Complementary Device |
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196 | (2) |
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198 | (1) |
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199 | (3) |
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13.2 High Impedance Load with a Non-Complementary Process |
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202 | (13) |
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13.2.1 Design of the High Impedance Load |
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202 | (1) |
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202 | (2) |
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13.2.1.2 Circuit Design --- The "Adder" |
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204 | (3) |
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13.2.1.3 Circuit design --- The n-type Current Source |
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207 | (1) |
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13.2.1.4 Circuit Design --- The High Gain Amplifier |
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207 | (8) |
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215 | (6) |
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14 Appendix --- Derivation of the Threshold Voltage Shift Model |
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217 | (4) |
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14.1 State Space Form of Charge Trapping |
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217 | (1) |
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14.2 Solving for nf(t) and ns(t) |
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218 | (1) |
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14.3 Threshold Voltage Shift |
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218 | (1) |
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219 | (2) |
Bibliography |
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221 | (16) |
Index |
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237 | |