This book provides a comprehensive overview of the fascinating recent developments in atomic- and nanoscale magnetism, including the physics of individual magnetic adatoms and single spins, the synthesis of molecular magnets for spintronic applica...Daugiau...
This book presents the latest developments in noncontact atomic force microscopy. It deals with the following outstanding functions and applications that have been obtained with atomic resolution after the publication of volume 2: (1) Pauli repulsive...Daugiau...
This book presents the latest developments in noncontact atomic force microscopy. It deals with the following outstanding functions and applications that have been obtained with atomic resolution after the publication of volume 2: (1) Pauli repuls...Daugiau...
Seizo Morita, Franz J. Giessibl, Roland Wiesendanger
Serija: NanoScience and Technology
(Išleidimo metai: 14-Mar-2012, Paperback / softback, Leidėjas: Springer-Verlag Berlin and Heidelberg GmbH & Co. K, ISBN-13: 9783642260704)
Since the original publication of Noncontact Atomic Force Microscopy in 2002, the noncontact atomic force microscope (NC-AFM) has achieved remarkable progress. This second treatment deals with the following outstanding recent results obtained with...Daugiau...
(Išleidimo metai: 23-Oct-2012, Paperback / softback, Leidėjas: Springer-Verlag Berlin and Heidelberg GmbH & Co. K, ISBN-13: 9783642627729)
Since 1995, the noncontact atomic force microscope (NC-AFM) has achieved remarkable progress. Based on nanomechanical methods, the NC-AFM detects the weak attractive force between the tip of a cantilever and a sample surface. This method has the foll...Daugiau...
(Išleidimo metai: 15-Dec-2010, Paperback / softback, Leidėjas: Springer-Verlag Berlin and Heidelberg GmbH & Co. K, ISBN-13: 9783642083600)
Scanning Probe Microscopy - Analytical Methods provides a comprehensive overview of the analytical methods on the nanometer scale based on scanning probe microscopy and spectroscopy. Numerous examples of applications of the chemical contrast mechanis...Daugiau...
Seizo Morita, Franz J. Giessibl, Roland Wiesendanger
Serija: NanoScience and Technology
(Išleidimo metai: 01-Oct-2009, Hardback, Leidėjas: Springer-Verlag Berlin and Heidelberg GmbH & Co. K, ISBN-13: 9783642014949)
Since the original publication of Noncontact Atomic Force Microscopy in 2002, the noncontact atomic force microscope (NC-AFM) has achieved remarkable progress. This second treatment deals with the following outstanding recent results obtained with...Daugiau...
(Išleidimo metai: 24-Jul-2002, Hardback, Leidėjas: Springer-Verlag Berlin and Heidelberg GmbH & Co. K, ISBN-13: 9783540431176)
Since 1995, the noncontact atomic force microscope (NC-AFM) has achieved remarkable progress. Based on nanomechanical methods, the NC-AFM detects the weak attractive force between the tip of a cantilever and a sample surface. This method has the foll...Daugiau...
(Išleidimo metai: 16-Apr-1998, Hardback, Leidėjas: Springer-Verlag Berlin and Heidelberg GmbH & Co. K, ISBN-13: 9783540638155)
Scanning Probe Microscopy - Analytical Methods provides a comprehensive overview of the analytical methods on the nanometer scale based on scanning probe microscopy and spectroscopy. Numerous examples of applications of the chemical contrast mechanis...Daugiau...
